Inventor · disambiguated record
Kazuaki Sawada
Also filed as: SAWADA KAZUAKI
28 granted patents·12 pending applications·591 citations·filing 1998–2023
95Inventor score
Files withSINTOKOGIO LTD9ISHIDA MAKOTO4NATIONAL UNIV CORPORATION TOYOHASHI UNIV OF TECHNOLOGY4SAWADA KAZUAKI4DASAI FUMIHIRO2
Top patents by PatentIndex Score
40 records- 0196US6255678B1Apparatus for measuring physical and chemical phenomenaHORIBA LTD·Filed 1998·Granted Jul 3, 2001·190 cites·24 claims
- 0291US7049645B2FET type sensor, ion density detecting method comprising this sensor, and base sequence detecting methodBIO X INC·Filed 2002·Granted May 23, 2006·240 cites·8 claims
- 0386US8183594B2Laminar structure on a semiconductor substrateISHIDA MAKOTO·Filed 2007·Granted May 22, 2012·15 cites·7 claims
- 0486US6294133B1Multiple detecting apparatus for physical phenomenon and/or chemical phenomenonHORIBA LTD·Filed 1999·Granted Sep 25, 2001·92 cites·26 claims
- 0584US7956593B2Power generation circuit using electromagnetic waveSEIKO INSTR INC·Filed 2005·Granted Jun 7, 2011·21 cites·9 claims
- 0682US10031101B2Chemical/physical phenomenon detecting device and method of producing the sameSHARP KK·Filed 2015·Granted Jul 24, 2018·2 cites·4 claims
- 0780US7855429B2Electronic circuit device having silicon substrateSEIKO INSTR INC·Filed 2008·Granted Dec 21, 2010·15 cites·14 claims
- 0873US7826980B2Cumulative chemical/physical phenomenon detecting apparatusNAT UNIV CORP TOYOHASHI UNIV T·Filed 2006·Granted Nov 2, 2010·4 cites·8 claims
- 0972US11921081B2Odor sensor and method for manufacturing odor sensorHAMAMATSU PHOTONICS KK·Filed 2019·Granted Mar 5, 2024·1 cites·20 claims
- 1064US12492967B2Gas measuring device and gas measuring systemSINTOKOGIO LTD·Filed 2023·Granted Dec 9, 2025·0 cites·8 claims
- 1164US8513927B2Power generation circuit for generating and storing electric power utilizing radio wave energyISHIDA MAKOTO·Filed 2011·Granted Aug 20, 2013·2 cites·11 claims
- 1263US12442757B2Gas measuring device and gas measuring methodSINTOKOGIO LTD·Filed 2023·Granted Oct 14, 2025·0 cites·6 claims
- 1359US8388893B2Combined detectorSAWADA KAZUAKI·Filed 2008·Granted Mar 5, 2013·1 cites·8 claims
- 1459US2024151693A1Gas measurement device, gas measurement system, and gas measurement methodSINTOKOGIO LTD·Filed 2023·Application pending·0 cites
- 1558US12281977B2Gas measurement device having variable volumeSINTOKOGIO LTD·Filed 2021·Granted Apr 22, 2025·0 cites·7 claims
- 1657US2023314354A1Gas measuring deviceSINTOKOGIO LTD·Filed 2023·Application pending·0 cites
- 1757US2023314375A1Gas measuring deviceSINTOKOGIO LTD·Filed 2023·Application pending·0 cites
- 1856US12379297B2Gas measurement device and gas measurement methodSINTOKOGIO LTD·Filed 2021·Granted Aug 5, 2025·0 cites·6 claims
- 1954US12326429B2Gas measurement device and gas measurement methodSINTOKOGIO LTD·Filed 2021·Granted Jun 10, 2025·0 cites·16 claims
- 2053US7026618B2Highly-sensitive, pyroelectric infrared sensing method and apparatusJAPAN SCIENCE & TECH CORP·Filed 2001·Granted Apr 11, 2006·1 cites·14 claims
- 2151US2011174987A1Spectroscopic Device, and Method for Driving the DeviceNAT UNIV CORP TOYOHASHI UNIV·Filed 2009·Application pending·0 cites
- 2251US2023096909A1Gas measurement device and gas measurement methodSINTOKOGIO LTD·Filed 2021·Application pending·0 cites
- 2348US7465915B2Measuring method of incident light and sensor having spectroscopic mechanism employing itJAPAN SCIENCE & TECH AGENCY·Filed 2004·Granted Dec 16, 2008·2 cites·12 claims
- 2447US9976981B2Device for detecting chemical/physical phenomenon having a diffusion layer formed between an input charge control region and a sensing region on a substrateNATIONAL UNIV CORPORATION TOYOHASHI UNIV OF TECHNOLOGY·Filed 2016·Granted May 22, 2018·0 cites·3 claims
- 2547US2010071984A1VehicleEQUOS RESEARCH KK·Filed 2007·Application pending·0 cites
- 2646US10073052B2Ion concentration sensorSHARP KK·Filed 2016·Granted Sep 11, 2018·0 cites·6 claims
- 2746US2014233039A1Physical/chemical sensor, physical/chemical phenomenon sensing device, and method for manufacturing sameNAT UNIV CORP TOYOHASHI UNIV·Filed 2012·Application pending·0 cites
- 2845US7692257B2Ultrasonic sensor comprising a metal/ferroelectric/metal/insulator/semiconductor structureNAT UNIV CORP TOYOHASHI UNIV T·Filed 2004·Granted Apr 6, 2010·5 cites·6 claims
- 2945US2005233518A1Electronic circuit device having silicon substrateISHIDA MAKOTO·Filed 2005·Application pending·0 cites
- 3044US9915629B2Method for identifying pH, device for same, and method for identifying ion concentrationNATIONAL UNIV CORPORATION TOYOHASHI UNIV OF TECHNOLOGY·Filed 2014·Granted Mar 13, 2018·0 cites·8 claims
- 3143US9689837B2Device for measuring oxidation-reduction potential and method for measuring oxidation-reduction potentialNAT UNIV CORP TOYOHASHI UNIV OF TECH·Filed 2013·Granted Jun 27, 2017·0 cites·7 claims
- 3240US10845329B2Ion concentration distribution measuring deviceNATIONAL UNIV CORPORATION TOYOHASHI UNIV OF TECHNOLOGY·Filed 2018·Granted Nov 24, 2020·0 cites·6 claims
- 3340US2012002201A1Spectral Device and Method for Controlling SameSAWADA KAZUAKI·Filed 2010·Application pending·0 cites
- 3439US9766202B2Method for detecting chemical and physical phenomenon, and device thereforDASAI FUMIHIRO·Filed 2012·Granted Sep 19, 2017·0 cites·7 claims
- 3539US2008128592A1Light Receiving ElementSAWADA KAZUAKI·Filed 2005·Application pending·0 cites
- 3639US2008018959A1Multiplier And Image Sensor Employing SameSAWADA KAZUAKI·Filed 2005·Application pending·0 cites
- 3738US9335287B2Specification device for water status of soil, and method for sameFUTAGAWA MASATO·Filed 2011·Granted May 10, 2016·0 cites·4 claims
- 3835US9482641B2Device and method for detecting chemical and physical phenomenaDASAI FUMIHIRO·Filed 2012·Granted Nov 1, 2016·0 cites·13 claims
- 3935US2009278212A1Integrated DeviceISHIDA MAKOTO·Filed 2006·Application pending·0 cites
- 4032US10309922B2Device for detecting chemical/physical phenomenonNATIONAL UNIV CORPORATION TOYOHASHI UNIV OF TECHNOLOGY·Filed 2016·Granted Jun 4, 2019·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →