P

Inventor

LEE HSIANG-HUAN

TW66 patents
⚠️ This page may combine multiple inventors who share the name “LEE HSIANG-HUAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

26 patents
US9773676B2Sep 26, 2017

Lithography using high selectivity spacers for pitch reduction

TAIWAN SEMICONDUCTOR MFG CO LTD17 citations93
US10014175B2Jul 3, 2018

Lithography using high selectivity spacers for pitch reduction

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9892933B2Feb 13, 2018

Lithography using multilayer spacer for reduced spacer footing

TAIWAN SEMICONDUCTOR MFG CO LTD15 citations84
US9728503B2Aug 8, 2017

Via pre-fill on back-end-of-the-line interconnect layer

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9633949B2Apr 25, 2017

Copper etching integration scheme

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9490205B2Nov 8, 2016

Integrated circuit interconnects and methods of making same

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9373586B2Jun 21, 2016

Copper etching integration scheme

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9343356B2May 17, 2016

Back end of the line (BEOL) interconnect scheme

TAIWAN SEMICONDUCTOR MFG CO LTD14 citations83
US9613854B2Apr 4, 2017

Method and apparatus for back end of line semiconductor device processing

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations82
US10020259B2Jul 10, 2018

Copper etching integration scheme

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9818644B2Nov 14, 2017

Interconnect structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9646932B2May 9, 2017

Method for forming interconnect structure that avoids via recess

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9640431B2May 2, 2017

Method for via plating with seed layer

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9466525B2Oct 11, 2016

Interconnect structures comprising flexible buffer layers

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9281263B2Mar 8, 2016

Interconnect structure including a continuous conductive body

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9837310B2Dec 5, 2017

Method of manufacturing a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US12543551B2Feb 3, 2026

Selective formation of conductor nanowires

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11908789B2Feb 20, 2024

Selective formation of conductor nanowires

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10930552B2Feb 23, 2021

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9324608B2Apr 26, 2016

Method for via plating with seed layer

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US9219033B2Dec 22, 2015

Via pre-fill on back-end-of-the-line interconnect layer

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US10121698B2Nov 6, 2018

Method of manufacturing a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10490497B2Nov 26, 2019

Selective formation of conductor nanowires

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10453746B2Oct 22, 2019

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10354954B2Jul 16, 2019

Copper etching integration scheme

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9947583B2Apr 17, 2018

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52

TAIWAN SEMICONDUCTOR MFG

19 patents
US9177797B2Nov 3, 2015

Lithography using high selectivity spacers for pitch reduction

TAIWAN SEMICONDUCTOR MFG28 citations94
US8735280B1May 27, 2014

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG13 citations92
US9343400B2May 17, 2016

Dual damascene gap filling process

TAIWAN SEMICONDUCTOR MFG9 citations84
US9318439B2Apr 19, 2016

Interconnect structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG6 citations84
US9252049B2Feb 2, 2016

Method for forming interconnect structure that avoids via recess

TAIWAN SEMICONDUCTOR MFG7 citations84
US9159579B2Oct 13, 2015

Lithography using multilayer spacer for reduced spacer footing

TAIWAN SEMICONDUCTOR MFG8 citations84
US9030013B2May 12, 2015

Interconnect structures comprising flexible buffer layers

TAIWAN SEMICONDUCTOR MFG9 citations84
US8728936B1May 20, 2014

Copper etching integration scheme

TAIWAN SEMICONDUCTOR MFG7 citations84
US8013445B2Sep 6, 2011

Low resistance high reliability contact via and metal line structure for semiconductor device

TAIWAN SEMICONDUCTOR MFG12 citations84
US9142505B2Sep 22, 2015

Method and apparatus for back end of line semiconductor device processing

TAIWAN SEMICONDUCTOR MFG9 citations82
US9318364B2Apr 19, 2016

Semiconductor device metallization systems and methods

TAIWAN SEMICONDUCTOR MFG3 citations73
US9269668B2Feb 23, 2016

Interconnect having air gaps and polymer wrapped conductive lines

TAIWAN SEMICONDUCTOR MFG4 citations73
US9054161B2Jun 9, 2015

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG3 citations73
US8912041B2Dec 16, 2014

Method for forming recess-free interconnect structure

TAIWAN SEMICONDUCTOR MFG4 citations73
US8749060B2Jun 10, 2014

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG4 citations71
US9330989B2May 3, 2016

System and method for chemical-mechanical planarization of a metal layer

TAIWAN SEMICONDUCTOR MFG2 citations63
US9093501B2Jul 28, 2015

Interconnection wires of semiconductor devices

TAIWAN SEMICONDUCTOR MFG3 citations63
US8778794B1Jul 15, 2014

Interconnection wires of semiconductor devices

TAIWAN SEMICONDUCTOR MFG3 citations63
US9054163B2Jun 9, 2015

Method for via plating with seed layer

TAIWAN SEMICONDUCTOR MFG3 citations62

LU CHIH WEI

1 patent

LEE MING HAN

1 patent

WU HSIEN-CHANG

1 patent

TSAI CHENG-HSIUNG

1 patent

LEE HSIANG-HUAN

1 patent

Showing the top 50 of 66 patents by PatentIndex Score.