P

Inventor

YU HYE-SEUNG

KR12 patents

Patents

12 patents
US9870808B2Jan 16, 2018

Memory device for performing calibration operation

SAMSUNG ELECTRONICS CO LTD8 citations83
US10078110B2Sep 18, 2018

Short circuit detecting device of stacked memory chips and method thereof

SAMSUNG ELECTRONICS CO LTD3 citations72
US9966126B2May 8, 2018

Delay circuit of a semiconductor memory device, a semiconductor memory device and a method of operating the same

SAMSUNG ELECTRONICS CO LTD3 citations71
US10243584B2Mar 26, 2019

Memory device including parity error detection circuit

SAMSUNG ELECTRONICS CO LTD4 citations70
US9959935B2May 1, 2018

Input-output circuit for supporting multiple-input shift register (MISR) function and memory device including the same

SAMSUNG ELECTRONICS CO LTD5 citations70
US10908212B2Feb 2, 2021

Semiconductor memory device including a shift register

SAMSUNG ELECTRONICS CO LTD0 citations62
US10938416B2Mar 2, 2021

Memory device including parity error detection circuit

SAMSUNG ELECTRONICS CO LTD1 citations59
US10651156B2May 12, 2020

Memory package and memory device utilizing an intermediate chip

SAMSUNG ELECTRONICS CO LTD1 citations58
US10509070B2Dec 17, 2019

Short circuit detecting device of stacked memory chips and method thereof

SAMSUNG ELECTRONICS CO LTD0 citations51
US9379693B2Jun 28, 2016

Self bias buffer circuit and memory device including the same

SAMSUNG ELECTRONICS CO LTD0 citations51
US9306569B2Apr 5, 2016

Compensation circuit for use with input buffer and method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations51
US12475933B2Nov 18, 2025

Memory module and electronic system including the same

SAMSUNG ELECTRONICS CO LTD0 citations47