Inventor
CHANG WEN-TUNG
TW17 patents
⚠️ This page may combine multiple inventors who share the name “CHANG WEN-TUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
4 patentsUS6734427B1May 11, 2004
TEM/SEM sample preparation
UNITED MICROELECTRONICS CORP18 citations79
US6646259B2Nov 11, 2003
Method of sample preparation for transmission electron microscope analysis
UNITED MICROELECTRONICS CORP13 citations76
US6616784B2Sep 9, 2003
Method for fabricating transmission electron microscope
UNITED MICROELECTRONICS CORP8 citations69
US7268440B2Sep 11, 2007
Fabrication of semiconductor integrated circuit chips
UNITED MICROELECTRONICS CORP2 citations60
UNIV NAT TAIWAN OCEAN
3 patentsUS10151585B1Dec 11, 2018
Non-contact and optical measuring automation system for the surface roughness value of disk cams and method thereof
UNIV NAT TAIWAN OCEAN7 citations81
US10415962B2Sep 17, 2019
Non-contact and optical measuring automation system for the profile accuracy of disk cams and method thereof
UNIV NAT TAIWAN OCEAN0 citations39
US9296086B2Mar 29, 2016
Destructive and visual measurement automation system for web thickness of microdrills and method thereof
UNIV NAT TAIWAN OCEAN0 citations30
MOSEL VITELIC INC
3 patentsUS6074291AJun 13, 2000
Apparatus for preparing ultra-thin specimen
MOSEL VITELIC INC2 citations60
US6388265B1May 14, 2002
Method for distinguishing a specific region in a sample to be observed by a microscope
MOSEL VITELIC INC3 citations55
US6426500B1Jul 30, 2002
Method for protecting a specific region in a sample applied in preparing an ultra-thin specimen
MOSEL VITELIC INC5 citations54