USD444401SExpiredUtility

Electrical test probe wedge tip

62
Assignee: LECROY CORPPriority: Jul 31, 2000Filed: Jul 31, 2000Granted: Jul 3, 2001
Est. expiryJul 31, 2020(expired)· nominal 20-yr term from priority
Inventors:Julie A. Campbell
62
PatentIndex Score
12
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an electrical test probe wedge tip, as shown and described.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.