P

Inventor

ZHOU BAOSUO

US37 patents
⚠️ This page may combine multiple inventors who share the name “ZHOU BAOSUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

20 patents
US7732343B2Jun 8, 2010

Simplified pitch doubling process flow

MICRON TECHNOLOGY INC572 citations99
US7807575B2Oct 5, 2010

Methods to reduce the critical dimension of semiconductor devices

MICRON TECHNOLOGY INC56 citations98
US7393789B2Jul 1, 2008

Protective coating for planarization

MICRON TECHNOLOGY INC110 citations98
US9679781B2Jun 13, 2017

Methods for integrated circuit fabrication with protective coating for planarization

MICRON TECHNOLOGY INC27 citations93
US7659208B2Feb 9, 2010

Method for forming high density patterns

MICRON TECHNOLOGY INC14 citations93
US7902074B2Mar 8, 2011

Simplified pitch doubling process flow

MICRON TECHNOLOGY INC26 citations92
US10607844B2Mar 31, 2020

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC4 citations84
US10096483B2Oct 9, 2018

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC6 citations84
US9761457B2Sep 12, 2017

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC7 citations84
US9184159B2Nov 10, 2015

Simplified pitch doubling process flow

MICRON TECHNOLOGY INC7 citations84
US9003651B2Apr 14, 2015

Methods for integrated circuit fabrication with protective coating for planarization

MICRON TECHNOLOGY INC9 citations83
US8980752B2Mar 17, 2015

Method of forming a plurality of spaced features

MICRON TECHNOLOGY INC14 citations83
US7910483B2Mar 22, 2011

Trim process for critical dimension control for integrated circuits

MICRON TECHNOLOGY INC7 citations83
US7662718B2Feb 16, 2010

Trim process for critical dimension control for integrated circuits

MICRON TECHNOLOGY INC14 citations83
US9305782B2Apr 5, 2016

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC3 citations82
US8030217B2Oct 4, 2011

Simplified pitch doubling process flow

MICRON TECHNOLOGY INC5 citations74
US8871648B2Oct 28, 2014

Method for forming high density patterns

MICRON TECHNOLOGY INC2 citations63
US11335563B2May 17, 2022

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC0 citations62
US8011090B2Sep 6, 2011

Method for forming and planarizing adjacent regions of an integrated circuit

MICRON TECHNOLOGY INC2 citations62
US8530352B2Sep 10, 2013

Methods of patterning a material

MICRON TECHNOLOGY INC0 citations51

ZHOU BAOSUO

5 patents

LAM RES CORP

4 patents

LODESTAR LICENSING GROUP LLC

2 patents

SIPANI VISHAL

2 patents

GOOD FARRELL

1 patent

ABATCHEV MIRZAFER

1 patent

NIROOMAND ARDAVAN

1 patent

Intel NDTM US LLC

1 patent