Inventor
HUANG CHENG H
TW15 patents
⚠️ This page may combine multiple inventors who share the name “HUANG CHENG H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
9 patentsUS5393704AFeb 28, 1995
Self-aligned trenched contact (satc) process
UNITED MICROELECTRONICS CORP103 citations96
US5554566ASep 10, 1996
Method to eliminate polycide peeling
UNITED MICROELECTRONICS CORP36 citations92
US5371036ADec 6, 1994
Locos technology with narrow silicon trench
UNITED MICROELECTRONICS CORP25 citations92
US5308787AMay 3, 1994
Uniform field oxidation for locos isolation
UNITED MICROELECTRONICS CORP23 citations92
US5130266AJul 14, 1992
Polycide gate MOSFET process for integrated circuits
UNITED MICROELECTRONICS CORP29 citations92
US5457065AOct 10, 1995
method of manufacturing a new DRAM capacitor structure having increased capacitance
UNITED MICROELECTRONICS CORP18 citations74
US5449644ASep 12, 1995
Process for contact hole formation using a sacrificial SOG layer
UNITED MICROELECTRONICS CORP12 citations74
US5384268AJan 24, 1995
Charge damage free implantation by introduction of a thin conductive layer
UNITED MICROELECTRONICS CORP8 citations74
US5374586ADec 20, 1994
Multi-LOCOS (local oxidation of silicon) isolation process
UNITED MICROELECTRONICS CORP12 citations74
ALTERA CORP
5 patentsUS7157782B1Jan 2, 2007
Electrically-programmable transistor antifuses
ALTERA CORP94 citations97
US6897543B1May 24, 2005
Electrically-programmable integrated circuit antifuses
ALTERA CORP119 citations97
US7272067B1Sep 18, 2007
Electrically-programmable integrated circuit antifuses
ALTERA CORP55 citations94
US7772591B1Aug 10, 2010
Electrically-programmable transistor antifuses
ALTERA CORP41 citations92
US6785109B1Aug 31, 2004
Technique for protecting integrated circuit devices against electrostatic discharge damage
ALTERA CORP10 citations74