Inventor · disambiguated record
Mark S. Chace
Also filed as: CHACE MARK · CHACE MARK S · CHACE MARK STEPHEN
11 granted patents·4 pending applications·345 citations·filing 1986–2015
90Inventor score
Top patents by PatentIndex Score
15 records- 0192US4692205ASilicon-containing polyimides as oxygen etch stop and dual dielectric coatingsIBM·Filed 1986·Granted Sep 8, 1987·149 cites·14 claims
- 0291US4976137AChemical mixing and dispensing systemECOLAB INC·Filed 1989·Granted Dec 11, 1990·119 cites·25 claims
- 0375US8133805B2Methods for forming dense dielectric layer over porous dielectricsDIMITRAKOPOULOS CHRISTOS D·Filed 2009·Granted Mar 13, 2012·4 cites·18 claims
- 0473US7808099B2Liquid thermal interface having mixture of linearly structured polymer doped crosslinked networks and related methodIBM·Filed 2008·Granted Oct 5, 2010·3 cites·3 claims
- 0570US5700581ASolvent-free epoxy based adhesives for semiconductor chip attachment and processIBM·Filed 1996·Granted Dec 23, 1997·39 cites·22 claims
- 0659US7964542B2Enhanced thermo-oxidative stability thermal interface compositions and use thereof in microelectronics assemblyIBM·Filed 2006·Granted Jun 21, 2011·1 cites·21 claims
- 0755US5416322AInterface for linking an atmospheric pressure thermogravimetric analyzer to a low pressure mass spectrometerIBM·Filed 1994·Granted May 16, 1995·23 cites·16 claims
- 0851US2008242118A1Methods for forming dense dielectric layer over porous dielectricsIBM·Filed 2007·Application pending·0 cites
- 0949US9604316B2Tin-based solder composition with low void characteristicGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 28, 2017·0 cites·20 claims
- 1047US9551696B2Cleanability assessment of sublimate from lithography materialsGLOBALFOUNDRIES INC·Filed 2014·Granted Jan 24, 2017·0 cites·20 claims
- 1142US2005087490A1Process for removing impurities from low dielectric constant films disposed on semiconductor devicesIBM·Filed 2003·Application pending·0 cites
- 1241US6495825B1Apparatus for photo exposure of materials with subsequent capturing of volatiles for analysisIBM·Filed 1999·Granted Dec 17, 2002·7 cites·19 claims
- 1339US2008248208A1Apparatus and method for measuring the quantity of condensable materials which outgas during cure of organic thin filmsCHACE MARK STEPHEN·Filed 2007·Application pending·0 cites
- 1437US9740101B2Additions of organic species to facilitate crosslinker removal during PSPI cureGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 22, 2017·0 cites·19 claims
- 1530US2017154763A1Mass spectrometry system and method for contaminant identification in semiconductor fabricationGLOBALFOUNDRIES INC·Filed 2015·Application pending·0 cites
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