Inventor

MATTES HEINZ

DE19 patents

⚠️ This page may combine multiple inventors who share the name “MATTES HEINZ”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MATTES HEINZ

INFINEON TECHNOLOGIES AG

Device and method for measuring jitter

Electrical circuit for measuring times and method for measuring times

Device and method for testing integrated circuits

Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit

Electrical circuit and method for testing integrated circuits

Method and filter arrangement for digital recursive filtering in the time domain

Measuring device and method for measuring relative phase shifts of digital signals

Test apparatus and method for testing analog/digital converters

Test apparatus with low-reflection signal distribution

Apparatus and method for the characterization of analog-to-digital converters

Apparatus and method for the characterization of analog-to-digital converters

Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device

Signal generating circuit

Test apparatus and test method for mixed-signal semiconductor components

Method and device for estimating channel properties of a transmission channel

SIEMENS AG

Apparatus and method for recording, communicating and administering digital images

Method in a parallel test apparatus for semiconductor memories

Integrated circuit with memory programmable pad driver

GOESSEL MICHAEL

Evaluation circuit and method for detecting and/or locating faulty data words in a data stream Tn