Inventor
SOMA MANI
US37 patents
⚠️ This page may combine multiple inventors who share the name “SOMA MANI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
33 patentsUS6795496B1Sep 21, 2004
Jitter measuring device and method
ADVANTEST CORP117 citations98
US6621860B1Sep 16, 2003
Apparatus for and method of measuring a jitter
ADVANTEST CORP44 citations96
US7305025B2Dec 4, 2007
Measurement instrument and measurement method
ADVANTEST CORP22 citations93
US7203229B1Apr 10, 2007
Apparatus for and method of measuring jitter
ADVANTEST CORP23 citations93
US7127018B2Oct 24, 2006
Apparatus for and method of measuring clock skew
ADVANTEST CORP17 citations93
US6922439B2Jul 26, 2005
Apparatus for and method of measuring jitter
ADVANTEST CORP42 citations93
US6775321B1Aug 10, 2004
Apparatus for and method of measuring a jitter
ADVANTEST CORP25 citations93
US6687629B1Feb 3, 2004
Apparatus for and method of measuring a jitter
ADVANTEST CORP38 citations93
US6598004B1Jul 22, 2003
Jitter measurement apparatus and its method
ADVANTEST CORP51 citations93
US6594595B2Jul 15, 2003
Apparatus for and method of measuring cross-correlation coefficient between signals
ADVANTEST CORP19 citations93
US6525523B1Feb 25, 2003
Jitter measurement apparatus and its method
ADVANTEST CORP26 citations93
US6460001B1Oct 1, 2002
Apparatus for and method of measuring a peak jitter
ADVANTEST CORP32 citations93
US6423558B1Jul 23, 2002
Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures
ADVANTEST CORP46 citations93
US6400129B1Jun 4, 2002
Apparatus for and method of detecting a delay fault in a phase-locked loop circuit
ADVANTEST CORP28 citations93
US7636387B2Dec 22, 2009
Measuring apparatus and measuring method
ADVANTEST CORP22 citations92
US7253443B2Aug 7, 2007
Electronic device with integrally formed light emitting device and supporting member
ADVANTEST CORP30 citations92
US7054358B2May 30, 2006
Measuring apparatus and measuring method
ADVANTEST CORP24 citations92
US7596173B2Sep 29, 2009
Test apparatus, clock generator and electronic device
ADVANTEST CORP8 citations84
US7496137B2Feb 24, 2009
Apparatus for measuring jitter and method of measuring jitter
ADVANTEST CORP12 citations84
US7397847B2Jul 8, 2008
Testing device for testing electronic device and testing method thereof
ADVANTEST CORP13 citations84
US7317309B2Jan 8, 2008
Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus
ADVANTEST CORP17 citations84
US7313496B2Dec 25, 2007
Test apparatus and test method for testing a device under test
ADVANTEST CORP13 citations84
US6735538B1May 11, 2004
Apparatus and method for measuring quality measure of phase noise waveform
ADVANTEST CORP15 citations84
US7193728B2Mar 20, 2007
Processing apparatus, processing method and position detecting device
ADVANTEST CORP13 citations83
US7564897B2Jul 21, 2009
Jitter measuring apparatus, jitter measuring method and PLL circuit
ADVANTEST CORP7 citations74
US7263150B2Aug 28, 2007
Probability estimating apparatus and method for peak-to-peak clock skews
ADVANTEST CORP9 citations74
US7136773B2Nov 14, 2006
Testing apparatus and testing method
ADVANTEST CORP8 citations74
US6737852B2May 18, 2004
Clock skew measuring apparatus and method
ADVANTEST CORP8 citations74
US6291979B1Sep 18, 2001
Apparatus for and method of detecting a delay fault
ADVANTEST CORP14 citations74
US7957458B2Jun 7, 2011
Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
ADVANTEST CORP3 citations63
US7356109B2Apr 8, 2008
Apparatus for and method of measuring clock skew
ADVANTEST CORP2 citations63
US7778785B2Aug 17, 2010
Signal-to-noise ratio measurement for discrete waveform
ADVANTEST CORP1 citations52
US7460592B2Dec 2, 2008
Apparatus for measuring jitter and method of measuring jitter
ADVANTEST CORP1 citations52
UNIV WASHINGTON
3 patentsUS5980246ANov 9, 1999
Orthodontics headgear compliance monitor
UNIV WASHINGTON156 citations93
US6885700B1Apr 26, 2005
Charge-based frequency measurement bist
UNIV WASHINGTON25 citations92
US7340381B2Mar 4, 2008
Characterization of radio frequency (RF) signals using wavelet-based parameter extraction
UNIV WASHINGTON7 citations68