Inventor
CHANG HUICHENG
TW216 patents
⚠️ This page may combine multiple inventors who share the name “CHANG HUICHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
43 patentsUS10347762B1Jul 9, 2019
Field effect transistor contact with reduced contact resistance using implantation process
TAIWAN SEMICONDUCTOR MFG CO LTD20 citations94
US9607838B1Mar 28, 2017
Enhanced channel strain to reduce contact resistance in NMOS FET devices
TAIWAN SEMICONDUCTOR MFG CO LTD25 citations94
US11456383B2Sep 27, 2022
Semiconductor device having a contact plug with an air gap spacer
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations86
US11508831B2Nov 22, 2022
Gate spacer structure and method of forming same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10868142B2Dec 15, 2020
Gate spacer structure and method of forming same
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10658510B2May 19, 2020
Source/drain structure
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10515966B2Dec 24, 2019
Enhanced channel strain to reduce contact resistance in NMOS FET devices
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10157995B2Dec 18, 2018
Integrating junction formation of transistors with contact formation
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10115808B2Oct 30, 2018
finFET device and methods of forming
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10056383B2Aug 21, 2018
Enhanced channel strain to reduce contact resistance in NMOS FET devices
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9812451B2Nov 7, 2017
Field effect transistor contact with reduced contact resistance
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11289417B2Mar 29, 2022
Semiconductor device and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US10504735B2Dec 10, 2019
Method of forming a semiconductor device by high-pressure anneal and post-anneal treatment
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US10763168B2Sep 1, 2020
Semiconductor structure with doped via plug and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations82
US11978677B2May 7, 2024
Wafer positioning method and apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations75
US11908708B2Feb 20, 2024
Laser de-bonding carriers and composite carriers thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations74
US11901235B2Feb 13, 2024
Ion implantation for nano-FET
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11848361B2Dec 19, 2023
Sacrificial layer for semiconductor process
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11699621B2Jul 11, 2023
Method for patterning a lanthanum containing layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11670683B2Jun 6, 2023
Semiconductor device with implant and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11605555B2Mar 14, 2023
Trench filling through reflowing filling material
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11594618B2Feb 28, 2023
FinFET devices and methods of forming
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11450757B2Sep 20, 2022
FinFET device and methods of forming
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11348835B2May 31, 2022
Ion implantation for nano-FET
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11257952B2Feb 22, 2022
Source/drain structure
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11257911B2Feb 22, 2022
Sacrificial layer for semiconductor process
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11227918B2Jan 18, 2022
Melt anneal source and drain regions
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10916546B2Feb 9, 2021
Enhanced channel strain to reduce contact resistance in NMOS FET devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10867869B2Dec 15, 2020
Method for patterning a lanthanum containing layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10868178B2Dec 15, 2020
Field effect transistor contact with reduced contact resistance using implantation process
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10770570B2Sep 8, 2020
FinFET device and methods of forming
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10727226B2Jul 28, 2020
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10515963B2Dec 24, 2019
Field effect transistor contact with reduced contact resistance
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10504795B2Dec 10, 2019
Method for patterning a lanthanum containing layer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10347720B2Jul 9, 2019
Doping for semiconductor device with conductive feature
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10269799B2Apr 23, 2019
Field effect transistor contact with reduced contact resistance
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9537010B2Jan 3, 2017
Semiconductor device structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11855040B2Dec 26, 2023
Ion implantation with annealing for substrate cutting
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11776814B2Oct 3, 2023
Method of forming semiconductor device by driving hydrogen into a dielectric layer from another dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11211289B2Dec 28, 2021
Metal loss prevention using implantation
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11145751B2Oct 12, 2021
Semiconductor structure with doped contact plug and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations72
US10950447B2Mar 16, 2021
Semiconductor device having hydrogen in a dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10714348B2Jul 14, 2020
Semiconductor device having hydrogen in a dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
TAIWAN SEMICONDUCTOR MFG
6 patentsUS8497177B1Jul 30, 2013
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG252 citations99
US8822290B2Sep 2, 2014
FinFETs and methods for forming the same
TAIWAN SEMICONDUCTOR MFG12 citations84
US9287170B2Mar 15, 2016
Contact structure and formation thereof
TAIWAN SEMICONDUCTOR MFG8 citations83
US9048087B2Jun 2, 2015
Methods for wet clean of oxide layers over epitaxial layers
TAIWAN SEMICONDUCTOR MFG8 citations83
US8927362B2Jan 6, 2015
CMOS device and method of forming the same
TAIWAN SEMICONDUCTOR MFG9 citations83
US9029246B2May 12, 2015
Methods of forming epitaxial structures
TAIWAN SEMICONDUCTOR MFG4 citations73
CHING KUO-CHENG
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