Inventor
HARADA MINORU
JP54 patents
⚠️ This page may combine multiple inventors who share the name “HARADA MINORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
19 patentsUS8355559B2Jan 15, 2013
Method and apparatus for reviewing defects
HITACHI HIGH TECH CORP9 citations84
US7932493B2Apr 26, 2011
Method and system for observing a specimen using a scanning electron microscope
HITACHI HIGH TECH CORP11 citations84
US9922414B2Mar 20, 2018
Defect inspection method and defect inspection device
HITACHI HIGH TECH CORP4 citations73
US9569836B2Feb 14, 2017
Defect observation method and defect observation device
HITACHI HIGH TECH CORP5 citations73
US10810733B2Oct 20, 2020
Defect classification apparatus and defect classification method
HITACHI HIGH TECH CORP5 citations72
US10559074B2Feb 11, 2020
Sample observation device and sample observation method
HITACHI HIGH TECH CORP2 citations72
US9811897B2Nov 7, 2017
Defect observation method and defect observation device
HITACHI HIGH TECH CORP3 citations72
US12260545B2Mar 25, 2025
Sample observation device and method
HITACHI HIGH TECH CORP1 citations62
US11170483B2Nov 9, 2021
Sample observation device and sample observation method
HITACHI HIGH TECH CORP1 citations62
US11087454B2Aug 10, 2021
Defect observation device and defect observation method
HITACHI HIGH TECH CORP1 citations62
US10971325B2Apr 6, 2021
Defect observation system and defect observation method for semiconductor wafer
HITACHI HIGH TECH CORP1 citations62
US10783625B2Sep 22, 2020
Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI
HITACHI HIGH TECH CORP1 citations62
US11177111B2Nov 16, 2021
Defect observation device
HITACHI HIGH TECH CORP0 citations52
US10229812B2Mar 12, 2019
Sample observation method and sample observation device
HITACHI HIGH TECH CORP0 citations52
US9799112B2Oct 24, 2017
Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI
HITACHI HIGH TECH CORP1 citations52
US11670528B2Jun 6, 2023
Wafer observation apparatus and wafer observation method
HITACHI HIGH TECH CORP0 citations51
US10977786B2Apr 13, 2021
Wafer observation device
HITACHI HIGH TECH CORP0 citations51
US12333695B2Jun 17, 2025
Sample observation system and image processing method
HITACHI HIGH TECH CORP0 citations50
US12154264B2Nov 26, 2024
Defect inspecting system and defect inspecting method
HITACHI HIGH TECH CORP0 citations50
EBARA CORP
8 patentsUS5549874AAug 27, 1996
Discharge reactor
EBARA CORP59 citations95
US5632868AMay 27, 1997
Method and apparatus for generating ozone and methods of its use
EBARA CORP24 citations92
US5538695AJul 23, 1996
Ozonizer
EBARA CORP34 citations92
US5702673ADec 30, 1997
Ozone generating apparatus
EBARA CORP8 citations73
US6921063B2Jul 26, 2005
Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereof
EBARA CORP10 citations69
US6932946B2Aug 23, 2005
Ozone generator
EBARA CORP3 citations62
US5794114AAug 11, 1998
Ozonizer
EBARA CORP1 citations52
US11260493B2Mar 1, 2022
Substrate processing apparatus and control method
EBARA CORP0 citations51
YAMAHA CORP
6 patentsUS6753467B2Jun 22, 2004
Simple electronic musical instrument, player's console and signal processing system incorporated therein
YAMAHA CORP19 citations92
US6072112AJun 6, 2000
Electronic percussion instrument
YAMAHA CORP24 citations92
US5965834AOct 12, 1999
Electronic cymbal instrument
YAMAHA CORP28 citations92
US7569758B2Aug 4, 2009
Electronic percussion system and electronic percussion instrument incorporated therein
YAMAHA CORP15 citations77
US5396024AMar 7, 1995
Electric percussion instrument equipped with vibration sensor supported by retainer of vibration-transmissive substance
YAMAHA CORP13 citations68
USRE47779EDec 24, 2019
Simple electronic musical instrument, player's console and signal processing system incorporated therein
YAMAHA CORP0 citations52
HARADA MINORU
5 patentsUS4731050AMar 15, 1988
Acupressure type moxibustion case
HARADA MINORU29 citations88
US8121397B2Feb 21, 2012
Method and its apparatus for reviewing defects
HARADA MINORU9 citations83
US9311697B2Apr 12, 2016
Inspection method and device therefor
HARADA MINORU6 citations72
US9165356B2Oct 20, 2015
Defect inspection method and defect inspection device
HARADA MINORU4 citations72
US8731275B2May 20, 2014
Method and apparatus for reviewing defects
HARADA MINORU1 citations51
NIKKISO CO LTD
2 patentsUS5409775AApr 25, 1995
Vapor-grown and graphitized carbon fibers, process for preparing same, molded members thereof, and composite members thereof
NIKKISO CO LTD37 citations89
US5512393AApr 30, 1996
Vapor-grown and graphitized carbon fibers process for preparing same molded members thereof and composite members thereof
NIKKISO CO LTD4 citations59
MINEKAWA YOHEI
2 patentsFUJITSU TEN LTD
2 patentsFUJITSU LTD
1 patentTAKAGI YUJI
1 patentNAKAGAKI RYO
1 patent(unassigned)
1 patentDORYOKURO KAKUNENRYO
1 patentAJINOMOTO KK
1 patentShowing the top 50 of 54 patents by PatentIndex Score.