Inventor · disambiguated record
Julie A. Campbell
Also filed as: CAMPBELL JULIE · CAMPBELL JULIE A
55 granted patents·7 pending applications·662 citations·filing 1991–2024
98Inventor score
Top patents by PatentIndex Score
62 records- 0198US7019544B1Transmission line input structure test probeLECROY CORP·Filed 2004·Granted Mar 28, 2006·126 cites·44 claims
- 0294US7262614B1Planar on edge probing tip with flexLECROY CORP·Filed 2006·Granted Aug 28, 2007·29 cites·18 claims
- 0392US8098078B1Probing blade with conductive connector for use with an electrical test probeCAMPBELL JULIE A·Filed 2010·Granted Jan 17, 2012·11 cites·21 claims
- 0491US5136237ADouble insulated floating high voltage test probeTEKTRONIX INC·Filed 1991·Granted Aug 4, 1992·122 cites·21 claims
- 0590US10859598B1Back-drilled via attachment technique using a UV-cure conductive adhesiveTEKTRONIX INC·Filed 2019·Granted Dec 8, 2020·6 cites·20 claims
- 0690US10168356B2Test and measurement probe with adjustable test point contactTEKTRONIX INC·Filed 2015·Granted Jan 1, 2019·4 cites·13 claims
- 0789US9404940B1Compensating probing tip optimized adapters for use with specific electrical test probesTELEDYNE LECROY INC·Filed 2013·Granted Aug 2, 2016·16 cites·11 claims
- 0888US10241133B2Probe tip and probe assemblyTEKTRONIX INC·Filed 2017·Granted Mar 26, 2019·8 cites·16 claims
- 0988US9810715B2High impedance compliant probe tipTEKTRONIX INC·Filed 2014·Granted Nov 7, 2017·9 cites·17 claims
- 1087US9140724B1Compensating resistance probing tip optimized adapters for use with specific electrical test probesCAMPBELL JULIE A·Filed 2011·Granted Sep 22, 2015·7 cites·13 claims
- 1187US6809535B2Notched electrical test probe tipLECROY CORP·Filed 2003·Granted Oct 26, 2004·27 cites·12 claims
- 1284US10215776B2Position sensing in a probe to modify transfer characteristics in a systemTEKTRONIX INC·Filed 2015·Granted Feb 26, 2019·3 cites·7 claims
- 1383US12493053B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2023·Granted Dec 9, 2025·0 cites·20 claims
- 1482US7671613B1Probing blade conductive connector for use with an electrical test probeLECROY CORP·Filed 2007·Granted Mar 2, 2010·9 cites·25 claims
- 1581US8421488B1Adherable holder and locater toolCAMPBELL JULIE A·Filed 2011·Granted Apr 16, 2013·4 cites·20 claims
- 1680US6538424B1Notched electrical test probe tipLE CROY CORP·Filed 2000·Granted Mar 25, 2003·20 cites·7 claims
- 1779US11578925B2Thermal management system for a test-and-measurement probeTEKTRONIX INC·Filed 2020·Granted Feb 14, 2023·1 cites·19 claims
- 1879US7492177B1Bendable conductive connectorLECROY CORP·Filed 2007·Granted Feb 17, 2009·7 cites·15 claims
- 1979US7221179B1Bendable conductive connectorLECROY CORP·Filed 2004·Granted May 22, 2007·17 cites·25 claims
- 2079US2024069094A1Test and measurement instrument accessory with reconfigurable processing componentTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 2178US7378832B2Probing high-frequency signalsLECROY CORP·Filed 2006·Granted May 27, 2008·10 cites·24 claims
- 2277US6863576B2Electrical test probe flexible spring tipLECROY CORP·Filed 2001·Granted Mar 8, 2005·24 cites·37 claims
- 2377US6462529B1Legs for trimming a tripod with an electrical test probe tipLECROY CORP·Filed 2000·Granted Oct 8, 2002·20 cites·13 claims
- 2476US10507545B2Laser ablation machine for labeling cryogenically-frozen vialsMERIAL INC·Filed 2017·Granted Dec 17, 2019·2 cites·19 claims
- 2576US8786299B1Adherable holder and locater toolTELEDYNE LECROY INC·Filed 2013·Granted Jul 22, 2014·2 cites·22 claims
- 2676US6956362B1Modular active test probe and removable tip module thereforLECROY CORP·Filed 2002·Granted Oct 18, 2005·16 cites·26 claims
- 2776US6650131B2Electrical test probe wedge tipLECROY CORP·Filed 2003·Granted Nov 18, 2003·18 cites·9 claims
- 2875US7321234B2Resistive test probe tips and applications thereforLECROY CORP·Filed 2007·Granted Jan 22, 2008·7 cites·18 claims
- 2974US11808786B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2022·Granted Nov 7, 2023·0 cites·23 claims
- 3073US8134377B1Adherable holder and locater toolCAMPBELL JULIE A·Filed 2008·Granted Mar 13, 2012·6 cites·5 claims
- 3173US7432698B1Modular active test probe and removable tip module thereforLECROY CORP·Filed 2005·Granted Oct 7, 2008·6 cites·8 claims
- 3272US11815548B2Test and measurement instrument accessory with reconfigurable processing componentTEKTRONIX INC·Filed 2021·Granted Nov 14, 2023·0 cites·16 claims
- 3371US7140105B2Method of fabricating a notched electrical test probe tipLECROY CORP·Filed 2004·Granted Nov 28, 2006·11 cites·20 claims
- 3470US12332277B1Thermal management system for a test-and-measurement probeTEKTRONIX INC·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 3570US6605934B1Cartridge system for a probing head for an electrical test probeLECROY CORP·Filed 2000·Granted Aug 12, 2003·12 cites·18 claims
- 3668US12055578B2Securing a probe to a device under testTEKTRONIX INC·Filed 2021·Granted Aug 6, 2024·0 cites·25 claims
- 3768US10071582B2Apparatus and methods for labeling vials or ampoules stored at temperatures as low as -200° CMERIAL INC·Filed 2015·Granted Sep 11, 2018·2 cites·30 claims
- 3868US7009377B2Cartridge system for a probing head for an electrical test probeLECROY CORP·Filed 2004·Granted Mar 7, 2006·13 cites·19 claims
- 3965US6518780B1Electrical test probe wedge tipLECROY CORP·Filed 2000·Granted Feb 11, 2003·11 cites·9 claims
- 4063US10962566B1Position sensing in a probe to modify transfer characteristics in a systemTEKTRONIX INC·Filed 2019·Granted Mar 30, 2021·0 cites·8 claims
- 4162USD444401SElectrical test probe wedge tipLECROY CORP·Filed 2000·Granted Jul 3, 2001·12 cites·1 claims
- 4261US7202678B2Resistive probe tipsLECROY CORP·Filed 2004·Granted Apr 10, 2007·9 cites·29 claims
- 4360US7173439B1Guide for tip to transmission path contactLECROY CORP·Filed 2004·Granted Feb 6, 2007·8 cites·23 claims
- 4460USD444720SNotched electrical test probe tipLECROY CORP·Filed 2000·Granted Jul 10, 2001·11 cites·1 claims
- 4559US10845384B2Surface-mountable apparatus for coupling a test and measurement instrument to a device under testTEKTRONIX INC·Filed 2019·Granted Nov 24, 2020·0 cites·19 claims
- 4659US7525328B2Cap at resistors of electrical test probeLECROY CORP·Filed 2007·Granted Apr 28, 2009·2 cites·22 claims
- 4758US2020095480A1Uv curable conductive adhesiveTEKTRONIX INC·Filed 2019·Application pending·0 cites
- 4858US2024310413A1Current shunt using wire bundle constructionTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4957US11385258B2Encapsulated component attachment technique using a UV-cure conductive adhesiveTEKTRONIX INC·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 5057US6828769B2Cartridge system for a probing head for an electrical test probeLECROY CORP·Filed 2003·Granted Dec 7, 2004·6 cites·19 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →