P

Inventor

DRYNAN JOHN M

US25 patents
⚠️ This page may combine multiple inventors who share the name “DRYNAN JOHN M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

24 patents
US6617250B2Sep 9, 2003

Methods of depositing a layer comprising tungsten and methods of forming a transistor gate line

MICRON TECHNOLOGY INC38 citations96
US6524912B1Feb 25, 2003

Planarization of metal container structures

MICRON TECHNOLOGY INC58 citations96
US6511879B1Jan 28, 2003

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC33 citations96
US6511896B2Jan 28, 2003

Method of etching a substantially amorphous TA2O5 comprising layer

MICRON TECHNOLOGY INC48 citations96
US7321150B2Jan 22, 2008

Semiconductor device precursor structures to a double-sided capacitor or a contact

MICRON TECHNOLOGY INC39 citations95
US7268039B2Sep 11, 2007

Method of forming a contact using a sacrificial structure

MICRON TECHNOLOGY INC40 citations95
US7273779B2Sep 25, 2007

Method of forming a double-sided capacitor

MICRON TECHNOLOGY INC31 citations92
US6962846B2Nov 8, 2005

Methods of forming a double-sided capacitor or a contact using a sacrificial structure

MICRON TECHNOLOGY INC34 citations92
US6781182B2Aug 24, 2004

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC15 citations92
US6713378B2Mar 30, 2004

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC41 citations92
US6645846B2Nov 11, 2003

Methods of forming conductive contacts to conductive structures

MICRON TECHNOLOGY INC15 citations92
US7573087B2Aug 11, 2009

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC8 citations84
US7061115B2Jun 13, 2006

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC12 citations84
US6969882B2Nov 29, 2005

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC11 citations82
US7888774B2Feb 15, 2011

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC4 citations74
US7053462B2May 30, 2006

Planarization of metal container structures

MICRON TECHNOLOGY INC9 citations74
US7019347B2Mar 28, 2006

Dynamic random access memory circuitry comprising insulative collars

MICRON TECHNOLOGY INC4 citations74
US6861713B2Mar 1, 2005

Integrated circuitry comprising insulative collars and integrated circuitry comprising sidewall spacers over a conductive line projecting outwardly from a first insulative material

MICRON TECHNOLOGY INC4 citations74
US7285814B2Oct 23, 2007

Dynamic random access memory circuitry and integrated circuitry

MICRON TECHNOLOGY INC2 citations63
US6767806B2Jul 27, 2004

Method of forming a patterned substantially crystalline ta2o5 comprising material, and method of forming a capacitor having a capacitor dielectric region comprising substantially crystalline ta2o5 comprising material

MICRON TECHNOLOGY INC3 citations63
US9123786B2Sep 1, 2015

Interconnect line selectively isolated from an underlying contact plug

MICRON TECHNOLOGY INC0 citations52
US7535112B2May 19, 2009

Semiconductor constructions comprising multi-level patterns of radiation-imageable material

MICRON TECHNOLOGY INC0 citations50
US7517786B2Apr 14, 2009

Methods of forming wire bonds for semiconductor constructions

MICRON TECHNOLOGY INC0 citations50
US7262123B2Aug 28, 2007

Methods of forming wire bonds for semiconductor constructions

MICRON TECHNOLOGY INC0 citations50

DRYNAN JOHN M

1 patent