P

Inventor

OGIHARA MASAKI

JP31 patents
⚠️ This page may combine multiple inventors who share the name “OGIHARA MASAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

28 patents
US5726475AMar 10, 1998

Semiconductor device having different impurity concentration wells

TOSHIBA KK29 citations92
US5712827AJan 27, 1998

Dynamic type memory

TOSHIBA KK20 citations92
US5586078ADec 17, 1996

Dynamic type memory

TOSHIBA KK49 citations92
US5475646ADec 12, 1995

Screening circuitry for a dynamic random access memory

TOSHIBA KK32 citations92
US5386386AJan 31, 1995

Redundancy circuit having a spare memory block replacing defective memory cells in different blocks

TOSHIBA KK30 citations92
US5335205AAug 2, 1994

DRAM using word line potential control circuitcircuit

TOSHIBA KK27 citations92
US5272672ADec 21, 1993

Semiconductor memory device having redundant circuit

TOSHIBA KK23 citations92
US5079613AJan 7, 1992

Semiconductor device having different impurity concentration wells

TOSHIBA KK37 citations92
US4980863ADec 25, 1990

Semiconductor memory device having switching circuit for coupling together two pairs of bit lines

TOSHIBA KK29 citations92
US6141288AOct 31, 2000

Semiconductor memory device allowing change of refresh mode and address switching method therewith

TOSHIBA KK12 citations82
US5633827AMay 27, 1997

Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith

TOSHIBA KK10 citations82
US5559748ASep 24, 1996

Semiconductor integrated circuit allowing change of product specification and chip screening method therewith

TOSHIBA KK15 citations82
US5374838ADec 20, 1994

Semiconductor device having different impurity concentration wells

TOSHIBA KK19 citations82
US5260226ANov 9, 1993

Semiconductor device having different impurity concentration wells

TOSHIBA KK16 citations82
US5812481ASep 22, 1998

Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith

TOSHIBA KK9 citations74
US5619162AApr 8, 1997

Dram using word line potential circuit control

TOSHIBA KK5 citations74
US5550504AAug 27, 1996

Dram using word line potential control circuit

TOSHIBA KK13 citations74
US5420816AMay 30, 1995

Semiconductor memory apparatus with configured word lines to reduce noise

TOSHIBA KK18 citations74
US5371710ADec 6, 1994

Semiconductor memory device having test mode

TOSHIBA KK8 citations74
US5303193AApr 12, 1994

Semiconductor device

TOSHIBA KK19 citations74
US5238860AAug 24, 1993

Semiconductor device having different impurity concentration wells

TOSHIBA KK19 citations74
US5144388ASep 1, 1992

Semiconductor device having a plurality of fets formed in an element area

TOSHIBA KK18 citations74
US4931992AJun 5, 1990

Semiconductor memory having barrier transistors connected between sense and restore circuits

TOSHIBA KK10 citations74
US4829483AMay 9, 1989

Method and apparatus for selecting disconnecting first and second bit line pairs for sensing data output from a drain at a high speed

TOSHIBA KK13 citations74
US5642326AJun 24, 1997

Dynamic memory

TOSHIBA KK9 citations73
US5111275AMay 5, 1992

Multicell semiconductor memory device

TOSHIBA KK2 citations63
USRE37427EOct 30, 2001

Dynamic type memory

TOSHIBA KK2 citations62
US5970015AOct 19, 1999

Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith

TOSHIBA KK0 citations52

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3 patents