Inventor
CHANG CHUN-MING
TW48 patents
⚠️ This page may combine multiple inventors who share the name “CHANG CHUN-MING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
37 patentsUS11081579B2Aug 3, 2021
High electron mobility transistor and method of fabricating the same
UNITED MICROELECTRONICS CORP19 citations94
US11264492B2Mar 1, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP21 citations93
US11043584B2Jun 22, 2021
Semiconductor device and fabricating method thereof
UNITED MICROELECTRONICS CORP4 citations84
US10892358B1Jan 12, 2021
Insulating structure of high electron mobility transistor and manufacturing method thereof
UNITED MICROELECTRONICS CORP7 citations84
US12027604B2Jul 2, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP1 citations73
US11894441B2Feb 6, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US11830941B2Nov 28, 2023
High electron mobility transistor and method of fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US11735644B2Aug 22, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP3 citations73
US11695049B2Jul 4, 2023
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP4 citations73
US11557669B2Jan 17, 2023
Semiconductor device and fabricating method thereof
UNITED MICROELECTRONICS CORP3 citations73
US11367779B2Jun 21, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US11171227B2Nov 9, 2021
Semiconductor device and fabricating method thereof
UNITED MICROELECTRONICS CORP3 citations73
US10971610B2Apr 6, 2021
High electron mobility transistor
UNITED MICROELECTRONICS CORP4 citations73
US11804544B2Oct 31, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations72
US9063193B2Jun 23, 2015
Layout structure of electronic element and testing method of the same thereof
UNITED MICROELECTRONICS CORP3 citations63
US12328889B2Jun 10, 2025
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US12199175B2Jan 14, 2025
Manufacturing method for forminginsulating structure of high electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations62
US12199176B2Jan 14, 2025
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US12125903B2Oct 22, 2024
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US12100758B2Sep 24, 2024
High electron mobility transistor and method of fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11810972B2Nov 7, 2023
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US11742418B2Aug 29, 2023
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US11610989B2Mar 21, 2023
High electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations62
US11502177B2Nov 15, 2022
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11489048B2Nov 1, 2022
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11380786B2Jul 5, 2022
Insulating structure of high electron mobility transistor and manufacturing method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11239338B2Feb 1, 2022
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11177377B2Nov 16, 2021
Semiconductive device with mesa structure and method of fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11063124B2Jul 13, 2021
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11004952B1May 11, 2021
High-electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US10991820B2Apr 27, 2021
Manufacturing method for forming insulating structure of high electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations62
US10861970B1Dec 8, 2020
Semiconductor epitaxial structure with reduced defects
UNITED MICROELECTRONICS CORP1 citations62
US9235677B1Jan 12, 2016
Thermal uniformity compensating method and apparatus
UNITED MICROELECTRONICS CORP2 citations62
US12266701B2Apr 1, 2025
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP0 citations61
US12206000B2Jan 21, 2025
High electron mobility transistor and method for forming the same
UNITED MICROELECTRONICS CORP0 citations61
US11935947B2Mar 19, 2024
Enhancement mode high electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations51
US11749740B2Sep 5, 2023
High electron mobility transistor and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations50
CHANG CHUN-MING
3 patentsUS8264289B2Sep 11, 2012
Nth-order arbitrary-phase-shift sinusoidal oscillator structure and analytical synthesis method of making the same
CHANG CHUN-MING15 citations80
US8461917B2Jun 11, 2013
Complimentary single-ended-input OTA-C universal filter structures
CHANG CHUN-MING2 citations59
US8132143B2Mar 6, 2012
Analytical synthesis method for designing DDCC and FDCCII-grounded R and C filter structure with stable transfer function
CHANG CHUN-MING2 citations59