P

Inventor

HARADA MINORU

JP54 patents
⚠️ This page may combine multiple inventors who share the name “HARADA MINORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

19 patents
US8355559B2Jan 15, 2013

Method and apparatus for reviewing defects

HITACHI HIGH TECH CORP9 citations84
US7932493B2Apr 26, 2011

Method and system for observing a specimen using a scanning electron microscope

HITACHI HIGH TECH CORP11 citations84
US9922414B2Mar 20, 2018

Defect inspection method and defect inspection device

HITACHI HIGH TECH CORP4 citations73
US9569836B2Feb 14, 2017

Defect observation method and defect observation device

HITACHI HIGH TECH CORP5 citations73
US10810733B2Oct 20, 2020

Defect classification apparatus and defect classification method

HITACHI HIGH TECH CORP5 citations72
US10559074B2Feb 11, 2020

Sample observation device and sample observation method

HITACHI HIGH TECH CORP2 citations72
US9811897B2Nov 7, 2017

Defect observation method and defect observation device

HITACHI HIGH TECH CORP3 citations72
US12260545B2Mar 25, 2025

Sample observation device and method

HITACHI HIGH TECH CORP1 citations62
US11170483B2Nov 9, 2021

Sample observation device and sample observation method

HITACHI HIGH TECH CORP1 citations62
US11087454B2Aug 10, 2021

Defect observation device and defect observation method

HITACHI HIGH TECH CORP1 citations62
US10971325B2Apr 6, 2021

Defect observation system and defect observation method for semiconductor wafer

HITACHI HIGH TECH CORP1 citations62
US10783625B2Sep 22, 2020

Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI

HITACHI HIGH TECH CORP1 citations62
US11177111B2Nov 16, 2021

Defect observation device

HITACHI HIGH TECH CORP0 citations52
US10229812B2Mar 12, 2019

Sample observation method and sample observation device

HITACHI HIGH TECH CORP0 citations52
US9799112B2Oct 24, 2017

Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI

HITACHI HIGH TECH CORP1 citations52
US11670528B2Jun 6, 2023

Wafer observation apparatus and wafer observation method

HITACHI HIGH TECH CORP0 citations51
US10977786B2Apr 13, 2021

Wafer observation device

HITACHI HIGH TECH CORP0 citations51
US12333695B2Jun 17, 2025

Sample observation system and image processing method

HITACHI HIGH TECH CORP0 citations50
US12154264B2Nov 26, 2024

Defect inspecting system and defect inspecting method

HITACHI HIGH TECH CORP0 citations50

EBARA CORP

8 patents

YAMAHA CORP

6 patents

HARADA MINORU

5 patents

NIKKISO CO LTD

2 patents

MINEKAWA YOHEI

2 patents

FUJITSU TEN LTD

2 patents

FUJITSU LTD

1 patent

TAKAGI YUJI

1 patent

NAKAGAKI RYO

1 patent

(unassigned)

1 patent

DORYOKURO KAKUNENRYO

1 patent

AJINOMOTO KK

1 patent

Showing the top 50 of 54 patents by PatentIndex Score.