P

Inventor

CAMPBELL JULIE A

US53 patents
⚠️ This page may combine multiple inventors who share the name “CAMPBELL JULIE A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LECROY CORP

25 patents
US7019544B1Mar 28, 2006

Transmission line input structure test probe

LECROY CORP126 citations97
US7262614B1Aug 28, 2007

Planar on edge probing tip with flex

LECROY CORP29 citations93
US7221179B1May 22, 2007

Bendable conductive connector

LECROY CORP17 citations93
US6809535B2Oct 26, 2004

Notched electrical test probe tip

LECROY CORP27 citations93
US6462529B1Oct 8, 2002

Legs for trimming a tripod with an electrical test probe tip

LECROY CORP20 citations93
US6956362B1Oct 18, 2005

Modular active test probe and removable tip module therefor

LECROY CORP16 citations92
US6863576B2Mar 8, 2005

Electrical test probe flexible spring tip

LECROY CORP24 citations92
US6650131B2Nov 18, 2003

Electrical test probe wedge tip

LECROY CORP18 citations89
US7671613B1Mar 2, 2010

Probing blade conductive connector for use with an electrical test probe

LECROY CORP9 citations84
US7140105B2Nov 28, 2006

Method of fabricating a notched electrical test probe tip

LECROY CORP11 citations84
US7009377B2Mar 7, 2006

Cartridge system for a probing head for an electrical test probe

LECROY CORP13 citations82
US7492177B1Feb 17, 2009

Bendable conductive connector

LECROY CORP7 citations74
USD444720SJul 10, 2001

Notched electrical test probe tip

LECROY CORP11 citations74
USD444401SJul 3, 2001

Electrical test probe wedge tip

LECROY CORP12 citations74
US7432698B1Oct 7, 2008

Modular active test probe and removable tip module therefor

LECROY CORP6 citations73
US7321234B2Jan 22, 2008

Resistive test probe tips and applications therefor

LECROY CORP7 citations73
US7295020B2Nov 13, 2007

Cap at resistors of electrical test probe

LECROY CORP5 citations73
US7202678B2Apr 10, 2007

Resistive probe tips

LECROY CORP9 citations73
US7173439B1Feb 6, 2007

Guide for tip to transmission path contact

LECROY CORP8 citations73
US6828769B2Dec 7, 2004

Cartridge system for a probing head for an electrical test probe

LECROY CORP6 citations72
US6605934B1Aug 12, 2003

Cartridge system for a probing head for an electrical test probe

LECROY CORP12 citations72
US6518780B1Feb 11, 2003

Electrical test probe wedge tip

LECROY CORP11 citations70
USD444721SJul 10, 2001

Electrical test probe probing head

LECROY CORP4 citations63
US7525328B2Apr 28, 2009

Cap at resistors of electrical test probe

LECROY CORP2 citations62
US7317312B1Jan 8, 2008

Guide for tip to transmission path contact

LECROY CORP5 citations62

TEKTRONIX INC

18 patents
US5136237AAug 4, 1992

Double insulated floating high voltage test probe

TEKTRONIX INC122 citations95
US9810715B2Nov 7, 2017

High impedance compliant probe tip

TEKTRONIX INC9 citations82
US10241133B2Mar 26, 2019

Probe tip and probe assembly

TEKTRONIX INC8 citations80
US10859598B1Dec 8, 2020

Back-drilled via attachment technique using a UV-cure conductive adhesive

TEKTRONIX INC6 citations73
US10168356B2Jan 1, 2019

Test and measurement probe with adjustable test point contact

TEKTRONIX INC4 citations73
US6222378B1Apr 24, 2001

Probe adapter for a ball-grid-array package

TEKTRONIX INC13 citations72
US10215776B2Feb 26, 2019

Position sensing in a probe to modify transfer characteristics in a system

TEKTRONIX INC3 citations70
US12055578B2Aug 6, 2024

Securing a probe to a device under test

TEKTRONIX INC0 citations63
US12493053B2Dec 9, 2025

Precision, high bandwidth, switching attenuator

TEKTRONIX INC0 citations62
US11808786B2Nov 7, 2023

Precision, high bandwidth, switching attenuator

TEKTRONIX INC0 citations62
US12571816B2Mar 10, 2026

High-impedance differential flexible probe tip

TEKTRONIX INC0 citations61
US11578925B2Feb 14, 2023

Thermal management system for a test-and-measurement probe

TEKTRONIX INC1 citations60
US12332277B1Jun 17, 2025

Thermal management system for a test-and-measurement probe

TEKTRONIX INC0 citations59
US10962566B1Mar 30, 2021

Position sensing in a probe to modify transfer characteristics in a system

TEKTRONIX INC0 citations59
US11385258B2Jul 12, 2022

Encapsulated component attachment technique using a UV-cure conductive adhesive

TEKTRONIX INC0 citations56
US11079408B2Aug 3, 2021

Resistive test-probe tips

TEKTRONIX INC0 citations52
US10845384B2Nov 24, 2020

Surface-mountable apparatus for coupling a test and measurement instrument to a device under test

TEKTRONIX INC0 citations52
USD786108SMay 9, 2017

Browser probe assembly

TEKTRONIX INC1 citations52

CAMPBELL JULIE A

4 patents

TELEDYNE LECROY INC

2 patents

LE CROY CORP

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.