Inventor · disambiguated record
Kazunari Asao
Also filed as: ASAO KAZUNARI
12 granted patents·2 pending applications·110 citations·filing 2002–2020
90Inventor score
Top patents by PatentIndex Score
14 records- 0196US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0295US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 0393US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 0490US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 0584US8080790B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2009·Granted Dec 20, 2011·7 cites·20 claims
- 0677US10991542B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 27, 2021·2 cites·11 claims
- 0774US8923614B2Image processing apparatus, image processing methodHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 30, 2014·2 cites·9 claims
- 0871US8581186B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 12, 2013·2 cites·9 claims
- 0960US11276552B2Method for image adjustment and charged particle beam systemHITACHI HIGH TECH CORP·Filed 2020·Granted Mar 15, 2022·0 cites·16 claims
- 1057US8859962B2Charged-particle microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 14, 2014·0 cites·7 claims
- 1153US8487253B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2011·Granted Jul 16, 2013·0 cites·6 claims
- 1250US8835844B2Sample electrification measurement method and charged particle beam apparatusEZUMI MAKOTO·Filed 2010·Granted Sep 16, 2014·0 cites·12 claims
- 1345US2021055098A1Charged Particle Beam System and Overlay Shift Amount Measurement MethodHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 1443US2012119087A1Charged-particle microscopeTAKAHASHI NORITSUGU·Filed 2010·Application pending·0 cites
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