Inventor
TONG MINH H
US33 patents
Patents
33 patentsUS5629544AMay 13, 1997
Semiconductor diode with silicide films and trench isolation
IBM202 citations99
US6475838B1Nov 5, 2002
Methods for forming decoupling capacitors
IBM79 citations98
US5874836AFeb 23, 1999
High reliability I/O stacked fets
IBM129 citations98
US6498058B1Dec 24, 2002
SOI pass-gate disturb solution
IBM42 citations96
US6424174B1Jul 23, 2002
Low leakage logic gates
IBM59 citations96
US6249029B1Jun 19, 2001
Device method for enhanced avalanche SOI CMOS
IBM54 citations96
US6100564AAug 8, 2000
SOI pass-gate disturb solution
IBM72 citations96
US5959335ASep 28, 1999
Device design for enhanced avalanche SOI CMOS
IBM67 citations96
US5528188AJun 18, 1996
Electrostatic discharge suppression circuit employing low-voltage triggering silicon-controlled rectifier
IBM113 citations95
US6552396B1Apr 22, 2003
Matched transistors and methods for forming the same
IBM52 citations93
US6528846B1Mar 4, 2003
Asymmetric high voltage silicon on insulator device design for input output circuits
IBM20 citations93
US6469350B1Oct 22, 2002
Active well schemes for SOI technology
IBM27 citations93
US6436744B1Aug 20, 2002
Method and structure for creating high density buried contact for use with SOI processes for high performance logic
IBM22 citations93
US6455766B1Sep 24, 2002
Contact-less probe of semiconductor wafers
IBM30 citations92
US6300785B1Oct 9, 2001
Contact-less probe of semiconductor wafers
IBM32 citations92
US6100153AAug 8, 2000
Reliable diffusion resistor and diffusion capacitor
IBM43 citations92
US5972745AOct 26, 1999
Method or forming self-aligned halo-isolated wells
IBM25 citations92
US6088206AJul 11, 2000
Clamp circuit to limit overdrive of off chip driver
IBM25 citations91
US5485095AJan 16, 1996
Fabrication test circuit and method for signalling out-of-spec resistance in integrated circuit structure
IBM51 citations91
US5543650AAug 6, 1996
Electrostatic discharge protection circuit employing a mosfet device
IBM37 citations89
US6664150B2Dec 16, 2003
Active well schemes for SOI technology
IBM14 citations84
US6200843B1Mar 13, 2001
High-voltage, high performance FETs
IBM15 citations84
US6011419AJan 4, 2000
Decoupling scheme for mixed voltage integrated circuits
IBM17 citations84
US6057204AMay 2, 2000
Method of making a noise-isolated buried resistor by implanting a first well with a mask and then implanting an opposite conductivity well with a larger opening in the mask
IBM11 citations74
US5883566AMar 16, 1999
Noise-isolated buried resistor
IBM6 citations74
US5878094AMar 2, 1999
Noise detection and delay receiver system
IBM16 citations73
US4811298AMar 7, 1989
Decoding circuit arrangement for redundant semiconductor storage systems
IBM14 citations68
US6838323B2Jan 4, 2005
Diffusion resistor/capacitor (DRC) non-aligned MOSFET structure
IBM5 citations63
US6437594B1Aug 20, 2002
SOI pass gate leakage monitor
IBM2 citations63
US6333230B1Dec 25, 2001
Scalable high-voltage devices
IBM6 citations63
US6249028B1Jun 19, 2001
Operable floating gate contact for SOI with high Vt well
IBM2 citations63
US7266663B2Sep 4, 2007
Automatic cache activation and deactivation for power reduction
IBM3 citations57
US6171918B1Jan 9, 2001
Depleted poly mosfet structure and method
IBM0 citations52