Inventor
OHTAKI TOMOHISA
JP22 patents
⚠️ This page may combine multiple inventors who share the name “OHTAKI TOMOHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
17 patentsUSD633537SMar 1, 2011
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD633538SMar 1, 2011
Electron microscope
HITACHI HIGH TECH CORP18 citations92
USD632323SFeb 8, 2011
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD626579SNov 2, 2010
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD625749SOct 19, 2010
Electron microscope
HITACHI HIGH TECH CORP18 citations92
USD623211SSep 7, 2010
Electron microscope
HITACHI HIGH TECH CORP18 citations92
US8921786B2Dec 30, 2014
Charged particle beam apparatus
HITACHI HIGH TECH CORP3 citations62
USD635167SMar 29, 2011
Portion of an electron microscope
HITACHI HIGH TECH CORP5 citations62
USD635168SMar 29, 2011
Portion of an electron microscope
HITACHI HIGH TECH CORP5 citations62
US11709199B2Jul 25, 2023
Evaluation apparatus for semiconductor device
HITACHI HIGH TECH CORP0 citations60
US11391756B2Jul 19, 2022
Probe module and probe
HITACHI HIGH TECH CORP0 citations60
US7365323B2Apr 29, 2008
Environmental scanning electron microcope
HITACHI HIGH TECH CORP3 citations57
US9673020B2Jun 6, 2017
Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
HITACHI HIGH TECH CORP0 citations52
US9105442B2Aug 11, 2015
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations52
US9236217B2Jan 12, 2016
Inspection or observation apparatus and sample inspection or observation method
HITACHI HIGH TECH CORP0 citations51
US11977099B2May 7, 2024
Method for manufacturing semiconductor device
HITACHI HIGH TECH CORP0 citations50
US9263232B2Feb 16, 2016
Charged particle beam device
HITACHI HIGH TECH CORP0 citations41
OMINAMI YUSUKE
3 patentsUS8710439B2Apr 29, 2014
Charged particle beam apparatus
OMINAMI YUSUKE15 citations91
US8933400B2Jan 13, 2015
Inspection or observation apparatus and sample inspection or observation method
OMINAMI YUSUKE5 citations71
US9165741B2Oct 20, 2015
Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
OMINAMI YUSUKE0 citations51