P

Inventor

INUISHI MASAHIDE

JP22 patents

Patents

22 patents
US5369297ANov 29, 1994

Field effect transistor including silicon oxide film and nitrided oxide film as gate insulator film and manufacturing method thereof

MITSUBISHI ELECTRIC CORP57 citations96
US5258319ANov 2, 1993

Method of manufacturing a MOS type field effect transistor using an oblique ion implantation step

MITSUBISHI ELECTRIC CORP95 citations96
US5183771AFeb 2, 1993

Method of manufacturing lddfet having double sidewall spacers

MITSUBISHI ELECTRIC CORP50 citations96
US5146291ASep 8, 1992

MIS device having lightly doped drain structure

MITSUBISHI ELECTRIC CORP91 citations96
US5648284AJul 15, 1997

Field effect transistor including silicon oxide film and nitrided oxide film as gate insulator film and manufacturing method thereof

MITSUBISHI ELECTRIC CORP28 citations92
US5554876ASep 10, 1996

Field effect transistor including silicon oxide film and nitrided oxide film as gate insulator film and manufacturing method thereof

MITSUBISHI ELECTRIC CORP19 citations92
US5446305AAug 29, 1995

Semiconductor device with double structured well

MITSUBISHI ELECTRIC CORP20 citations92
US5217913AJun 8, 1993

Method of manufacturing an MIS device having lightly doped drain structure and conductive sidewall spacers

MITSUBISHI ELECTRIC CORP48 citations92
US5089865AFeb 18, 1992

Mis semiconductor device

MITSUBISHI ELECTRIC CORP29 citations92
US5061975AOct 29, 1991

MOS type field effect transistor having LDD structure

MITSUBISHI ELECTRIC CORP34 citations92
US4918500AApr 17, 1990

Semiconductor device having trench capacitor and manufacturing method therefor

MITSUBISHI ELECTRIC CORP21 citations82
US6420763B1Jul 16, 2002

Semiconductor device having a retrograde well structure and method of manufacturing thereof

MITSUBISHI ELECTRIC CORP9 citations74
US5536665AJul 16, 1996

Method of manufacturing a semiconductor device with double structured well

MITSUBISHI ELECTRIC CORP11 citations74
US5268321ADec 7, 1993

Method of making DRAM cell having improved radiation protection

MITSUBISHI ELECTRIC CORP7 citations74
US5258321ANov 2, 1993

Manufacturing method for semiconductor memory device having stacked trench capacitors and improved intercell isolation

MITSUBISHI ELECTRIC CORP15 citations74
US5200353AApr 6, 1993

Method of manufacturing a semiconductor device having trench capacitor

MITSUBISHI ELECTRIC CORP12 citations74
US4942448AJul 17, 1990

Structure for isolating semiconductor components on an integrated circuit and a method of manufacturing therefor

MITSUBISHI ELECTRIC CORP9 citations74
US4702797AOct 27, 1987

Method of manufacturing semiconductor memory device

MITSUBISHI ELECTRIC CORP16 citations74
US5852327ADec 22, 1998

Semiconductor device

MITSUBISHI ELECTRIC CORP7 citations68
US5166763ANov 24, 1992

Static type semiconductor memory device and method of manufacturing thereof

MITSUBISHI ELECTRIC CORP3 citations63
US5023682AJun 11, 1991

Semiconductor memory device

MITSUBISHI ELECTRIC CORP6 citations63
US5200918AApr 6, 1993

Static semiconductor memory with polysilicon source drain transistors

MITSUBISHI ELECTRIC CORP0 citations42