Inventor
PANGRLE SUZETTE K
US67 patents
⚠️ This page may combine multiple inventors who share the name “PANGRLE SUZETTE K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
43 patentsUS6509267B1Jan 21, 2003
Method of forming low resistance barrier on low k interconnect with electrolessly plated copper seed layer
ADVANCED MICRO DEVICES INC156 citations99
US6746971B1Jun 8, 2004
Method of forming copper sulfide for memory cell
ADVANCED MICRO DEVICES INC120 citations98
US6656763B1Dec 2, 2003
Spin on polymers for organic memory devices
ADVANCED MICRO DEVICES INC98 citations98
US6468894B1Oct 22, 2002
Metal interconnection structure with dummy vias
ADVANCED MICRO DEVICES INC109 citations98
US6174743B1Jan 16, 2001
Method of reducing incidence of stress-induced voiding in semiconductor interconnect lines
ADVANCED MICRO DEVICES INC114 citations98
US6787458B1Sep 7, 2004
Polymer memory device formed in via opening
ADVANCED MICRO DEVICES INC63 citations96
US6770905B1Aug 3, 2004
Implantation for the formation of CuX layer in an organic memory device
ADVANCED MICRO DEVICES INC56 citations96
US6756672B1Jun 29, 2004
Use of sic for preventing copper contamination of low-k dielectric layers
ADVANCED MICRO DEVICES INC65 citations96
US6753247B1Jun 22, 2004
Method(s) facilitating formation of memory cell(s) and patterned conductive
ADVANCED MICRO DEVICES INC53 citations96
US6723635B1Apr 20, 2004
Protection low-k ILD during damascene processing with thin liner
ADVANCED MICRO DEVICES INC65 citations96
US6566283B1May 20, 2003
Silane treatment of low dielectric constant materials in semiconductor device manufacturing
ADVANCED MICRO DEVICES INC72 citations96
US6475929B1Nov 5, 2002
Method of manufacturing a semiconductor structure with treatment to sacrificial stop layer producing diffusion to an adjacent low-k dielectric layer lowering the constant
ADVANCED MICRO DEVICES INC70 citations96
US6143672ANov 7, 2000
Method of reducing metal voidings in 0.25 μm AL interconnect
ADVANCED MICRO DEVICES INC65 citations96
US6977389B2Dec 20, 2005
Planar polymer memory device
ADVANCED MICRO DEVICES INC51 citations93
US6852586B1Feb 8, 2005
Self assembly of conducting polymer for formation of polymer memory cell
ADVANCED MICRO DEVICES INC26 citations93
US6836017B2Dec 28, 2004
Protection of low-k ILD during damascene processing with thin liner
ADVANCED MICRO DEVICES INC30 citations93
US6599839B1Jul 29, 2003
Plasma etch process for nonhomogenous film
ADVANCED MICRO DEVICES INC36 citations93
US6555461B1Apr 29, 2003
Method of forming low resistance barrier on low k interconnect
ADVANCED MICRO DEVICES INC40 citations93
US6518646B1Feb 11, 2003
Semiconductor device with variable composition low-k inter-layer dielectric and method of making
ADVANCED MICRO DEVICES INC40 citations93
US6361837B2Mar 26, 2002
Method and system for modifying and densifying a porous film
ADVANCED MICRO DEVICES INC19 citations93
US6979837B2Dec 27, 2005
Stacked organic memory devices and methods of operating and fabricating
ADVANCED MICRO DEVICES INC19 citations92
US6869878B1Mar 22, 2005
Method of forming a selective barrier layer using a sacrificial layer
ADVANCED MICRO DEVICES INC20 citations92
US6870183B2Mar 22, 2005
Stacked organic memory devices and methods of operating and fabricating
ADVANCED MICRO DEVICES INC29 citations92
US6294460B1Sep 25, 2001
Semiconductor manufacturing method using a high extinction coefficient dielectric photomask
ADVANCED MICRO DEVICES INC28 citations92
US6136649AOct 24, 2000
Method for removing anti-reflective coating layer using plasma etch process after contact CMP
ADVANCED MICRO DEVICES INC32 citations92
US6191030B1Feb 20, 2001
Anti-reflective coating layer for semiconductor device
ADVANCED MICRO DEVICES INC18 citations91
US5986344ANov 16, 1999
Anti-reflective coating layer for semiconductor device
ADVANCED MICRO DEVICES INC44 citations91
US6713382B1Mar 30, 2004
Vapor treatment for repairing damage of low-k dielectric
ADVANCED MICRO DEVICES INC37 citations89
US7465956B1Dec 16, 2008
Stacked organic memory devices and methods of operating and fabricating
ADVANCED MICRO DEVICES INC11 citations84
US7232765B1Jun 19, 2007
Utilization of a Ta-containing cap over copper to facilitate concurrent formation of copper vias and memory element structures
ADVANCED MICRO DEVICES INC11 citations84
US6943096B1Sep 13, 2005
Semiconductor component and method of manufacture
ADVANCED MICRO DEVICES INC13 citations84
US6784095B1Aug 31, 2004
Phosphine treatment of low dielectric constant materials in semiconductor device manufacturing
ADVANCED MICRO DEVICES INC14 citations84
US6660619B1Dec 9, 2003
Dual damascene metal interconnect structure with dielectric studs
ADVANCED MICRO DEVICES INC18 citations84
US6291296B1Sep 18, 2001
Method for removing anti-reflective coating layer using plasma etch process before contact CMP
ADVANCED MICRO DEVICES INC18 citations84
US6221794B1Apr 24, 2001
Method of reducing incidence of stress-induced voiding in semiconductor interconnect lines
ADVANCED MICRO DEVICES INC20 citations84
US6383950B1May 7, 2002
Insulating and capping structure with preservation of the low dielectric constant of the insulating layer
ADVANCED MICRO DEVICES INC15 citations82
US6326692B1Dec 4, 2001
Insulating and capping structure with preservation of the low dielectric constant of the insulating layer
ADVANCED MICRO DEVICES INC16 citations82
US6472336B1Oct 29, 2002
Forming an encapsulating layer after deposition of a dielectric comprised of corrosive material
ADVANCED MICRO DEVICES INC9 citations74
US6462417B1Oct 8, 2002
Coherent alloy diffusion barrier for integrated circuit interconnects
ADVANCED MICRO DEVICES INC9 citations74
US6380067B1Apr 30, 2002
Method for creating partially UV transparent anti-reflective coating for semiconductors
ADVANCED MICRO DEVICES INC11 citations74
US6232002B1May 15, 2001
Bilayer anti-reflective coating and etch hard mask
ADVANCED MICRO DEVICES INC7 citations73
US6710452B1Mar 23, 2004
Coherent diffusion barriers for integrated circuit interconnects
ADVANCED MICRO DEVICES INC2 citations63
US6352930B1Mar 5, 2002
Bilayer anti-reflective coating and etch hard mask
ADVANCED MICRO DEVICES INC5 citations62
SPANSION LLC
3 patentsUS7776682B1Aug 17, 2010
Ordered porosity to direct memory element formation
SPANSION LLC32 citations92
US8003436B2Aug 23, 2011
Stacked organic memory devices and methods of operating and fabricating
SPANSION LLC2 citations63
US7468525B2Dec 23, 2008
Test structures for development of metal-insulator-metal (MIM) devices
SPANSION LLC4 citations61
RATHOR MANUJ
2 patentsCO REYNALDO
1 patentMCGRATH SCOTT
1 patentShowing the top 50 of 67 patents by PatentIndex Score.