Inventor
MANNEBACH EHREN
US49 patents
⚠️ This page may combine multiple inventors who share the name “MANNEBACH EHREN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
45 patentsUS11239236B2Feb 1, 2022
Forksheet transistor architectures
INTEL CORP9 citations86
US11437283B2Sep 6, 2022
Backside contacts for semiconductor devices
INTEL CORP12 citations85
US11348919B2May 31, 2022
Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach
INTEL CORP5 citations83
US11996411B2May 28, 2024
Stacked forksheet transistors
INTEL CORP4 citations74
US11367722B2Jun 21, 2022
Stacked nanowire transistor structure with different channel geometries for stress
INTEL CORP6 citations74
US12107085B2Oct 1, 2024
Interconnect techniques for electrically connecting source/drain regions of stacked transistors
INTEL CORP2 citations73
US11764263B2Sep 19, 2023
Gate-all-around integrated circuit structures having depopulated channel structures using multiple bottom-up oxidation approaches
INTEL CORP2 citations73
US11742346B2Aug 29, 2023
Interconnect techniques for electrically connecting source/drain regions of stacked transistors
INTEL CORP3 citations73
US11676966B2Jun 13, 2023
Stacked transistors having device strata with different channel widths
INTEL CORP2 citations73
US11664377B2May 30, 2023
Forksheet transistor architectures
INTEL CORP2 citations73
US11573798B2Feb 7, 2023
Stacked transistors with different gate lengths in different device strata
INTEL CORP1 citations73
US11342227B2May 24, 2022
Stacked transistor structures with asymmetrical terminal interconnects
INTEL CORP3 citations73
US11862636B2Jan 2, 2024
Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach
INTEL CORP2 citations72
US11348916B2May 31, 2022
Leave-behind protective layer having secondary purpose
INTEL CORP3 citations72
US11437405B2Sep 6, 2022
Transistors stacked on front-end p-type transistors
INTEL CORP1 citations63
US12255137B2Mar 18, 2025
Sideways vias in isolation areas to contact interior layers in stacked devices
INTEL CORP0 citations62
US12230635B2Feb 18, 2025
Gate-all-around integrated circuit structures having depopulated channel structures using selective bottom-up approach
INTEL CORP0 citations62
US12224202B2Feb 11, 2025
Forming an oxide volume within a fin
INTEL CORP0 citations62
US12148806B2Nov 19, 2024
Stacked source-drain-gate connection and process for forming such
INTEL CORP0 citations62
US11996408B2May 28, 2024
Leave-behind protective layer having secondary purpose
INTEL CORP0 citations62
US11942416B2Mar 26, 2024
Sideways vias in isolation areas to contact interior layers in stacked devices
INTEL CORP0 citations62
US11916118B2Feb 27, 2024
Stacked source-drain-gate connection and process for forming such
INTEL CORP0 citations62
US11894372B2Feb 6, 2024
Stacked trigate transistors with dielectric isolation and process for forming such
INTEL CORP0 citations62
US11830933B2Nov 28, 2023
Gate-all-around integrated circuit structures having depopulated channel structures using bottom-up oxidation approach
INTEL CORP0 citations62
US11798838B2Oct 24, 2023
Capacitance reduction for semiconductor devices based on wafer bonding
INTEL CORP0 citations62
US11769814B2Sep 26, 2023
Device including air gapping of gate spacers and other dielectrics and process for providing such
INTEL CORP0 citations62
US11764104B2Sep 19, 2023
Forming an oxide volume within a fin
INTEL CORP0 citations62
US11672133B2Jun 6, 2023
Vertically stacked memory elements with air gap
INTEL CORP1 citations62
US11646352B2May 9, 2023
Stacked source-drain-gate connection and process for forming such
INTEL CORP0 citations62
US11616060B2Mar 28, 2023
Techniques for forming gate structures for transistors arranged in a stacked configuration on a single fin structure
INTEL CORP0 citations62
US11594533B2Feb 28, 2023
Stacked trigate transistors with dielectric isolation between first and second semiconductor fins
INTEL CORP0 citations62
US11594485B2Feb 28, 2023
Local interconnect with air gap
INTEL CORP0 citations62
US11552104B2Jan 10, 2023
Stacked transistors with dielectric between channels of different device strata
INTEL CORP0 citations62
US11532719B2Dec 20, 2022
Transistors on heterogeneous bonding layers
INTEL CORP0 citations62
US11482621B2Oct 25, 2022
Vertically stacked CMOS with upfront M0 interconnect
INTEL CORP0 citations62
US11367684B2Jun 21, 2022
Recessed metal interconnects to mitigate EPE-related via shorting
INTEL CORP0 citations62
US12501684B2Dec 16, 2025
Integrated circuit structures with backside self-aligned penetrating conductive source or drain contact
INTEL CORP0 citations61
US12342574B2Jun 24, 2025
Contact resistance reduction in transistor devices with metallization on both sides
INTEL CORP0 citations61
US12080605B2Sep 3, 2024
Backside contacts for semiconductor devices
INTEL CORP1 citations60
US11424160B2Aug 23, 2022
Self-aligned local interconnects
INTEL CORP0 citations60
US11374004B2Jun 28, 2022
Pedestal fin structure for stacked transistor integration
INTEL CORP0 citations58
US12020929B2Jun 25, 2024
Epitaxial layer with substantially parallel sides
INTEL CORP0 citations52
US11605565B2Mar 14, 2023
Three dimensional integrated circuits with stacked transistors
INTEL CORP0 citations52
US11380684B2Jul 5, 2022
Stacked transistor architecture including nanowire or nanoribbon thin film transistors
INTEL CORP0 citations52
US11569238B2Jan 31, 2023
Vertical memory cells
INTEL CORP0 citations50