Inventor
CUTTER DOUGLAS J
US51 patents
⚠️ This page may combine multiple inventors who share the name “CUTTER DOUGLAS J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
46 patentsUS5998069ADec 7, 1999
Electrically programmable photolithography mask
MICRON TECHNOLOGY INC96 citations99
US5847441ADec 8, 1998
Semiconductor junction antifuse circuit
MICRON TECHNOLOGY INC157 citations99
US6365421B2Apr 2, 2002
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC118 citations98
US6194738B1Feb 27, 2001
Method and apparatus for storage of test results within an integrated circuit
MICRON TECHNOLOGY INC102 citations97
US6525399B2Feb 25, 2003
Junctionless antifuses and systems containing junctionless antifuses
MICRON TECHNOLOGY INC36 citations96
US6456149B2Sep 24, 2002
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC29 citations96
US6069064AMay 30, 2000
Method for forming a junctionless antifuse
MICRON TECHNOLOGY INC40 citations96
US5838625ANov 17, 1998
Anti-fuse programming path
MICRON TECHNOLOGY INC61 citations96
US5631862AMay 20, 1997
Self current limiting antifuse circuit
MICRON TECHNOLOGY INC73 citations95
US6528217B2Mar 4, 2003
Electrically programmable photolithography mask
MICRON TECHNOLOGY INC13 citations93
US6444558B1Sep 3, 2002
Methods of forming and programming junctionless antifuses
MICRON TECHNOLOGY INC23 citations93
US6323536B1Nov 27, 2001
Method and apparatus for forming a junctionless antifuse
MICRON TECHNOLOGY INC28 citations93
US6255894B1Jul 3, 2001
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC17 citations93
US6154398ANov 28, 2000
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC20 citations93
US5973978AOct 26, 1999
Anti-fuse programming path
MICRON TECHNOLOGY INC28 citations93
US5973380AOct 26, 1999
Semiconductor junction antifuse circuit
MICRON TECHNOLOGY INC35 citations93
US5847987ADec 8, 1998
Low currency redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC18 citations93
US5845315ADec 1, 1998
Method and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory device
MICRON TECHNOLOGY INC28 citations93
US6185705B1Feb 6, 2001
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC28 citations92
US5706238AJan 6, 1998
Self current limiting antifuse circuit
MICRON TECHNOLOGY INC36 citations92
US5877993AMar 2, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC16 citations86
US6778452B2Aug 17, 2004
Circuit and method for voltage regulation in a semiconductor device
MICRON TECHNOLOGY INC6 citations82
US6335888B2Jan 1, 2002
Margin-range apparatus for a sense amp's voltage-pulling transistor
MICRON TECHNOLOGY INC8 citations82
US6052322AApr 18, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC6 citations82
US7054208B2May 30, 2006
Method and device for testing a sense amp
MICRON TECHNOLOGY INC3 citations74
US6686790B2Feb 3, 2004
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC8 citations74
US6462608B2Oct 8, 2002
Low current redundancy anti-fuse apparatus
MICRON TECHNOLOGY INC4 citations74
US6379847B2Apr 30, 2002
Electrically programmable photolithography mask
MICRON TECHNOLOGY INC11 citations74
US6351140B2Feb 26, 2002
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC3 citations74
US6262927B1Jul 17, 2001
Current saturation test device
MICRON TECHNOLOGY INC2 citations74
US6181617B1Jan 30, 2001
Method and apparatus for testing a semiconductor device
MICRON TECHNOLOGY INC2 citations74
US6128240AOct 3, 2000
Cancellation of redundant elements with a cancel bank
MICRON TECHNOLOGY INC8 citations74
US6023431AFeb 8, 2000
Low current redundancy anti-fuse method and apparatus
MICRON TECHNOLOGY INC4 citations74
US5991187ANov 23, 1999
Method for programming semiconductor junctions and for using the programming to control the operation of an integrated device
MICRON TECHNOLOGY INC5 citations74
US5856950AJan 5, 1999
Cancellation of redundant elements with a cancel bank
MICRON TECHNOLOGY INC7 citations74
US5625790AApr 29, 1997
Method and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory device
MICRON TECHNOLOGY INC13 citations74
US6983404B2Jan 3, 2006
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC7 citations73
US6154410ANov 28, 2000
Method and apparatus for reducing antifuse programming time
MICRON TECHNOLOGY INC11 citations73
US5982656ANov 9, 1999
Method and apparatus for checking the resistance of programmable elements
MICRON TECHNOLOGY INC10 citations73
US6452846B1Sep 17, 2002
Driver circuit for a voltage-pulling device
MICRON TECHNOLOGY INC0 citations63
US6445629B2Sep 3, 2002
Method of stressing a memory device
MICRON TECHNOLOGY INC0 citations63
US6011736AJan 4, 2000
Device and method for testing a circuit
MICRON TECHNOLOGY INC1 citations63
US5982686ANov 9, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC0 citations63
US6690611B2Feb 10, 2004
Cancellation of redundant elements with a cancel bank
MICRON TECHNOLOGY INC0 citations52
US6633507B2Oct 14, 2003
Cancellation of redundant elements with a cancel bank
MICRON TECHNOLOGY INC0 citations52
US6537710B2Mar 25, 2003
Electrically programmable photolithography mask
MICRON TECHNOLOGY INC0 citations52
HEWLETT PACKARD CO
3 patentsUS6446187B1Sep 3, 2002
Virtual address bypassing using local page mask
HEWLETT PACKARD CO27 citations89
US6484238B1Nov 19, 2002
Apparatus and method for detecting snoop hits on victim lines issued to a higher level cache
HEWLETT PACKARD CO12 citations74
US6487550B1Nov 26, 2002
Method and apparatus for finding a first element
HEWLETT PACKARD CO6 citations63
HEWLETT PACKARD DEVELOPMENT CO
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