Inventor

KO CHUN-YAO

TW38 patents

⚠️ This page may combine multiple inventors who share the name “KO CHUN-YAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KO CHUN-YAO

TAIWAN SEMICONDUCTOR MFG CO LTD

Mechanisms for preventing leakage currents in memory cells

Memory device, memory cell and memory cell layout

Non-volatile memory (NVM) cell structure to increase reliability

Non-volatile memory (NVM) cell structure to increase reliability

Non-volatile memory (NVM) cell structure to increase reliability

Memory device, gate stack and method for manufacturing the same

Memory architectures having dense layouts

Memory device and method of manufacturing the same

Non-volatile memory (NVM) cell structure to increase reliability

Memory device and method of manufacturing the same

Memory device and memory cell

Non-volatile memory and method of manufacturing same

Non-volatile memory and method of manufacturing the same

Crosstalk improvement through P on N structure for image sensor

Non-volatile memory having a gate-layered triple well structure

Crosstalk improvement through P on N structure for image sensor

Memory cell including a plurality of wells

Memory system and memory cell having dense layouts

TAIWAN SEMICONDUCTOR MFG

Cross-talk reduction through deep pixel well implant for image sensors

Method and device to reduce dark current in image sensors

Crosstalk improvement through P on N structure for image sensor

Method and device to reduce dark current in image sensors

Multiple-time programming memory cells and methods for forming the same

Structure and method for single gate non-volatile memory device having a capacitor well doping design with improved coupling efficiency

Fuse device

Multiple-time programming memory cells and methods for forming the same

Memory cell

KO PO CHENG

Interactive test equipment for quality evaluation of power transformer

Interactive test equipment for quality evaluation of insulative electric resistance value of electric power cable

Interactive test equipment for quality evaluation of resistance value test for electric leakage

Extension cord for polyphase voltage conversion

LIANG VICTOR CHIANG

Structure of capacitor set

LIANG VICTOR-CHIANG

Method for reducing capacitance variation between capacitors

FU CHING-HUNG

Multiple-time programming memory cells and methods for forming the same

LIAO TA-CHUAN

Structure and method for single gate non-volatile memory device having a capacitor well doping design with improved coupling efficiency

LU HAU-YAN

Memory architectures having dense layouts

CHANG CHUNG-WEI

Crosstalk improvement through P on N structure for image sensor

LIN JYUN-YING

One-time programmable devices and methods of forming the same