Inventor
LIM KWAN-YONG
US104 patents
⚠️ This page may combine multiple inventors who share the name “LIM KWAN-YONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
24 patentsUS9412616B1Aug 9, 2016
Methods of forming single and double diffusion breaks on integrated circuit products comprised of FinFET devices and the resulting products
GLOBALFOUNDRIES INC148 citations99
US9773708B1Sep 26, 2017
Devices and methods of forming VFET with self-aligned replacement metal gates aligned to top spacer post top source drain EPI
GLOBALFOUNDRIES INC75 citations98
US9640636B1May 2, 2017
Methods of forming replacement gate structures and bottom and top source/drain regions on a vertical transistor device
GLOBALFOUNDRIES INC88 citations98
US9362181B1Jun 7, 2016
Methods of forming diffusion breaks on integrated circuit products comprised of FinFET devices and the resulting products
GLOBALFOUNDRIES INC69 citations98
US9536793B1Jan 3, 2017
Self-aligned gate-first VFETs using a gate spacer recess
GLOBALFOUNDRIES INC74 citations97
US9530866B1Dec 27, 2016
Methods of forming vertical transistor devices with self-aligned top source/drain conductive contacts
GLOBALFOUNDRIES INC128 citations97
US9530863B1Dec 27, 2016
Methods of forming vertical transistor devices with self-aligned replacement gate structures
GLOBALFOUNDRIES INC68 citations97
US9865704B2Jan 9, 2018
Single and double diffusion breaks on integrated circuit products comprised of FinFET devices
GLOBALFOUNDRIES INC41 citations94
US9799751B1Oct 24, 2017
Methods of forming a gate structure on a vertical transistor device
GLOBALFOUNDRIES INC28 citations94
US9711511B1Jul 18, 2017
Vertical channel transistor-based semiconductor memory structure
GLOBALFOUNDRIES INC30 citations93
US9911738B1Mar 6, 2018
Vertical-transport field-effect transistors with a damascene gate strap
GLOBALFOUNDRIES INC18 citations86
US10141446B2Nov 27, 2018
Formation of bottom junction in vertical FET devices
GLOBALFOUNDRIES INC5 citations84
US10083971B1Sep 25, 2018
Vertical SRAM structure with cross-coupling contacts penetrating through common gates to bottom S/D metal contacts
GLOBALFOUNDRIES INC14 citations84
US9761662B1Sep 12, 2017
Active area shapes reducing device size
GLOBALFOUNDRIES INC9 citations84
US9263446B1Feb 16, 2016
Methods of forming replacement gate structures on transistor devices with a shared gate structure and the resulting products
GLOBALFOUNDRIES INC7 citations84
US9236308B1Jan 12, 2016
Methods of fabricating fin structures of uniform height
GLOBALFOUNDRIES INC9 citations84
US9236452B2Jan 12, 2016
Raised source/drain EPI with suppressed lateral EPI overgrowth
GLOBALFOUNDRIES INC10 citations83
US9640533B2May 2, 2017
Methods, apparatus and system for providing source-drain epitaxy layer with lateral over-growth suppression
GLOBALFOUNDRIES INC14 citations80
US10580779B2Mar 3, 2020
Vertical transistor static random access memory cell
GLOBALFOUNDRIES INC3 citations73
US10529724B2Jan 7, 2020
Method of manufacturing a vertical SRAM with cross-coupled contacts penetrating through common gate structures
GLOBALFOUNDRIES INC2 citations73
US10163900B2Dec 25, 2018
Integration of vertical field-effect transistors and saddle fin-type field effect transistors
GLOBALFOUNDRIES INC2 citations73
US9929236B1Mar 27, 2018
Active area shapes reducing device size
GLOBALFOUNDRIES INC3 citations73
US9847418B1Dec 19, 2017
Methods of forming fin cut regions by oxidizing fin portions
GLOBALFOUNDRIES INC6 citations73
US9842933B1Dec 12, 2017
Formation of bottom junction in vertical FET devices
GLOBALFOUNDRIES INC4 citations73
HYNIX SEMICONDUCTOR INC
19 patentsUS6506676B2Jan 14, 2003
Method of manufacturing semiconductor devices with titanium aluminum nitride work function
HYNIX SEMICONDUCTOR INC98 citations98
US7713823B2May 11, 2010
Semiconductor device with vertical channel transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC33 citations93
US7682911B2Mar 23, 2010
Semiconductor device having a fin transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC43 citations93
US7217624B2May 15, 2007
Non-volatile memory device with conductive sidewall spacer and method for fabricating the same
HYNIX SEMICONDUCTOR INC16 citations93
US6828185B2Dec 7, 2004
CMOS of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC20 citations93
US6768179B2Jul 27, 2004
CMOS of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC21 citations93
US6734113B1May 11, 2004
Method for forming multiple gate oxide layers
HYNIX SEMICONDUCTOR INC25 citations93
US6642132B2Nov 4, 2003
Cmos of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC25 citations93
US7029999B2Apr 18, 2006
Method for fabricating transistor with polymetal gate electrode
HYNIX SEMICONDUCTOR INC30 citations92
US7112486B2Sep 26, 2006
Method for fabricating semiconductor device by using radical oxidation
HYNIX SEMICONDUCTOR INC47 citations91
US7666785B2Feb 23, 2010
Method for fabricating semiconductor device with interface barrier
HYNIX SEMICONDUCTOR INC12 citations84
US7629219B2Dec 8, 2009
Method of fabricating a dual polysilicon gate of a semiconductor device with a multi-plane channel
HYNIX SEMICONDUCTOR INC8 citations84
US7563726B2Jul 21, 2009
Semiconductor device with multiple gate dielectric layers and method for fabricating the same
HYNIX SEMICONDUCTOR INC14 citations84
US7157359B2Jan 2, 2007
Method of forming a metal gate in a semiconductor device using atomic layer deposition process
HYNIX SEMICONDUCTOR INC16 citations84
US7541269B2Jun 2, 2009
Method of forming tungsten polymetal gate having low resistance
HYNIX SEMICONDUCTOR INC8 citations83
US7902614B2Mar 8, 2011
Semiconductor device with gate stack structure
HYNIX SEMICONDUCTOR INC4 citations74
US7074661B2Jul 11, 2006
Method for fabricating semiconductor device with use of partial gate recessing process
HYNIX SEMICONDUCTOR INC10 citations74
US6987056B2Jan 17, 2006
Method of forming gates in semiconductor devices
HYNIX SEMICONDUCTOR INC7 citations74
US6448166B2Sep 10, 2002
Method for forming a gate for semiconductor devices
HYNIX SEMICONDUCTOR INC11 citations74
TEXAS INSTRUMENTS INC
3 patentsUS9093298B2Jul 28, 2015
Silicide formation due to improved SiGe faceting
TEXAS INSTRUMENTS INC14 citations92
US8865542B2Oct 21, 2014
Embedded polysilicon resistor in integrated circuits formed by a replacement gate process
TEXAS INSTRUMENTS INC9 citations84
US9812452B2Nov 7, 2017
Method to form silicide and contact at embedded epitaxial facet
TEXAS INSTRUMENTS INC4 citations72
SUNG MIN-GYU
2 patentsKIM SEOK-HOON
1 patentIBM
1 patentShowing the top 50 of 104 patents by PatentIndex Score.