Inventor

MIKI KAZUNOBU

JP12 patents

⚠️ This page may combine multiple inventors who share the name “MIKI KAZUNOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

5 patents

US6633176B2Oct 14, 2003

Semiconductor device test probe having improved tip portion and manufacturing method thereof

MITSUBISHI ELECTRIC CORP47 citations95

US7274195B2Sep 25, 2007

Semiconductor device test probe

MITSUBISHI ELECTRIC CORP26 citations92

US6339257B1Jan 15, 2002

Semiconductor device

MITSUBISHI ELECTRIC CORP38 citations92

US6888344B2May 3, 2005

Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter

MITSUBISHI ELECTRIC CORP24 citations91

US7276923B2Oct 2, 2007

Semiconductor device test probe

MITSUBISHI ELECTRIC CORP12 citations83

RENESAS TECH CORP

3 patents

US6710615B2Mar 23, 2004

Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus

RENESAS TECH CORP13 citations83

US7701063B2Apr 20, 2010

Semiconductor device

RENESAS TECH CORP5 citations62

US7696081B2Apr 13, 2010

Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns

RENESAS TECH CORP0 citations50

MITSUBISHI DENKI KABSUHIKI KAI

1 patent

US6646455B2Nov 11, 2003

Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter

MITSUBISHI DENKI KABSUHIKI KAI52 citations94

KASAOKA TATSUO

1 patent

US8084279B2Dec 27, 2011

Method of manufacturing semiconductor device that uses both a normal photomask and a phase shift mask for defining interconnect patterns

KASAOKA TATSUO8 citations78

KANZAKI TERUAKI

1 patent

US8178981B2May 15, 2012

Semiconductor device

KANZAKI TERUAKI5 citations59

RENESAS ELECTRONICS CORP

1 patent

US7956473B2Jun 7, 2011

Semiconductor device

RENESAS ELECTRONICS CORP5 citations55