Inventor
ABBOTT TODD R
US45 patents
⚠️ This page may combine multiple inventors who share the name “ABBOTT TODD R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
39 patentsUS7365385B2Apr 29, 2008
DRAM layout with vertical FETs and method of formation
MICRON TECHNOLOGY INC173 citations99
US7262089B2Aug 28, 2007
Methods of forming semiconductor structures
MICRON TECHNOLOGY INC119 citations98
US7518182B2Apr 14, 2009
DRAM layout with vertical FETs and method of formation
MICRON TECHNOLOGY INC79 citations97
US6599789B1Jul 29, 2003
Method of forming a field effect transistor
MICRON TECHNOLOGY INC67 citations96
US7736969B2Jun 15, 2010
DRAM layout with vertical FETS and method of formation
MICRON TECHNOLOGY INC38 citations95
US7453103B2Nov 18, 2008
Semiconductor constructions
MICRON TECHNOLOGY INC20 citations93
US6812529B2Nov 2, 2004
Suppression of cross diffusion and gate depletion
MICRON TECHNOLOGY INC19 citations93
US6583518B2Jun 24, 2003
Cross-diffusion resistant dual-polycide semiconductor structure and method
MICRON TECHNOLOGY INC18 citations93
US6376358B1Apr 23, 2002
Method of forming plugs and local interconnect for embedded memory/system-on-chip (SOC) applications
MICRON TECHNOLOGY INC19 citations93
US7560336B2Jul 14, 2009
DRAM layout with vertical FETs and method of formation
MICRON TECHNOLOGY INC14 citations92
US7348236B2Mar 25, 2008
Formation of memory cells and select gates of NAND memory arrays
MICRON TECHNOLOGY INC26 citations92
US7012024B2Mar 14, 2006
Methods of forming a transistor with an integrated metal silicide gate electrode
MICRON TECHNOLOGY INC20 citations92
US6727168B2Apr 27, 2004
Method of forming local interconnects
MICRON TECHNOLOGY INC19 citations92
US6723597B2Apr 20, 2004
Method of using high-k dielectric materials to reduce soft errors in SRAM memory cells, and a device comprising same
MICRON TECHNOLOGY INC24 citations91
US7768051B2Aug 3, 2010
DRAM including a vertical surround gate transistor
MICRON TECHNOLOGY INC13 citations84
US7566620B2Jul 28, 2009
DRAM including a vertical surround gate transistor
MICRON TECHNOLOGY INC8 citations84
US6677650B2Jan 13, 2004
Silicon plugs and local interconnect for embedded memory and system-on-chip (SOC) applications
MICRON TECHNOLOGY INC15 citations84
US7989866B2Aug 2, 2011
DRAM layout with vertical FETS and method of formation
MICRON TECHNOLOGY INC9 citations83
US7968928B2Jun 28, 2011
DRAM layout with vertical FETs and method of formation
MICRON TECHNOLOGY INC4 citations74
US7153731B2Dec 26, 2006
Method of forming a field effect transistor with halo implant regions
MICRON TECHNOLOGY INC6 citations74
US7112482B2Sep 26, 2006
Method of forming a field effect transistor
MICRON TECHNOLOGY INC5 citations74
US6987291B2Jan 17, 2006
Integrated transistor circuitry
MICRON TECHNOLOGY INC9 citations74
US6879507B2Apr 12, 2005
Conductive structure for microelectronic devices and methods of fabricating such structures
MICRON TECHNOLOGY INC9 citations74
US6770921B2Aug 3, 2004
Sidewall strap for complementary semiconductor structures and method of making same
MICRON TECHNOLOGY INC5 citations74
US6613617B2Sep 2, 2003
Cross-diffusion resistant dual-polycide semiconductor structure and method
MICRON TECHNOLOGY INC6 citations74
US6380596B1Apr 30, 2002
Method of forming a local interconnect, method of fabricating integrated circuitry comprising an sram cell having a local interconnect and having circuitry peripheral to the sram cell, and method of forming contact plugs
MICRON TECHNOLOGY INC6 citations74
US6333254B1Dec 25, 2001
Methods of forming a local interconnect method of fabricating integrated circuitry comprising an SRAM cell having a local interconnect and having circuitry peripheral to the SRAM cell and method of forming contact plugs
MICRON TECHNOLOGY INC11 citations74
US6900494B2May 31, 2005
Method of using high-k dielectric materials to reduce soft errors in SRAM memory cells, and a device comprising same
MICRON TECHNOLOGY INC5 citations72
US6962841B2Nov 8, 2005
Suppression of cross diffusion and gate depletion
MICRON TECHNOLOGY INC6 citations71
US7402861B2Jul 22, 2008
Memory cells and select gates of NAND memory arrays
MICRON TECHNOLOGY INC2 citations63
US7276414B2Oct 2, 2007
NAND memory arrays and methods
MICRON TECHNOLOGY INC3 citations63
US7029963B2Apr 18, 2006
Semiconductor damascene trench and methods thereof
MICRON TECHNOLOGY INC4 citations63
US5869360AFeb 9, 1999
Method for forming a thin film transistor
MICRON TECHNOLOGY INC5 citations63
US7977037B2Jul 12, 2011
Photoresist processing methods
MICRON TECHNOLOGY INC3 citations57
US7351659B2Apr 1, 2008
Methods of forming a transistor with an integrated metal silicide gate electrode
MICRON TECHNOLOGY INC0 citations52
US7319605B2Jan 15, 2008
Conductive structure for microelectronic devices and methods of fabricating such structures
MICRON TECHNOLOGY INC0 citations52
US7179730B2Feb 20, 2007
Semiconductor damascene trench and methods thereof
MICRON TECHNOLOGY INC0 citations52
US6911702B2Jun 28, 2005
Integrated circuitry
MICRON TECHNOLOGY INC0 citations52
US6066517AMay 23, 2000
Method for forming a thin film transistor
MICRON TECHNOLOGY INC1 citations52
ABBOTT TODD R
3 patentsUS8274106B2Sep 25, 2012
DRAM layout with vertical FETs and method of formation
ABBOTT TODD R23 citations92
US8482047B2Jul 9, 2013
DRAM layout with vertical FETS and method of formation
ABBOTT TODD R21 citations91
US8389360B2Mar 5, 2013
DRAM layout with vertical FETs and method of formation
ABBOTT TODD R8 citations83