Inventor
IWASA SHOICHI
JP33 patents
⚠️ This page may combine multiple inventors who share the name “IWASA SHOICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIPPON STEEL CORP
25 patentsUS5596527AJan 21, 1997
Electrically alterable n-bit per cell non-volatile memory with reference cells
NIPPON STEEL CORP251 citations99
US5418743AMay 23, 1995
Method of writing into non-volatile semiconductor memory
NIPPON STEEL CORP158 citations99
US5436481AJul 25, 1995
MOS-type semiconductor device and method of making the same
NIPPON STEEL CORP184 citations98
US5424978AJun 13, 1995
Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
NIPPON STEEL CORP176 citations98
US5959319ASep 28, 1999
Semiconductor memory device having word line conductors provided at lower level than memory cell capacitor and method of manufacturing same
NIPPON STEEL CORP22 citations92
US5814850ASep 29, 1998
Semiconductor device including a capacitor responsible for a power supply voltage to semiconductor device and capable of blocking an increased voltage
NIPPON STEEL CORP32 citations92
US5798545AAug 25, 1998
Semiconductor storage device
NIPPON STEEL CORP35 citations92
US5644151AJul 1, 1997
Semiconductor memory device and method for fabricating the same
NIPPON STEEL CORP45 citations92
US5572464ANov 5, 1996
Semiconductor memory device and method of using the same
NIPPON STEEL CORP22 citations92
US5569947AOct 29, 1996
Insulated-gate field-effect transistor in a semiconductor device in which source/drain electrodes are defined by formation of silicide on a gate electrode and a field-effect transistor
NIPPON STEEL CORP19 citations92
US5471423ANov 28, 1995
Non-volatile semiconductor memory device
NIPPON STEEL CORP32 citations92
US5381028AJan 10, 1995
Nonvolatile semiconductor memory with raised source and drain
NIPPON STEEL CORP44 citations92
US5323342AJun 21, 1994
MOS memory device
NIPPON STEEL CORP53 citations92
US6468887B2Oct 22, 2002
Semiconductor device and a method of manufacturing the same
NIPPON STEEL CORP40 citations91
US6288431B1Sep 11, 2001
Semiconductor device and a method of manufacturing the same
NIPPON STEEL CORP38 citations91
US6060350AMay 9, 2000
Semiconductor memory device having word line conductors provided at lower level than memory cell capacitor and method of manufacturing same
NIPPON STEEL CORP7 citations74
US6051466AApr 18, 2000
Method of making a semiconductor device with a stacked cell structure
NIPPON STEEL CORP9 citations74
US5747845AMay 5, 1998
Semiconductor memory device with memory cells each having transistor and capacitor and method of making the same
NIPPON STEEL CORP9 citations74
US5686746ANov 11, 1997
Semiconductor memory device and a method of making the same
NIPPON STEEL CORP11 citations74
US5530276AJun 25, 1996
Nonvolatile semiconductor memory device
NIPPON STEEL CORP8 citations74
US5278787AJan 11, 1994
Semiconductor device and method of manufacturing the same
NIPPON STEEL CORP11 citations74
US5396120AMar 7, 1995
Semiconductor integrated unit
NIPPON STEEL CORP9 citations73
US6313509B1Nov 6, 2001
Semiconductor device and a MOS transistor for circuit protection
NIPPON STEEL CORP2 citations63
US5329483AJul 12, 1994
MOS semiconductor memory device
NIPPON STEEL CORP4 citations63
US5663103ASep 2, 1997
Method of manufacturing an insulated-gate field-effect transistor in a semiconductor device in which source/drain electrodes are defined by formation of silicide on a gate electrode and a field-effect transistor
NIPPON STEEL CORP2 citations62
NEC CORP
5 patentsUS5042008AAug 20, 1991
Non-volatile semiconductor memory device having word lines ("control gates") embedded in substrate
NEC CORP40 citations93
US5291047AMar 1, 1994
Floating gate type electrically programmable read only memory cell with variable threshold level in erased state
NEC CORP15 citations74
US5089866AFeb 18, 1992
Two-transistor type non-volatile semiconductor memory
NEC CORP13 citations74
US5027175AJun 25, 1991
Integrated circuit semiconductor device having improved wiring structure
NEC CORP7 citations74
US4982377AJan 1, 1991
Erasable programmable read only memory device improved in operation speed and in the amount of read out current
NEC CORP16 citations74
UNITED MICROELECTRONICS CORP
2 patentsUS6917076B2Jul 12, 2005
Semiconductor device, a method of manufacturing the semiconductor device and a method of deleting information from the semiconductor device
UNITED MICROELECTRONICS CORP20 citations91
US6657229B1Dec 2, 2003
Semiconductor device having multiple transistors sharing a common gate
UNITED MICROELECTRONICS CORP26 citations91