P

Inventor

MANNEBACH EHREN

US49 patents
⚠️ This page may combine multiple inventors who share the name “MANNEBACH EHREN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

45 patents
US11239236B2Feb 1, 2022

Forksheet transistor architectures

INTEL CORP9 citations86
US11437283B2Sep 6, 2022

Backside contacts for semiconductor devices

INTEL CORP12 citations85
US11348919B2May 31, 2022

Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach

INTEL CORP5 citations83
US11996411B2May 28, 2024

Stacked forksheet transistors

INTEL CORP4 citations74
US11367722B2Jun 21, 2022

Stacked nanowire transistor structure with different channel geometries for stress

INTEL CORP6 citations74
US12107085B2Oct 1, 2024

Interconnect techniques for electrically connecting source/drain regions of stacked transistors

INTEL CORP2 citations73
US11764263B2Sep 19, 2023

Gate-all-around integrated circuit structures having depopulated channel structures using multiple bottom-up oxidation approaches

INTEL CORP2 citations73
US11742346B2Aug 29, 2023

Interconnect techniques for electrically connecting source/drain regions of stacked transistors

INTEL CORP3 citations73
US11676966B2Jun 13, 2023

Stacked transistors having device strata with different channel widths

INTEL CORP2 citations73
US11664377B2May 30, 2023

Forksheet transistor architectures

INTEL CORP2 citations73
US11573798B2Feb 7, 2023

Stacked transistors with different gate lengths in different device strata

INTEL CORP1 citations73
US11342227B2May 24, 2022

Stacked transistor structures with asymmetrical terminal interconnects

INTEL CORP3 citations73
US11862636B2Jan 2, 2024

Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach

INTEL CORP2 citations72
US11348916B2May 31, 2022

Leave-behind protective layer having secondary purpose

INTEL CORP3 citations72
US11437405B2Sep 6, 2022

Transistors stacked on front-end p-type transistors

INTEL CORP1 citations63
US12255137B2Mar 18, 2025

Sideways vias in isolation areas to contact interior layers in stacked devices

INTEL CORP0 citations62
US12230635B2Feb 18, 2025

Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach

INTEL CORP0 citations62
US12224202B2Feb 11, 2025

Forming an oxide volume within a fin

INTEL CORP0 citations62
US12148806B2Nov 19, 2024

Stacked source-drain-gate connection and process for forming such

INTEL CORP0 citations62
US11996408B2May 28, 2024

Leave-behind protective layer having secondary purpose

INTEL CORP0 citations62
US11942416B2Mar 26, 2024

Sideways vias in isolation areas to contact interior layers in stacked devices

INTEL CORP0 citations62
US11916118B2Feb 27, 2024

Stacked source-drain-gate connection and process for forming such

INTEL CORP0 citations62
US11894372B2Feb 6, 2024

Stacked trigate transistors with dielectric isolation and process for forming such

INTEL CORP0 citations62
US11830933B2Nov 28, 2023

Gate-all-around integrated circuit structures having depopulated channel structures using bottom-up oxidation approach

INTEL CORP0 citations62
US11798838B2Oct 24, 2023

Capacitance reduction for semiconductor devices based on wafer bonding

INTEL CORP0 citations62
US11769814B2Sep 26, 2023

Device including air gapping of gate spacers and other dielectrics and process for providing such

INTEL CORP0 citations62
US11764104B2Sep 19, 2023

Forming an oxide volume within a fin

INTEL CORP0 citations62
US11672133B2Jun 6, 2023

Vertically stacked memory elements with air gap

INTEL CORP1 citations62
US11646352B2May 9, 2023

Stacked source-drain-gate connection and process for forming such

INTEL CORP0 citations62
US11616060B2Mar 28, 2023

Techniques for forming gate structures for transistors arranged in a stacked configuration on a single fin structure

INTEL CORP0 citations62
US11594533B2Feb 28, 2023

Stacked trigate transistors with dielectric isolation between first and second semiconductor fins

INTEL CORP0 citations62
US11594485B2Feb 28, 2023

Local interconnect with air gap

INTEL CORP0 citations62
US11552104B2Jan 10, 2023

Stacked transistors with dielectric between channels of different device strata

INTEL CORP0 citations62
US11532719B2Dec 20, 2022

Transistors on heterogeneous bonding layers

INTEL CORP0 citations62
US11482621B2Oct 25, 2022

Vertically stacked CMOS with upfront M0 interconnect

INTEL CORP0 citations62
US11367684B2Jun 21, 2022

Recessed metal interconnects to mitigate EPE-related via shorting

INTEL CORP0 citations62
US12501684B2Dec 16, 2025

Integrated circuit structures with backside self-aligned penetrating conductive source or drain contact

INTEL CORP0 citations61
US12342574B2Jun 24, 2025

Contact resistance reduction in transistor devices with metallization on both sides

INTEL CORP0 citations61
US12080605B2Sep 3, 2024

Backside contacts for semiconductor devices

INTEL CORP1 citations60
US11424160B2Aug 23, 2022

Self-aligned local interconnects

INTEL CORP0 citations60
US11374004B2Jun 28, 2022

Pedestal fin structure for stacked transistor integration

INTEL CORP0 citations58
US12020929B2Jun 25, 2024

Epitaxial layer with substantially parallel sides

INTEL CORP0 citations52
US11605565B2Mar 14, 2023

Three dimensional integrated circuits with stacked transistors

INTEL CORP0 citations52
US11380684B2Jul 5, 2022

Stacked transistor architecture including nanowire or nanoribbon thin film transistors

INTEL CORP0 citations52
US11569238B2Jan 31, 2023

Vertical memory cells

INTEL CORP0 citations50

PAINTER PAUL

2 patents

PENN STATE RES FOUND

1 patent

LILAK AARON D

1 patent