Inventor
LAM CHUNG HON
US111 patents
⚠️ This page may combine multiple inventors who share the name “LAM CHUNG HON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
33 patentsUS7351648B2Apr 1, 2008
Methods for forming uniform lithographic features
IBM163 citations99
US6657252B2Dec 2, 2003
FinFET CMOS with NVRAM capability
IBM193 citations99
US7514705B2Apr 7, 2009
Phase change memory cell with limited switchable volume
IBM55 citations98
US7394089B2Jul 1, 2008
Heat-shielded low power PCM-based reprogrammable EFUSE device
IBM76 citations98
US7388273B2Jun 17, 2008
Reprogrammable fuse structure and method
IBM73 citations98
US7485891B2Feb 3, 2009
Multi-bit phase change memory cell and multi-bit phase change memory including the same, method of forming a multi-bit phase change memory, and method of programming a multi-bit phase change memory
IBM125 citations97
US7376006B2May 20, 2008
Enhanced programming performance in a nonvolatile memory device having a bipolar programmable storage element
IBM138 citations97
US6403482B1Jun 11, 2002
Self-aligned junction isolation
IBM58 citations96
US6504207B1Jan 7, 2003
Method to create EEPROM memory structures integrated with high performance logic and NVRAM, and operating conditions for the same
IBM67 citations95
US7943420B1May 17, 2011
Single mask adder phase change memory element
IBM18 citations93
US7473921B2Jan 6, 2009
Nonvolatile memory cell with concentric phase change material formed around a pillar arrangement
IBM26 citations93
US7460389B2Dec 2, 2008
Write operations for phase-change-material memory
IBM27 citations93
US7351666B2Apr 1, 2008
Layout and process to contact sub-lithographic structures
IBM36 citations93
US7319608B2Jan 15, 2008
Non-volatile content addressable memory using phase-change-material memory elements
IBM27 citations93
US7052958B1May 30, 2006
FinFET CMOS with NVRAM capability
IBM22 citations93
US6413828B1Jul 2, 2002
Process using poly-buffered STI
IBM17 citations93
US6352895B1Mar 5, 2002
Method of forming merged self-aligned source and ONO capacitor for split gate non-volatile memory
IBM23 citations93
US7488967B2Feb 10, 2009
Structure for confining the switching current in phase memory (PCM) cells
IBM40 citations92
US7324366B2Jan 29, 2008
Non-volatile memory architecture employing bipolar programmable resistance storage elements
IBM44 citations92
US5656544AAug 12, 1997
Process for forming a polysilicon electrode in a trench
IBM39 citations92
US6326275B1Dec 4, 2001
DRAM cell with vertical CMOS transistor
IBM47 citations91
US6420777B2Jul 16, 2002
Dual layer etch stop barrier
IBM17 citations90
US6190961B1Feb 20, 2001
Fabricating a square spacer
IBM25 citations89
US8055988B2Nov 8, 2011
Multi-bit memory error detection and correction system and method
IBM9 citations84
US7989796B2Aug 2, 2011
Nonvolatile memory cell with concentric phase change material formed around a pillar arrangement
IBM9 citations84
US7983069B2Jul 19, 2011
Write operations for phase-change-material memory
IBM11 citations84
US7960808B2Jun 14, 2011
Reprogrammable fuse structure and method
IBM8 citations84
US7932167B2Apr 26, 2011
Phase change memory cell with vertical transistor
IBM7 citations84
US7932507B2Apr 26, 2011
Current constricting phase change memory element structure
IBM14 citations84
US7811879B2Oct 12, 2010
Process for PCM integration with poly-emitter BJT as access device
IBM16 citations84
US7795605B2Sep 14, 2010
Phase change material based temperature sensor
IBM12 citations84
US7782646B2Aug 24, 2010
High density content addressable memory using phase change devices
IBM14 citations84
US7755935B2Jul 13, 2010
Block erase for phase change memory
IBM10 citations84
MACRONIX INT CO LTD
9 patentsUS9793323B1Oct 17, 2017
Phase change memory with high endurance
MACRONIX INT CO LTD21 citations94
US8036014B2Oct 11, 2011
Phase change memory program method without over-reset
MACRONIX INT CO LTD27 citations93
US7968876B2Jun 28, 2011
Phase change memory cell having vertical channel access transistor
MACRONIX INT CO LTD22 citations93
US7879645B2Feb 1, 2011
Fill-in etching free pore device
MACRONIX INT CO LTD31 citations93
US7791057B2Sep 7, 2010
Memory cell having a buried phase change region and method for fabricating the same
MACRONIX INT CO LTD24 citations93
US7642125B2Jan 5, 2010
Phase change memory cell in via array with self-aligned, self-converged bottom electrode and method for manufacturing
MACRONIX INT CO LTD36 citations93
US7551473B2Jun 23, 2009
Programmable resistive memory with diode structure
MACRONIX INT CO LTD31 citations93
US8350316B2Jan 8, 2013
Phase change memory cells having vertical channel access transistor and memory plane
MACRONIX INT CO LTD13 citations84
US7932506B2Apr 26, 2011
Fully self-aligned pore-type memory cell having diode access device
MACRONIX INT CO LTD8 citations84
LUNG HSIANG-LAN
3 patentsUS8178386B2May 15, 2012
Phase change memory cell array with self-converged bottom electrode and method for manufacturing
LUNG HSIANG-LAN26 citations93
US8729521B2May 20, 2014
Self aligned fin-type programmable memory cell
LUNG HSIANG-LAN15 citations84
US8143612B2Mar 27, 2012
Phase change memory cell in via array with self-aligned, self-converged bottom electrode and method for manufacturing
LUNG HSIANG-LAN10 citations84
BREITWISCH MATTHEW J
2 patentsUS8589320B2Nov 19, 2013
Area efficient neuromorphic system that connects a FET in a diode configuration, and a variable resistance material to junctions of neuron circuit blocks
BREITWISCH MATTHEW J46 citations98
US8311965B2Nov 13, 2012
Area efficient neuromorphic circuits using field effect transistors (FET) and variable resistance material
BREITWISCH MATTHEW J71 citations98
LUNG HSIANG LAN
1 patentBREITWISCH MATTHEW JOSEPH
1 patentGLOBALFOUNDRIES INC
1 patentShowing the top 50 of 111 patents by PatentIndex Score.