P

Inventor

CHAN LAP

US150 patents
⚠️ This page may combine multiple inventors who share the name “CHAN LAP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

47 patents
US6303418B1Oct 16, 2001

Method of fabricating CMOS devices featuring dual gate structures and a high dielectric constant gate insulator layer

CHARTERED SEMICONDUCTOR MFG374 citations99
US6300177B1Oct 9, 2001

Method to form transistors with multiple threshold voltages (VT) using a combination of different work function gate materials

CHARTERED SEMICONDUCTOR MFG175 citations99
US6261935B1Jul 17, 2001

Method of forming contact to polysilicon gate for MOS devices

CHARTERED SEMICONDUCTOR MFG216 citations99
US5870121AFeb 9, 1999

Ti/titanium nitride and ti/tungsten nitride thin film resistors for thermal ink jet technology

CHARTERED SEMICONDUCTOR MFG140 citations99
US5744376AApr 28, 1998

Method of manufacturing copper interconnect with top barrier layer

CHARTERED SEMICONDUCTOR MFG135 citations99
US5731239AMar 24, 1998

Method of making self-aligned silicide narrow gate electrodes for field effect transistors having low sheet resistance

CHARTERED SEMICONDUCTOR MFG174 citations99
US5710070AJan 20, 1998

Application of titanium nitride and tungsten nitride thin film resistor for thermal ink jet technology

CHARTERED SEMICONDUCTOR MFG146 citations99
US6461900B1Oct 8, 2002

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG141 citations98
US6313008B1Nov 6, 2001

Method to form a balloon shaped STI using a micro machining technique to remove heavily doped silicon

CHARTERED SEMICONDUCTOR MFG90 citations98
US6252290B1Jun 26, 2001

Method to form, and structure of, a dual damascene interconnect device

CHARTERED SEMICONDUCTOR MFG123 citations98
US6136693AOct 24, 2000

Method for planarized interconnect vias using electroless plating and CMP

CHARTERED SEMICONDUCTOR MFG289 citations98
US6747314B2Jun 8, 2004

Method to form a self-aligned CMOS inverter using vertical device integration

CHARTERED SEMICONDUCTOR MFG93 citations97
US6348385B1Feb 19, 2002

Method for a short channel CMOS transistor with small overlay capacitance using in-situ doped spacers with a low dielectric constant

CHARTERED SEMICONDUCTOR MFG128 citations97
US6406945B1Jun 18, 2002

Method for forming a transistor gate dielectric with high-K and low-K regions

CHARTERED SEMICONDUCTOR MFG59 citations96
US6403485B1Jun 11, 2002

Method to form a low parasitic capacitance pseudo-SOI CMOS device

CHARTERED SEMICONDUCTOR MFG66 citations96
US6140237AOct 31, 2000

Damascene process for forming coplanar top surface of copper connector isolated by barrier layers in an insulating layer

CHARTERED SEMICONDUCTOR MFG68 citations96
US6121130ASep 19, 2000

Laser curing of spin-on dielectric thin films

CHARTERED SEMICONDUCTOR MFG118 citations96
US6110787AAug 29, 2000

Method for fabricating a MOS device

CHARTERED SEMICONDUCTOR MFG99 citations96
US5856225AJan 5, 1999

Creation of a self-aligned, ion implanted channel region, after source and drain formation

CHARTERED SEMICONDUCTOR MFG253 citations96
US5728621AMar 17, 1998

Method for shallow trench isolation

CHARTERED SEMICONDUCTOR MFG171 citations96
US6252277B1Jun 26, 2001

Embedded polysilicon gate MOSFET

CHARTERED SEMICONDUCTOR MFG137 citations95
US6221727B1Apr 24, 2001

Method to trap air at the silicon substrate for improving the quality factor of RF inductors in CMOS technology

CHARTERED SEMICONDUCTOR MFG66 citations95
US6214728B1Apr 10, 2001

Method to encapsulate copper plug for interconnect metallization

CHARTERED SEMICONDUCTOR MFG52 citations95
US6001706ADec 14, 1999

Method for making improved shallow trench isolation for semiconductor integrated circuits

CHARTERED SEMICONDUCTOR MFG103 citations95
US5705849AJan 6, 1998

Antifuse structure and method for manufacturing it

CHARTERED SEMICONDUCTOR MFG55 citations95
US5610083AMar 11, 1997

Method of making back gate contact for silicon on insulator technology

CHARTERED SEMICONDUCTOR MFG98 citations95
US6468906B1Oct 22, 2002

Passivation of copper interconnect surfaces with a passivating metal layer

CHARTERED SEMICONDUCTOR MFG67 citations94
US6716693B1Apr 6, 2004

Method of forming a surface coating layer within an opening within a body by atomic layer deposition

CHARTERED SEMICONDUCTOR MFG49 citations93
US6709934B2Mar 23, 2004

Method for forming variable-K gate dielectric

CHARTERED SEMICONDUCTOR MFG26 citations93
US6656792B2Dec 2, 2003

Nanocrystal flash memory device and manufacturing method therefor

CHARTERED SEMICONDUCTOR MFG106 citations93
US6511884B1Jan 28, 2003

Method to form and/or isolate vertical transistors

CHARTERED SEMICONDUCTOR MFG48 citations93
US6468877B1Oct 22, 2002

Method to form an air-gap under the edges of a gate electrode by using disposable spacer/liner

CHARTERED SEMICONDUCTOR MFG53 citations93
US6455377B1Sep 24, 2002

Method to form very high mobility vertical channel transistor by selective deposition of SiGe or multi-quantum wells (MQWs)

CHARTERED SEMICONDUCTOR MFG21 citations93
US6436770B1Aug 20, 2002

Method to control the channel length of a vertical transistor by first forming channel using selective epi and source/drain using implantation

CHARTERED SEMICONDUCTOR MFG45 citations93
US6417056B1Jul 9, 2002

Method to form low-overlap-capacitance transistors by forming microtrench at the gate edge

CHARTERED SEMICONDUCTOR MFG51 citations93
US6306715B1Oct 23, 2001

Method to form smaller channel with CMOS device by isotropic etching of the gate materials

CHARTERED SEMICONDUCTOR MFG46 citations93
US6275089B1Aug 14, 2001

Low voltage controllable transient trigger network for ESD protection

CHARTERED SEMICONDUCTOR MFG45 citations93
US6188135B1Feb 13, 2001

Copper interconnect with top barrier layer

CHARTERED SEMICONDUCTOR MFG22 citations93
US6177324B1Jan 23, 2001

ESD protection device for STI deep submicron technology

CHARTERED SEMICONDUCTOR MFG42 citations93
US5948700ASep 7, 1999

Method of planarization of an intermetal dielectric layer using chemical mechanical polishing

CHARTERED SEMICONDUCTOR MFG33 citations93
US5900672AMay 4, 1999

Barrier layer

CHARTERED SEMICONDUCTOR MFG21 citations93
US6903013B2Jun 7, 2005

Method to fill a trench and tunnel by using ALD seed layer and electroless plating

CHARTERED SEMICONDUCTOR MFG44 citations92
US6730571B1May 4, 2004

Method to form a cross network of air gaps within IMD layer

CHARTERED SEMICONDUCTOR MFG23 citations92
US6696761B2Feb 24, 2004

Method to encapsulate copper plug for interconnect metallization

CHARTERED SEMICONDUCTOR MFG17 citations92
US6638844B1Oct 28, 2003

Method of reducing substrate coupling/noise for radio frequency CMOS (RFCMOS) components in semiconductor technology by backside trench and fill

CHARTERED SEMICONDUCTOR MFG29 citations92
US6501122B1Dec 31, 2002

Flash device having a large planar area ono interpoly dielectric

CHARTERED SEMICONDUCTOR MFG20 citations92
US6495200B1Dec 17, 2002

Method to deposit a seeding layer for electroless copper plating

CHARTERED SEMICONDUCTOR MFG77 citations92

UNIV SINGAPORE

1 patent

CHARTERED SEMICONDUCTOR MANU L

1 patent

CHARTERED SEMIDCONDUCTOR MANUF

1 patent

Showing the top 50 of 150 patents by PatentIndex Score.