Inventor
KIM ILYOUNG
US18 patents
⚠️ This page may combine multiple inventors who share the name “KIM ILYOUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LUCENT TECHNOLOGIES INC
6 patentsUS6205564B1Mar 20, 2001
Optimized built-in self-test method and apparatus for random access memories
LUCENT TECHNOLOGIES INC65 citations96
US5978947ANov 2, 1999
Built-in self-test in a plurality of stages controlled by a token passing network and method
LUCENT TECHNOLOGIES INC23 citations90
US5978935ANov 2, 1999
Method for built-in self-testing of ring-address FIFOs having a data input register with transparent latches
LUCENT TECHNOLOGIES INC27 citations90
US6237123B1May 22, 2001
Built-in self-test controlled by a token network and method
LUCENT TECHNOLOGIES INC17 citations81
US6175936B1Jan 16, 2001
Apparatus for detecting faults in multiple computer memories
LUCENT TECHNOLOGIES INC7 citations73
US6108802AAug 22, 2000
Testing method and apparatus for first-in first-out memories
LUCENT TECHNOLOGIES INC13 citations70
SAMSUNG ELECTRONICS CO LTD
4 patentsUS11445098B2Sep 13, 2022
Camera assembly and electronic device including same
SAMSUNG ELECTRONICS CO LTD2 citations68
US12360221B2Jul 15, 2025
Electronic device and method for compensating for depth error according to modulation frequency
SAMSUNG ELECTRONICS CO LTD0 citations49
US11216070B2Jan 4, 2022
Electronic device and method for controlling actuator by utilizing same
SAMSUNG ELECTRONICS CO LTD0 citations48
US11852752B2Dec 26, 2023
Cross-talk prevention structure of electronic device for measuring distance to external object
SAMSUNG ELECTRONICS CO LTD0 citations45
AGERE SYST GUARDIAN CORP
3 patentsUS6317846B1Nov 13, 2001
System and method for detecting faults in computer memories using a look up table
AGERE SYST GUARDIAN CORP24 citations92
US6397349B2May 28, 2002
Built-in self-test and self-repair methods and devices for computer memories comprising a reconfiguration memory device
AGERE SYST GUARDIAN CORP39 citations91
US6216241B1Apr 10, 2001
Method and system for testing multiport memories
AGERE SYST GUARDIAN CORP74 citations91