P

Inventor

LIM KWAN-YONG

US104 patents
⚠️ This page may combine multiple inventors who share the name “LIM KWAN-YONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

24 patents
US9412616B1Aug 9, 2016

Methods of forming single and double diffusion breaks on integrated circuit products comprised of FinFET devices and the resulting products

GLOBALFOUNDRIES INC148 citations99
US9773708B1Sep 26, 2017

Devices and methods of forming VFET with self-aligned replacement metal gates aligned to top spacer post top source drain EPI

GLOBALFOUNDRIES INC75 citations98
US9640636B1May 2, 2017

Methods of forming replacement gate structures and bottom and top source/drain regions on a vertical transistor device

GLOBALFOUNDRIES INC88 citations98
US9362181B1Jun 7, 2016

Methods of forming diffusion breaks on integrated circuit products comprised of FinFET devices and the resulting products

GLOBALFOUNDRIES INC69 citations98
US9536793B1Jan 3, 2017

Self-aligned gate-first VFETs using a gate spacer recess

GLOBALFOUNDRIES INC74 citations97
US9530866B1Dec 27, 2016

Methods of forming vertical transistor devices with self-aligned top source/drain conductive contacts

GLOBALFOUNDRIES INC128 citations97
US9530863B1Dec 27, 2016

Methods of forming vertical transistor devices with self-aligned replacement gate structures

GLOBALFOUNDRIES INC68 citations97
US9865704B2Jan 9, 2018

Single and double diffusion breaks on integrated circuit products comprised of FinFET devices

GLOBALFOUNDRIES INC41 citations94
US9799751B1Oct 24, 2017

Methods of forming a gate structure on a vertical transistor device

GLOBALFOUNDRIES INC28 citations94
US9711511B1Jul 18, 2017

Vertical channel transistor-based semiconductor memory structure

GLOBALFOUNDRIES INC30 citations93
US9911738B1Mar 6, 2018

Vertical-transport field-effect transistors with a damascene gate strap

GLOBALFOUNDRIES INC18 citations86
US10141446B2Nov 27, 2018

Formation of bottom junction in vertical FET devices

GLOBALFOUNDRIES INC5 citations84
US10083971B1Sep 25, 2018

Vertical SRAM structure with cross-coupling contacts penetrating through common gates to bottom S/D metal contacts

GLOBALFOUNDRIES INC14 citations84
US9761662B1Sep 12, 2017

Active area shapes reducing device size

GLOBALFOUNDRIES INC9 citations84
US9263446B1Feb 16, 2016

Methods of forming replacement gate structures on transistor devices with a shared gate structure and the resulting products

GLOBALFOUNDRIES INC7 citations84
US9236308B1Jan 12, 2016

Methods of fabricating fin structures of uniform height

GLOBALFOUNDRIES INC9 citations84
US9236452B2Jan 12, 2016

Raised source/drain EPI with suppressed lateral EPI overgrowth

GLOBALFOUNDRIES INC10 citations83
US9640533B2May 2, 2017

Methods, apparatus and system for providing source-drain epitaxy layer with lateral over-growth suppression

GLOBALFOUNDRIES INC14 citations80
US10580779B2Mar 3, 2020

Vertical transistor static random access memory cell

GLOBALFOUNDRIES INC3 citations73
US10529724B2Jan 7, 2020

Method of manufacturing a vertical SRAM with cross-coupled contacts penetrating through common gate structures

GLOBALFOUNDRIES INC2 citations73
US10163900B2Dec 25, 2018

Integration of vertical field-effect transistors and saddle fin-type field effect transistors

GLOBALFOUNDRIES INC2 citations73
US9929236B1Mar 27, 2018

Active area shapes reducing device size

GLOBALFOUNDRIES INC3 citations73
US9847418B1Dec 19, 2017

Methods of forming fin cut regions by oxidizing fin portions

GLOBALFOUNDRIES INC6 citations73
US9842933B1Dec 12, 2017

Formation of bottom junction in vertical FET devices

GLOBALFOUNDRIES INC4 citations73

HYNIX SEMICONDUCTOR INC

19 patents
US6506676B2Jan 14, 2003

Method of manufacturing semiconductor devices with titanium aluminum nitride work function

HYNIX SEMICONDUCTOR INC98 citations98
US7713823B2May 11, 2010

Semiconductor device with vertical channel transistor and method for fabricating the same

HYNIX SEMICONDUCTOR INC33 citations93
US7682911B2Mar 23, 2010

Semiconductor device having a fin transistor and method for fabricating the same

HYNIX SEMICONDUCTOR INC43 citations93
US7217624B2May 15, 2007

Non-volatile memory device with conductive sidewall spacer and method for fabricating the same

HYNIX SEMICONDUCTOR INC16 citations93
US6828185B2Dec 7, 2004

CMOS of semiconductor device and method for manufacturing the same

HYNIX SEMICONDUCTOR INC20 citations93
US6768179B2Jul 27, 2004

CMOS of semiconductor device and method for manufacturing the same

HYNIX SEMICONDUCTOR INC21 citations93
US6734113B1May 11, 2004

Method for forming multiple gate oxide layers

HYNIX SEMICONDUCTOR INC25 citations93
US6642132B2Nov 4, 2003

Cmos of semiconductor device and method for manufacturing the same

HYNIX SEMICONDUCTOR INC25 citations93
US7029999B2Apr 18, 2006

Method for fabricating transistor with polymetal gate electrode

HYNIX SEMICONDUCTOR INC30 citations92
US7112486B2Sep 26, 2006

Method for fabricating semiconductor device by using radical oxidation

HYNIX SEMICONDUCTOR INC47 citations91
US7666785B2Feb 23, 2010

Method for fabricating semiconductor device with interface barrier

HYNIX SEMICONDUCTOR INC12 citations84
US7629219B2Dec 8, 2009

Method of fabricating a dual polysilicon gate of a semiconductor device with a multi-plane channel

HYNIX SEMICONDUCTOR INC8 citations84
US7563726B2Jul 21, 2009

Semiconductor device with multiple gate dielectric layers and method for fabricating the same

HYNIX SEMICONDUCTOR INC14 citations84
US7157359B2Jan 2, 2007

Method of forming a metal gate in a semiconductor device using atomic layer deposition process

HYNIX SEMICONDUCTOR INC16 citations84
US7541269B2Jun 2, 2009

Method of forming tungsten polymetal gate having low resistance

HYNIX SEMICONDUCTOR INC8 citations83
US7902614B2Mar 8, 2011

Semiconductor device with gate stack structure

HYNIX SEMICONDUCTOR INC4 citations74
US7074661B2Jul 11, 2006

Method for fabricating semiconductor device with use of partial gate recessing process

HYNIX SEMICONDUCTOR INC10 citations74
US6987056B2Jan 17, 2006

Method of forming gates in semiconductor devices

HYNIX SEMICONDUCTOR INC7 citations74
US6448166B2Sep 10, 2002

Method for forming a gate for semiconductor devices

HYNIX SEMICONDUCTOR INC11 citations74

TEXAS INSTRUMENTS INC

3 patents

SUNG MIN-GYU

2 patents

KIM SEOK-HOON

1 patent

IBM

1 patent

Showing the top 50 of 104 patents by PatentIndex Score.