Inventor
CAMPBELL JULIE A
US53 patents
⚠️ This page may combine multiple inventors who share the name “CAMPBELL JULIE A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LECROY CORP
25 patentsUS7019544B1Mar 28, 2006
Transmission line input structure test probe
LECROY CORP126 citations97
US7262614B1Aug 28, 2007
Planar on edge probing tip with flex
LECROY CORP29 citations93
US7221179B1May 22, 2007
Bendable conductive connector
LECROY CORP17 citations93
US6809535B2Oct 26, 2004
Notched electrical test probe tip
LECROY CORP27 citations93
US6462529B1Oct 8, 2002
Legs for trimming a tripod with an electrical test probe tip
LECROY CORP20 citations93
US6956362B1Oct 18, 2005
Modular active test probe and removable tip module therefor
LECROY CORP16 citations92
US6863576B2Mar 8, 2005
Electrical test probe flexible spring tip
LECROY CORP24 citations92
US6650131B2Nov 18, 2003
Electrical test probe wedge tip
LECROY CORP18 citations89
US7671613B1Mar 2, 2010
Probing blade conductive connector for use with an electrical test probe
LECROY CORP9 citations84
US7140105B2Nov 28, 2006
Method of fabricating a notched electrical test probe tip
LECROY CORP11 citations84
US7009377B2Mar 7, 2006
Cartridge system for a probing head for an electrical test probe
LECROY CORP13 citations82
US7492177B1Feb 17, 2009
Bendable conductive connector
LECROY CORP7 citations74
USD444720SJul 10, 2001
Notched electrical test probe tip
LECROY CORP11 citations74
USD444401SJul 3, 2001
Electrical test probe wedge tip
LECROY CORP12 citations74
US7432698B1Oct 7, 2008
Modular active test probe and removable tip module therefor
LECROY CORP6 citations73
US7321234B2Jan 22, 2008
Resistive test probe tips and applications therefor
LECROY CORP7 citations73
US7295020B2Nov 13, 2007
Cap at resistors of electrical test probe
LECROY CORP5 citations73
US7202678B2Apr 10, 2007
Resistive probe tips
LECROY CORP9 citations73
US7173439B1Feb 6, 2007
Guide for tip to transmission path contact
LECROY CORP8 citations73
US6828769B2Dec 7, 2004
Cartridge system for a probing head for an electrical test probe
LECROY CORP6 citations72
US6605934B1Aug 12, 2003
Cartridge system for a probing head for an electrical test probe
LECROY CORP12 citations72
US6518780B1Feb 11, 2003
Electrical test probe wedge tip
LECROY CORP11 citations70
USD444721SJul 10, 2001
Electrical test probe probing head
LECROY CORP4 citations63
US7525328B2Apr 28, 2009
Cap at resistors of electrical test probe
LECROY CORP2 citations62
US7317312B1Jan 8, 2008
Guide for tip to transmission path contact
LECROY CORP5 citations62
TEKTRONIX INC
18 patentsUS5136237AAug 4, 1992
Double insulated floating high voltage test probe
TEKTRONIX INC122 citations95
US9810715B2Nov 7, 2017
High impedance compliant probe tip
TEKTRONIX INC9 citations82
US10241133B2Mar 26, 2019
Probe tip and probe assembly
TEKTRONIX INC8 citations80
US10859598B1Dec 8, 2020
Back-drilled via attachment technique using a UV-cure conductive adhesive
TEKTRONIX INC6 citations73
US10168356B2Jan 1, 2019
Test and measurement probe with adjustable test point contact
TEKTRONIX INC4 citations73
US6222378B1Apr 24, 2001
Probe adapter for a ball-grid-array package
TEKTRONIX INC13 citations72
US10215776B2Feb 26, 2019
Position sensing in a probe to modify transfer characteristics in a system
TEKTRONIX INC3 citations70
US12055578B2Aug 6, 2024
Securing a probe to a device under test
TEKTRONIX INC0 citations63
US12493053B2Dec 9, 2025
Precision, high bandwidth, switching attenuator
TEKTRONIX INC0 citations62
US11808786B2Nov 7, 2023
Precision, high bandwidth, switching attenuator
TEKTRONIX INC0 citations62
US12571816B2Mar 10, 2026
High-impedance differential flexible probe tip
TEKTRONIX INC0 citations61
US11578925B2Feb 14, 2023
Thermal management system for a test-and-measurement probe
TEKTRONIX INC1 citations60
US12332277B1Jun 17, 2025
Thermal management system for a test-and-measurement probe
TEKTRONIX INC0 citations59
US10962566B1Mar 30, 2021
Position sensing in a probe to modify transfer characteristics in a system
TEKTRONIX INC0 citations59
US11385258B2Jul 12, 2022
Encapsulated component attachment technique using a UV-cure conductive adhesive
TEKTRONIX INC0 citations56
US11079408B2Aug 3, 2021
Resistive test-probe tips
TEKTRONIX INC0 citations52
US10845384B2Nov 24, 2020
Surface-mountable apparatus for coupling a test and measurement instrument to a device under test
TEKTRONIX INC0 citations52
USD786108SMay 9, 2017
Browser probe assembly
TEKTRONIX INC1 citations52
CAMPBELL JULIE A
4 patentsUS9140724B1Sep 22, 2015
Compensating resistance probing tip optimized adapters for use with specific electrical test probes
CAMPBELL JULIE A7 citations83
US8098078B1Jan 17, 2012
Probing blade with conductive connector for use with an electrical test probe
CAMPBELL JULIE A11 citations83
US8134377B1Mar 13, 2012
Adherable holder and locater tool
CAMPBELL JULIE A6 citations79
US8421488B1Apr 16, 2013
Adherable holder and locater tool
CAMPBELL JULIE A4 citations57
TELEDYNE LECROY INC
2 patentsLE CROY CORP
1 patentShowing the top 50 of 53 patents by PatentIndex Score.