Inventor
TSAI TSUNG CHE
TW42 patents
⚠️ This page may combine multiple inventors who share the name “TSAI TSUNG CHE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
8 patentsUS9214540B2Dec 15, 2015
N-type metal oxide semiconductor (NMOS) transistor for electrostatic discharge (ESD)
TAIWAN SEMICONDUCTOR MFG19 citations92
US9209302B2Dec 8, 2015
Method of reducing the heights of source-drain sidewall spacers of FinFETs through etching
TAIWAN SEMICONDUCTOR MFG5 citations84
US8809961B2Aug 19, 2014
Electrostatic discharge (ESD) guard ring protective structure
TAIWAN SEMICONDUCTOR MFG7 citations84
US9368629B2Jun 14, 2016
Diode structure compatible with FinFET process
TAIWAN SEMICONDUCTOR MFG2 citations63
US9093492B2Jul 28, 2015
Diode structure compatible with FinFET process
TAIWAN SEMICONDUCTOR MFG2 citations63
US9236733B2Jan 12, 2016
Electrostatic discharge protection
TAIWAN SEMICONDUCTOR MFG0 citations52
US8906767B2Dec 9, 2014
Semiconductor device with self-aligned interconnects
TAIWAN SEMICONDUCTOR MFG0 citations52
US9209265B2Dec 8, 2015
ESD devices comprising semiconductor fins
TAIWAN SEMICONDUCTOR MFG0 citations42
GLOBALFOUNDRIES SG PTE LTD
8 patentsUS10032761B1Jul 24, 2018
Electronic devices with tunable electrostatic discharge protection and methods for producing the same
GLOBALFOUNDRIES SG PTE LTD9 citations80
US10381826B2Aug 13, 2019
Integrated circuit electrostatic discharge protection
GLOBALFOUNDRIES SG PTE LTD5 citations73
US9741849B1Aug 22, 2017
Integrated circuits resistant to electrostatic discharge and methods for producing the same
GLOBALFOUNDRIES SG PTE LTD3 citations72
US10340266B2Jul 2, 2019
ESD protection circuit and method of making the same
GLOBALFOUNDRIES SG PTE LTD2 citations71
US10037988B1Jul 31, 2018
High voltage PNP using isolation for ESD and method for producing the same
GLOBALFOUNDRIES SG PTE LTD5 citations71
US10032765B1Jul 24, 2018
Integrated circuits with electrostatic discharge protection and methods for producing the same
GLOBALFOUNDRIES SG PTE LTD1 citations50
US9922969B1Mar 20, 2018
Integrated circuits having transistors with high holding voltage and methods of producing the same
GLOBALFOUNDRIES SG PTE LTD1 citations50
US10170459B1Jan 1, 2019
Methods for an ESD protection circuit including a floating ESD node
GLOBALFOUNDRIES SG PTE LTD0 citations44
GLOBALFOUNDRIES US INC
8 patentsUS12068308B2Aug 20, 2024
Integrated circuit structure with avalanche junction to doped semiconductor over semiconductor well
GLOBALFOUNDRIES US INC0 citations62
US11791626B2Oct 17, 2023
Electrostatic discharge clamp structures
GLOBALFOUNDRIES US INC0 citations62
US11769767B2Sep 26, 2023
Diode triggered silicon controlled rectifier
GLOBALFOUNDRIES US INC0 citations62
US11444076B2Sep 13, 2022
Integrated circuit structure with avalanche junction to doped semiconductor over semiconductor well
GLOBALFOUNDRIES US INC0 citations62
US11335674B2May 17, 2022
Diode triggered silicon controlled rectifier (SCR) with hybrid diodes
GLOBALFOUNDRIES US INC1 citations62
US11289471B2Mar 29, 2022
Electrostatic discharge device
GLOBALFOUNDRIES US INC0 citations62
US11201466B2Dec 14, 2021
Electrostatic discharge clamp structures
GLOBALFOUNDRIES US INC0 citations62
US11171132B2Nov 9, 2021
Bi-directional breakdown silicon controlled rectifiers
GLOBALFOUNDRIES US INC0 citations62
TAIWAN SEMICONDUCTOR MFG CO LTD
7 patentsUS10134726B2Nov 20, 2018
Diode string implementation for electrostatic discharge protection
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9887275B2Feb 6, 2018
Method of reducing the heights of source-drain sidewall spacers of FinFETs through etching
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9576945B2Feb 21, 2017
Methods and apparatus for increased holding voltage in silicon controlled rectifiers for ESD protection
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9548367B2Jan 17, 2017
Method of reducing the heights of source-drain sidewall spacers of FinFETs through etching and the FinFETs thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9929143B2Mar 27, 2018
N-type metal oxide semiconductor (NMOS) transistor for electrostatic discharge (ESD)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9601627B2Mar 21, 2017
Diode structure compatible with FinFET process
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9484338B2Nov 1, 2016
Diode string implementation for electrostatic discharge protection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
GLOBALFOUNDRIES INC
5 patentsUS10096587B1Oct 9, 2018
Fin-based diode structures with a realigned feature layout
GLOBALFOUNDRIES INC7 citations83
US10361293B1Jul 23, 2019
Vertical fin-type devices and methods
GLOBALFOUNDRIES INC2 citations73
US10290626B1May 14, 2019
High voltage electrostatic discharge (ESD) bipolar integrated in a vertical field-effect transistor (VFET) technology and method for producing the same
GLOBALFOUNDRIES INC5 citations71
US10692852B2Jun 23, 2020
Silicon-controlled rectifiers with wells laterally isolated by trench isolation regions
GLOBALFOUNDRIES INC0 citations41
US10541236B2Jan 21, 2020
Electrostatic discharge devices with reduced capacitance
GLOBALFOUNDRIES INC0 citations41
MICRON TECHNOLOGY INC
3 patentsUS11810822B2Nov 7, 2023
Apparatuses and methods including patterns in scribe regions of semiconductor devices
MICRON TECHNOLOGY INC0 citations62
US12154879B2Nov 26, 2024
Bump coplanarity for semiconductor device assembly and methods of manufacturing the same
MICRON TECHNOLOGY INC0 citations54
US11742309B2Aug 29, 2023
Bump coplanarity for semiconductor device assembly and methods of manufacturing the same
MICRON TECHNOLOGY INC0 citations54