Inventor
MIWA TORU
JP49 patents
⚠️ This page may combine multiple inventors who share the name “MIWA TORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES LLC
17 patentsUS10854619B2Dec 1, 2020
Three-dimensional memory device containing bit line switches
SANDISK TECHNOLOGIES LLC9 citations83
US10734080B2Aug 4, 2020
Three-dimensional memory device containing bit line switches
SANDISK TECHNOLOGIES LLC9 citations83
US11875043B1Jan 16, 2024
Loop dependent word line ramp start time for program verify of multi-level NAND memory
SANDISK TECHNOLOGIES LLC3 citations74
US10978156B2Apr 13, 2021
Concurrent programming of multiple cells for non-volatile memory devices
SANDISK TECHNOLOGIES LLC3 citations73
US9941297B2Apr 10, 2018
Vertical resistor in 3D memory device with two-tier stack
SANDISK TECHNOLOGIES LLC3 citations73
US11081192B2Aug 3, 2021
Memory plane structure for ultra-low read latency applications in non-volatile memories
SANDISK TECHNOLOGIES LLC2 citations71
US12354664B2Jul 8, 2025
Non-volatile memory with loop dependant ramp-up rate
SANDISK TECHNOLOGIES LLC1 citations64
US11551781B1Jan 10, 2023
Programming memory cells with concurrent storage of multi-level data as single-level data for power loss protection
SANDISK TECHNOLOGIES LLC1 citations63
US11342028B2May 24, 2022
Concurrent programming of multiple cells for non-volatile memory devices
SANDISK TECHNOLOGIES LLC0 citations63
US10984874B1Apr 20, 2021
Differential dbus scheme for low-latency random read for NAND memories
SANDISK TECHNOLOGIES LLC0 citations62
US10885984B1Jan 5, 2021
Area effective erase voltage isolation in NAND memory
SANDISK TECHNOLOGIES LLC0 citations61
US10635526B2Apr 28, 2020
Multicore on-die memory microcontroller
SANDISK TECHNOLOGIES LLC1 citations57
US12230335B2Feb 18, 2025
Data latch programming algorithm for multi-bit-per-cell memory devices
SANDISK TECHNOLOGIES LLC0 citations52
US11625172B2Apr 11, 2023
Programming memory cells with concurrent redundant storage of data for power loss protection
SANDISK TECHNOLOGIES LLC0 citations52
US11545221B2Jan 3, 2023
Concurrent programming of multiple cells for non-volatile memory devices
SANDISK TECHNOLOGIES LLC0 citations52
US12270853B2Apr 8, 2025
Semiconductor wafer configured for single touch-down testing
SANDISK TECHNOLOGIES LLC0 citations51
US11177277B2Nov 16, 2021
Word line architecture for three dimensional NAND flash memory
SANDISK TECHNOLOGIES LLC0 citations51
SANDISK CORP
11 patentsUS7057939B2Jun 6, 2006
Non-volatile memory and control with improved partial page program capability
SANDISK CORP169 citations99
US7474561B2Jan 6, 2009
Variable program voltage increment values in non-volatile memory program operations
SANDISK CORP25 citations92
US7450426B2Nov 11, 2008
Systems utilizing variable program voltage increment values in non-volatile memory program operations
SANDISK CORP34 citations92
US7269092B1Sep 11, 2007
Circuitry and device for generating and adjusting selected word line voltage
SANDISK CORP23 citations92
US7672163B2Mar 2, 2010
Control gate line architecture
SANDISK CORP9 citations84
US7453735B2Nov 18, 2008
Non-volatile memory and control with improved partial page program capability
SANDISK CORP9 citations84
US7330373B2Feb 12, 2008
Program time adjustment as function of program voltage for improved programming speed in memory system
SANDISK CORP12 citations84
US7280396B2Oct 9, 2007
Non-volatile memory and control with improved partial page program capability
SANDISK CORP12 citations84
US7675780B2Mar 9, 2010
Program time adjustment as function of program voltage for improved programming speed in memory system
SANDISK CORP6 citations74
US7327608B2Feb 5, 2008
Program time adjustment as function of program voltage for improved programming speed in programming method
SANDISK CORP7 citations74
US7518930B2Apr 14, 2009
Method for generating and adjusting selected word line voltage
SANDISK CORP6 citations63
SANDISK TECHNOLOGIES INC
11 patentsUS9595535B1Mar 14, 2017
Integration of word line switches with word line contact via structures
SANDISK TECHNOLOGIES INC56 citations98
US9691781B1Jun 27, 2017
Vertical resistor in 3D memory device with two-tier stack
SANDISK TECHNOLOGIES INC39 citations94
US9646981B2May 9, 2017
Passive devices for integration with three-dimensional memory devices
SANDISK TECHNOLOGIES INC53 citations93
US9589981B2Mar 7, 2017
Passive devices for integration with three-dimensional memory devices
SANDISK TECHNOLOGIES INC53 citations93
US7978527B2Jul 12, 2011
Verification process for non-volatile storage
SANDISK TECHNOLOGIES INC13 citations93
US9142298B2Sep 22, 2015
Efficient smart verify method for programming 3D non-volatile memory
SANDISK TECHNOLOGIES INC21 citations92
US9142302B2Sep 22, 2015
Efficient smart verify method for programming 3D non-volatile memory
SANDISK TECHNOLOGIES INC12 citations84
USRE46264EJan 3, 2017
Verification process for non-volatile storage
SANDISK TECHNOLOGIES INC2 citations73
US12387802B2Aug 12, 2025
Non-volatile memory with lower current program-verify
SANDISK TECHNOLOGIES INC1 citations64
USRE46014EMay 24, 2016
Defective word line detection
SANDISK TECHNOLOGIES INC2 citations63
US12494260B2Dec 9, 2025
Program verify word line ramping delay for lower current consumption mode
SANDISK TECHNOLOGIES INC0 citations52
ALROD IDAN
3 patentsUS8099652B1Jan 17, 2012
Non-volatile memory and methods with reading soft bits in non uniform schemes
ALROD IDAN68 citations97
US8498152B2Jul 30, 2013
Non-volatile memory and methods with soft-bit reads while reading hard bits with compensation for coupling
ALROD IDAN40 citations94
US8782495B2Jul 15, 2014
Non-volatile memory and methods with asymmetric soft read points around hard read points
ALROD IDAN11 citations83