P

Inventor

HSU PENG-FU

TW41 patents
⚠️ This page may combine multiple inventors who share the name “HSU PENG-FU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

22 patents
US7812414B2Oct 12, 2010

Hybrid process for forming metal gates

TAIWAN SEMICONDUCTOR MFG20 citations92
US7378713B2May 27, 2008

Semiconductor devices with dual-metal gate structures and fabrication methods thereof

TAIWAN SEMICONDUCTOR MFG37 citations92
US7012027B2Mar 14, 2006

Zirconium oxide and hafnium oxide etching using halogen containing chemicals

TAIWAN SEMICONDUCTOR MFG44 citations92
US7122484B2Oct 17, 2006

Process for removing organic materials during formation of a metal interconnect

TAIWAN SEMICONDUCTOR MFG19 citations90
US7732878B2Jun 8, 2010

MOS devices with continuous contact etch stop layer

TAIWAN SEMICONDUCTOR MFG8 citations84
US7074727B2Jul 11, 2006

Process for improving dielectric properties in low-k organosilicate dielectric material

TAIWAN SEMICONDUCTOR MFG17 citations84
US6706640B1Mar 16, 2004

Metal silicide etch resistant plasma etch method

TAIWAN SEMICONDUCTOR MFG11 citations74
US6864193B2Mar 8, 2005

Aqueous cleaning composition containing copper-specific corrosion inhibitor

TAIWAN SEMICONDUCTOR MFG9 citations73
US7531399B2May 12, 2009

Semiconductor devices and methods with bilayer dielectrics

TAIWAN SEMICONDUCTOR MFG5 citations71
US6838381B2Jan 4, 2005

Methods for improving sheet resistance of silicide layer after removal of etch stop layer

TAIWAN SEMICONDUCTOR MFG11 citations71
US7989321B2Aug 2, 2011

Semiconductor device gate structure including a gettering layer

TAIWAN SEMICONDUCTOR MFG5 citations63
US7947591B2May 24, 2011

Semiconductor devices with dual-metal gate structures and fabrication methods thereof

TAIWAN SEMICONDUCTOR MFG5 citations62
US7598176B2Oct 6, 2009

Method for photoresist stripping and treatment of low-k dielectric material

TAIWAN SEMICONDUCTOR MFG2 citations62
US7373941B2May 20, 2008

Wet cleaning cavitation system and method to remove particulate wafer contamination

TAIWAN SEMICONDUCTOR MFG4 citations62
US6969688B2Nov 29, 2005

Wet etchant composition and method for etching HfO2 and ZrO2

TAIWAN SEMICONDUCTOR MFG5 citations58
US9263445B2Feb 16, 2016

Method of fabricating dual high-k metal gates for MOS devices

TAIWAN SEMICONDUCTOR MFG0 citations52
US7875547B2Jan 25, 2011

Contact hole structures and contact structures and fabrication methods thereof

TAIWAN SEMICONDUCTOR MFG0 citations52
US7208331B2Apr 24, 2007

Methods and structures for critical dimension and profile measurement

TAIWAN SEMICONDUCTOR MFG0 citations52
US7939396B2May 10, 2011

Base oxide engineering for high-K gate stacks

TAIWAN SEMICONDUCTOR MFG0 citations51
US7663185B2Feb 16, 2010

FIN-FET device structure formed employing bulk semiconductor substrate

TAIWAN SEMICONDUCTOR MFG1 citations51
US8384159B2Feb 26, 2013

Semiconductor devices and methods with bilayer dielectrics

TAIWAN SEMICONDUCTOR MFG0 citations50
US7400401B2Jul 15, 2008

Measuring low dielectric constant film properties during processing

TAIWAN SEMICONDUCTOR MFG0 citations41

ASM IP HOLDING BV

12 patents
US11798999B2Oct 24, 2023

Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures

ASM IP HOLDING BV1 citations73
US11056567B2Jul 6, 2021

Method of forming a doped metal carbide film on a substrate and related semiconductor device structures

ASM IP HOLDING BV3 citations71
US10847371B2Nov 24, 2020

Method of forming an electrode on a substrate and a semiconductor device structure including an electrode

ASM IP HOLDING BV2 citations71
US12525451B2Jan 13, 2026

Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures

ASM IP HOLDING BV0 citations62
US12094936B2Sep 17, 2024

Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures

ASM IP HOLDING BV0 citations62
US11923192B2Mar 5, 2024

Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures

ASM IP HOLDING BV0 citations62
US11469098B2Oct 11, 2022

Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures

ASM IP HOLDING BV0 citations62
US11411088B2Aug 9, 2022

Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures

ASM IP HOLDING BV0 citations62
US10886123B2Jan 5, 2021

Methods for forming low temperature semiconductor layers and related semiconductor device structures

ASM IP HOLDING BV0 citations61
US12020938B2Jun 25, 2024

Method of forming an electrode on a substrate and a semiconductor device structure including an electrode

ASM IP HOLDING BV0 citations60
US11398382B2Jul 26, 2022

Method of forming an electrode on a substrate and a semiconductor device structure including an electrode

ASM IP HOLDING BV0 citations60
US10818758B2Oct 27, 2020

Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures

ASM IP HOLDING BV0 citations52

HSU PENG-FU

3 patents

TAIWAN SEMICONDUCTOR MFG CO LTD

1 patent

MASUOKA YURI

1 patent

CA NAT RESEARCH COUNCIL

1 patent

HOU YONG-TIAN

1 patent