Inventor · disambiguated record
Fumio Hosokawa
Also filed as: HOSOKAWA FUMIO
15 granted patents·1 pending application·173 citations·filing 1999–2017
92Inventor score
Technology areasH01J
Top patents by PatentIndex Score
16 records- 0190US6744048B2Lens system for phase plate for transmission electron microscope and transmission electron microscopeJEOL LTD·Filed 2002·Granted Jun 1, 2004·40 cites·4 claims
- 0288US6924488B2Charged-particle beam apparatus equipped with aberration correctorJEOL LTD·Filed 2003·Granted Aug 2, 2005·33 cites·15 claims
- 0382US8785880B2Chromatic aberration corrector and electron microscopeJEOL LTD·Filed 2013·Granted Jul 22, 2014·5 cites·8 claims
- 0482US8178850B2Chromatic aberration corrector for charged-particle beam system and correction method thereforSAWADA HIDETAKA·Filed 2009·Granted May 15, 2012·7 cites·16 claims
- 0582US7763862B2Method of aberration correction and electron beam systemJEOL LTD·Filed 2007·Granted Jul 27, 2010·6 cites·8 claims
- 0682US7420179B2Electron microscopeJEOL LTD·Filed 2006·Granted Sep 2, 2008·7 cites·7 claims
- 0780US6448555B1Electron microscope and similar instrumentsJEOL LTD·Filed 1999·Granted Sep 10, 2002·38 cites·7 claims
- 0879US6836373B2Spherical aberration corrector for electron microscopeJEOL LTD·Filed 2002·Granted Dec 28, 2004·14 cites·3 claims
- 0977US6555818B1Transmission electron microscopeJEOL LTD·Filed 2000·Granted Apr 29, 2003·14 cites·4 claims
- 1065US7060985B2Multipole field-producing apparatus in charged-particle optical system and aberration correctorJEOL LTD·Filed 2004·Granted Jun 13, 2006·6 cites·4 claims
- 1157US6548816B2Stigmator assemblyJEOL LTD·Filed 2001·Granted Apr 15, 2003·3 cites·5 claims
- 1255US7598496B2Charged-particle beam systemJEOL LTD·Filed 2007·Granted Oct 6, 2009·0 cites·8 claims
- 1350US2008093563A1Aberration Corrector and Method of Aberration CorrectionJEOL LTD·Filed 2007·Application pending·0 cites
- 1443US8952339B2Chromatic aberration corrector and method of controlling sameJEOL LTD·Filed 2013·Granted Feb 10, 2015·0 cites·3 claims
- 1542US10020162B2Beam alignment method and electron microscopeJEOL LTD·Filed 2017·Granted Jul 10, 2018·0 cites·5 claims
- 1635US8664599B2Electron microscopeHOSOKAWA FUMIO·Filed 2010·Granted Mar 4, 2014·0 cites·3 claims
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