Inventor · disambiguated record
Joseph Nicholas Kochey
Also filed as: KOCHEY JOSEPH NICHOLAS
1 granted patent·1 pending application·32 citations·filing 2005–2008
45Inventor score
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2 records- 0190US7202691B2Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafersSEMICONDUCTOR DIAGNOSTICS INC·Filed 2005·Granted Apr 10, 2007·32 cites·18 claims
- 0242US2009047748A1Enhanced sensitivity non-contact electrical monitoring of copper contamination on silicon surfaceSAVTCHOUK ALEXANDRE·Filed 2008·Application pending·0 cites
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