Inventor
LI HONGQI
US44 patents
⚠️ This page may combine multiple inventors who share the name “LI HONGQI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
26 patentsUS9099442B2Aug 4, 2015
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods
MICRON TECHNOLOGY INC4 citations83
US10546777B2Jan 28, 2020
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods
MICRON TECHNOLOGY INC1 citations72
US9911643B2Mar 6, 2018
Semiconductor constructions and methods of forming intersecting lines of material
MICRON TECHNOLOGY INC2 citations72
US9754825B2Sep 5, 2017
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods
MICRON TECHNOLOGY INC3 citations72
US11355508B2Jun 7, 2022
Devices including floating vias and related systems and methods
MICRON TECHNOLOGY INC2 citations71
US9613864B2Apr 4, 2017
Low capacitance interconnect structures and associated systems and methods
MICRON TECHNOLOGY INC3 citations71
US12237217B2Feb 25, 2025
Methods of exposing conductive Vias of semiconductor devices and related semiconductor devices
MICRON TECHNOLOGY INC0 citations62
US12144188B2Nov 12, 2024
Multitier arrangements of integrated devices, and methods of forming sense/access lines
MICRON TECHNOLOGY INC0 citations62
US11600666B2Mar 7, 2023
Multitier arrangements of integrated devices, and methods of forming sense/access lines
MICRON TECHNOLOGY INC0 citations62
US11011420B2May 18, 2021
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods
MICRON TECHNOLOGY INC0 citations62
US10957741B2Mar 23, 2021
Multitier arrangements of integrated devices, and methods of forming sense/access lines
MICRON TECHNOLOGY INC0 citations62
US10847442B2Nov 24, 2020
Interconnect assemblies with through-silicon vias and stress-relief features
MICRON TECHNOLOGY INC1 citations62
US9922875B2Mar 20, 2018
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods
MICRON TECHNOLOGY INC1 citations62
US12363915B2Jul 15, 2025
On-pitch vias for semiconductor devices and associated devices and systems
MICRON TECHNOLOGY INC0 citations61
US11770928B2Sep 26, 2023
Devices including floating vias
MICRON TECHNOLOGY INC0 citations61
US11437435B2Sep 6, 2022
On-pitch vias for semiconductor devices and associated devices and systems
MICRON TECHNOLOGY INC0 citations61
US11545623B2Jan 3, 2023
Fabrication of electrodes for memory cells
MICRON TECHNOLOGY INC0 citations60
US10825987B2Nov 3, 2020
Fabrication of electrodes for memory cells
MICRON TECHNOLOGY INC1 citations60
US11764147B2Sep 19, 2023
Slit oxide and via formation techniques
MICRON TECHNOLOGY INC0 citations57
US11367681B2Jun 21, 2022
Slit oxide and via formation techniques
MICRON TECHNOLOGY INC0 citations57
US10543579B2Jan 28, 2020
Polishing apparatuses and polishing methods
MICRON TECHNOLOGY INC0 citations51
US10286517B2May 14, 2019
Polishing apparatuses
MICRON TECHNOLOGY INC0 citations51
US9911653B2Mar 6, 2018
Low capacitance interconnect structures and associated systems and methods
MICRON TECHNOLOGY INC0 citations51
US9391001B2Jul 12, 2016
Semiconductor constructions
MICRON TECHNOLOGY INC0 citations51
US9627295B2Apr 18, 2017
Devices, systems and methods for manufacturing through-substrate vias and front-side structures
MICRON TECHNOLOGY INC1 citations49
US9305865B2Apr 5, 2016
Devices, systems and methods for manufacturing through-substrate vias and front-side structures
MICRON TECHNOLOGY INC0 citations49
NEWPORT CORP
3 patentsLI HONGQI
3 patentsUS9263459B1Feb 16, 2016
Capping poly channel pillars in stacked circuits
LI HONGQI11 citations80
US9034752B2May 19, 2015
Methods of exposing conductive vias of semiconductor devices and associated structures
LI HONGQI4 citations71
US8911558B2Dec 16, 2014
Post-tungsten CMP cleaning solution and method of using the same
LI HONGQI2 citations61