Inventor
HSU PENG-FU
TW41 patents
⚠️ This page may combine multiple inventors who share the name “HSU PENG-FU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
22 patentsUS7812414B2Oct 12, 2010
Hybrid process for forming metal gates
TAIWAN SEMICONDUCTOR MFG20 citations92
US7378713B2May 27, 2008
Semiconductor devices with dual-metal gate structures and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG37 citations92
US7012027B2Mar 14, 2006
Zirconium oxide and hafnium oxide etching using halogen containing chemicals
TAIWAN SEMICONDUCTOR MFG44 citations92
US7122484B2Oct 17, 2006
Process for removing organic materials during formation of a metal interconnect
TAIWAN SEMICONDUCTOR MFG19 citations90
US7732878B2Jun 8, 2010
MOS devices with continuous contact etch stop layer
TAIWAN SEMICONDUCTOR MFG8 citations84
US7074727B2Jul 11, 2006
Process for improving dielectric properties in low-k organosilicate dielectric material
TAIWAN SEMICONDUCTOR MFG17 citations84
US6706640B1Mar 16, 2004
Metal silicide etch resistant plasma etch method
TAIWAN SEMICONDUCTOR MFG11 citations74
US6864193B2Mar 8, 2005
Aqueous cleaning composition containing copper-specific corrosion inhibitor
TAIWAN SEMICONDUCTOR MFG9 citations73
US7531399B2May 12, 2009
Semiconductor devices and methods with bilayer dielectrics
TAIWAN SEMICONDUCTOR MFG5 citations71
US6838381B2Jan 4, 2005
Methods for improving sheet resistance of silicide layer after removal of etch stop layer
TAIWAN SEMICONDUCTOR MFG11 citations71
US7989321B2Aug 2, 2011
Semiconductor device gate structure including a gettering layer
TAIWAN SEMICONDUCTOR MFG5 citations63
US7947591B2May 24, 2011
Semiconductor devices with dual-metal gate structures and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG5 citations62
US7598176B2Oct 6, 2009
Method for photoresist stripping and treatment of low-k dielectric material
TAIWAN SEMICONDUCTOR MFG2 citations62
US7373941B2May 20, 2008
Wet cleaning cavitation system and method to remove particulate wafer contamination
TAIWAN SEMICONDUCTOR MFG4 citations62
US6969688B2Nov 29, 2005
Wet etchant composition and method for etching HfO2 and ZrO2
TAIWAN SEMICONDUCTOR MFG5 citations58
US9263445B2Feb 16, 2016
Method of fabricating dual high-k metal gates for MOS devices
TAIWAN SEMICONDUCTOR MFG0 citations52
US7875547B2Jan 25, 2011
Contact hole structures and contact structures and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG0 citations52
US7208331B2Apr 24, 2007
Methods and structures for critical dimension and profile measurement
TAIWAN SEMICONDUCTOR MFG0 citations52
US7939396B2May 10, 2011
Base oxide engineering for high-K gate stacks
TAIWAN SEMICONDUCTOR MFG0 citations51
US7663185B2Feb 16, 2010
FIN-FET device structure formed employing bulk semiconductor substrate
TAIWAN SEMICONDUCTOR MFG1 citations51
US8384159B2Feb 26, 2013
Semiconductor devices and methods with bilayer dielectrics
TAIWAN SEMICONDUCTOR MFG0 citations50
US7400401B2Jul 15, 2008
Measuring low dielectric constant film properties during processing
TAIWAN SEMICONDUCTOR MFG0 citations41
ASM IP HOLDING BV
12 patentsUS11798999B2Oct 24, 2023
Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
ASM IP HOLDING BV1 citations73
US11056567B2Jul 6, 2021
Method of forming a doped metal carbide film on a substrate and related semiconductor device structures
ASM IP HOLDING BV3 citations71
US10847371B2Nov 24, 2020
Method of forming an electrode on a substrate and a semiconductor device structure including an electrode
ASM IP HOLDING BV2 citations71
US12525451B2Jan 13, 2026
Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures
ASM IP HOLDING BV0 citations62
US12094936B2Sep 17, 2024
Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
ASM IP HOLDING BV0 citations62
US11923192B2Mar 5, 2024
Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures
ASM IP HOLDING BV0 citations62
US11469098B2Oct 11, 2022
Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures
ASM IP HOLDING BV0 citations62
US11411088B2Aug 9, 2022
Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
ASM IP HOLDING BV0 citations62
US10886123B2Jan 5, 2021
Methods for forming low temperature semiconductor layers and related semiconductor device structures
ASM IP HOLDING BV0 citations61
US12020938B2Jun 25, 2024
Method of forming an electrode on a substrate and a semiconductor device structure including an electrode
ASM IP HOLDING BV0 citations60
US11398382B2Jul 26, 2022
Method of forming an electrode on a substrate and a semiconductor device structure including an electrode
ASM IP HOLDING BV0 citations60
US10818758B2Oct 27, 2020
Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
ASM IP HOLDING BV0 citations52
HSU PENG-FU
3 patentsUS8853068B2Oct 7, 2014
Method of fabricating dual high-k metal gate for MOS devices
HSU PENG-FU9 citations83
US8105931B2Jan 31, 2012
Method of fabricating dual high-k metal gates for MOS devices
HSU PENG-FU10 citations83
US8536660B2Sep 17, 2013
Hybrid process for forming metal gates of MOS devices
HSU PENG-FU8 citations82