Inventor
LEUNG YING-KEUNG
TW127 patents
⚠️ This page may combine multiple inventors who share the name “LEUNG YING-KEUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
33 patentsUS10157799B2Dec 18, 2018
Multi-gate device and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG CO LTD135 citations99
US9887269B2Feb 6, 2018
Multi-gate device and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG CO LTD151 citations99
US9818872B2Nov 14, 2017
Multi-gate device and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG CO LTD166 citations99
US9608116B2Mar 28, 2017
FINFETs with wrap-around silicide and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD1,317 citations99
US9418897B1Aug 16, 2016
Wrap around silicide for FinFETs
TAIWAN SEMICONDUCTOR MFG CO LTD239 citations99
US10164012B2Dec 25, 2018
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD32 citations94
US9935199B2Apr 3, 2018
FinFET with source/drain structure
TAIWAN SEMICONDUCTOR MFG CO LTD27 citations94
US9911824B2Mar 6, 2018
Semiconductor structure with multi spacer
TAIWAN SEMICONDUCTOR MFG CO LTD20 citations94
US9559184B2Jan 31, 2017
Devices including gate spacer with gap or void and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD24 citations94
US10505022B2Dec 10, 2019
Devices including gate spacer with gap or void and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations93
US10164069B2Dec 25, 2018
Devices including gate spacer with gap or void and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD13 citations93
US9941374B2Apr 10, 2018
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations93
US9917178B2Mar 13, 2018
Devices including gate spacer with gap or void and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations93
US9773705B2Sep 26, 2017
FinFET channel on oxide structures and related methods
TAIWAN SEMICONDUCTOR MFG CO LTD12 citations93
US9508858B2Nov 29, 2016
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations93
US11276763B2Mar 15, 2022
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US11004934B2May 11, 2021
Semiconductor device including a liner layer between a channel and a source/drain epitaxial layer
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10763368B2Sep 1, 2020
Stacked gate-all-around FinFET and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10522416B2Dec 31, 2019
FinFET device having oxide region between vertical fin structures
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10497792B2Dec 3, 2019
Contacts for highly scaled transistors
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10355137B2Jul 16, 2019
FINFETs with wrap-around silicide and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10170365B2Jan 1, 2019
Wrap around silicide for FinFETs
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10096693B2Oct 9, 2018
Method for manufacturing semiconductor structure with multi spacers
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10074668B2Sep 11, 2018
Input/output (I/O) devices with greater source/drain proximity than non-I/O devices
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10008414B2Jun 26, 2018
System and method for widening Fin widths for small pitch FinFET devices
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9966471B2May 8, 2018
Stacked Gate-All-Around FinFET and method forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9960273B2May 1, 2018
Integrated circuit structure with substrate isolation and un-doped channel
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9953881B2Apr 24, 2018
Method of forming a FinFET device
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9922978B2Mar 20, 2018
Semiconductor structure with recessed source/drain structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9899269B2Feb 20, 2018
Multi-gate device and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9899387B2Feb 20, 2018
Multi-gate device and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations84
US9876108B2Jan 23, 2018
Wrap around silicide for FinFETs
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9716096B1Jul 25, 2017
Semiconductor structure with feature spacer and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD16 citations84
CHARTERED SEMICONDUCTOR MFG
17 patentsUS6492726B1Dec 10, 2002
Chip scale packaging with multi-layer flip chip arrangement and ball grid array interconnection
CHARTERED SEMICONDUCTOR MFG267 citations99
US6300177B1Oct 9, 2001
Method to form transistors with multiple threshold voltages (VT) using a combination of different work function gate materials
CHARTERED SEMICONDUCTOR MFG175 citations99
US6461900B1Oct 8, 2002
Method to form a self-aligned CMOS inverter using vertical device integration
CHARTERED SEMICONDUCTOR MFG141 citations98
US6313008B1Nov 6, 2001
Method to form a balloon shaped STI using a micro machining technique to remove heavily doped silicon
CHARTERED SEMICONDUCTOR MFG90 citations98
US6747314B2Jun 8, 2004
Method to form a self-aligned CMOS inverter using vertical device integration
CHARTERED SEMICONDUCTOR MFG93 citations97
US6406945B1Jun 18, 2002
Method for forming a transistor gate dielectric with high-K and low-K regions
CHARTERED SEMICONDUCTOR MFG59 citations96
US6403485B1Jun 11, 2002
Method to form a low parasitic capacitance pseudo-SOI CMOS device
CHARTERED SEMICONDUCTOR MFG66 citations96
US6709934B2Mar 23, 2004
Method for forming variable-K gate dielectric
CHARTERED SEMICONDUCTOR MFG26 citations93
US6511884B1Jan 28, 2003
Method to form and/or isolate vertical transistors
CHARTERED SEMICONDUCTOR MFG48 citations93
US6468877B1Oct 22, 2002
Method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner
CHARTERED SEMICONDUCTOR MFG53 citations93
US6455377B1Sep 24, 2002
Method to form very high mobility vertical channel transistor by selective deposition of SiGe or multi-quantum wells (MQWs)
CHARTERED SEMICONDUCTOR MFG21 citations93
US6436770B1Aug 20, 2002
Method to control the channel length of a vertical transistor by first forming channel using selective epi and source/drain using implantation
CHARTERED SEMICONDUCTOR MFG45 citations93
US6417056B1Jul 9, 2002
Method to form low-overlap-capacitance transistors by forming microtrench at the gate edge
CHARTERED SEMICONDUCTOR MFG51 citations93
US6306715B1Oct 23, 2001
Method to form smaller channel with CMOS device by isotropic etching of the gate materials
CHARTERED SEMICONDUCTOR MFG46 citations93
US6156598ADec 5, 2000
Method for forming a lightly doped source and drain structure using an L-shaped spacer
CHARTERED SEMICONDUCTOR MFG51 citations93
US6096647AAug 1, 2000
Method to form CoSi2 on shallow junction by Si implantation
CHARTERED SEMICONDUCTOR MFG32 citations92
US6090691AJul 18, 2000
Method for forming a raised source and drain without using selective epitaxial growth
CHARTERED SEMICONDUCTOR MFG46 citations92
Showing the top 50 of 127 patents by PatentIndex Score.