Inventor
HAGMANN MARK J
US19 patents
⚠️ This page may combine multiple inventors who share the name “HAGMANN MARK J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HAGMANN MARK J
12 patentsUS7613578B2Nov 3, 2009
Method for noninvasive determination of a distribution of electrical current and apparatus for the same
HAGMANN MARK J9 citations83
USD695801SDec 17, 2013
Test fixture for scanning probe microscopy
HAGMANN MARK J6 citations75
US10006933B2Jun 26, 2018
Method of carrier profiling utilizing dielectric relaxation
HAGMANN MARK J2 citations72
US9927461B2Mar 27, 2018
Apparatus and algorithm for carrier profiling in scanning frequency comb microscopy
HAGMANN MARK J2 citations72
US9442078B2Sep 13, 2016
Scanning frequency comb microscopy (SFCM) for carrier profiling in semiconductors
HAGMANN MARK J3 citations72
US7141781B2Nov 28, 2006
Efficient high-frequency energy coupling in radiation-assisted field emission
HAGMANN MARK J4 citations61
US10401383B2Sep 3, 2019
Frequency comb feedback control for scanning probe microscopy
HAGMANN MARK J0 citations51
US9075081B2Jul 7, 2015
Method and means for coupling high-frequency energy to and/or from the nanoscale junction of an electrically-conductive tip with a semiconductor
HAGMANN MARK J1 citations51
US8492966B2Jul 23, 2013
Symmetric field emission devices using distributed capacitive ballasting with multiple emitters to obtain large emitted currents at high frequencies
HAGMANN MARK J1 citations51
USD662430SJun 26, 2012
Calibration fixture for current probes
HAGMANN MARK J1 citations51
US10401382B2Sep 3, 2019
Method of carrier profiling in semiconductors
HAGMANN MARK J0 citations40
US9885736B2Feb 6, 2018
Electrode control methodology for a scanning tunneling microscope
HAGMANN MARK J0 citations40