Inventor
HOSOKAWA TOSHINORI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “HOSOKAWA TOSHINORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
14 patentsUS6449743B1Sep 10, 2002
Method of generating test sequences
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD32 citations92
US6292915B1Sep 18, 2001
Method of design for testability and method of test sequence generation
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD24 citations91
US5748646AMay 5, 1998
Design-for-testability method for path delay faults and test pattern generation method for path delay faults
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD18 citations83
US6651206B2Nov 18, 2003
Method of design for testability, test sequence generation method and semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations73
US6185721B1Feb 6, 2001
Method of design for testability at RTL and integrated circuit designed by the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD14 citations73
US6016564AJan 18, 2000
Method of design for testability, method of design for avoiding bus error and integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD11 citations73
US5737341AApr 7, 1998
Method of generating test sequence and apparatus for generating test sequence
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations73
US5319647AJun 7, 1994
Method and apparatus for performing automatic test pattern generation
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8 citations73
US5305328AApr 19, 1994
Method of test sequence generation
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD19 citations73
US6510535B1Jan 21, 2003
Method of design for testability for integrated circuits
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD11 citations69
US6708315B2Mar 16, 2004
Method of design for testability, method of design for integrated circuits and integrated circuits
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations62
US6271677B1Aug 7, 2001
Semiconductor integrated circuit and method for testing the semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations62
US6253343B1Jun 26, 2001
Method of design for testability test sequence generation method and semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations62
US5483543AJan 9, 1996
Test sequence generation method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations62