Inventor
NARASIMHA SHREESH
US115 patents
⚠️ This page may combine multiple inventors who share the name “NARASIMHA SHREESH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
35 patentsUS7329923B2Feb 12, 2008
High-performance CMOS devices on hybrid crystal oriented substrates
IBM138 citations99
US7001844B2Feb 21, 2006
Material for contact etch layer to enhance device performance
IBM74 citations97
US9412667B2Aug 9, 2016
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM22 citations96
US6991979B2Jan 31, 2006
Method for avoiding oxide undercut during pre-silicide clean for thin spacer FETs
IBM52 citations96
US7538391B2May 26, 2009
Curved FINFETs
IBM28 citations93
US7274072B2Sep 25, 2007
Hybrid bulk-SOI 6T-SRAM cell for improved cell stability and performance
IBM33 citations93
US6825102B1Nov 30, 2004
Method of improving the quality of defective semiconductor material
IBM40 citations93
US9859122B2Jan 2, 2018
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM7 citations92
US9768071B2Sep 19, 2017
Asymmetric high-K dielectric for reducing gate induced drain leakage
IBM6 citations92
US9721843B2Aug 1, 2017
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM6 citations92
US9685379B2Jun 20, 2017
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM9 citations92
US9577061B2Feb 21, 2017
Asymmetric high-K dielectric for reducing gate induced drain leakage
IBM11 citations92
US9570354B2Feb 14, 2017
Asymmetric high-K dielectric for reducing gate induced drain leakage
IBM12 citations92
US9559010B2Jan 31, 2017
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM7 citations92
US9543213B2Jan 10, 2017
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM10 citations92
US10367072B2Jul 30, 2019
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM3 citations84
US9922831B2Mar 20, 2018
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM5 citations84
US9837319B2Dec 5, 2017
Asymmetric high-K dielectric for reducing gate induced drain leakage
IBM3 citations84
US9768195B2Sep 19, 2017
Semiconductor structure with integrated passive structures
IBM8 citations84
US8952460B2Feb 10, 2015
Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devices
IBM7 citations84
US8940595B2Jan 27, 2015
Faceted intrinsic epitaxial buffer layer for reducing short channel effects while maximizing channel stress levels
IBM8 citations84
US8343825B2Jan 1, 2013
Reducing dislocation formation in semiconductor devices through targeted carbon implantation
IBM7 citations84
US7893494B2Feb 22, 2011
Method and structure for SOI body contact FET with reduced parasitic capacitance
IBM9 citations84
US7714358B2May 11, 2010
Semiconductor structure and method of forming the structure
IBM12 citations84
US7627836B2Dec 1, 2009
OPC trimming for performance
IBM15 citations84
US7595247B2Sep 29, 2009
Halo-first ultra-thin SOI FET for superior short channel control
IBM11 citations84
US7550337B2Jun 23, 2009
Dual gate dielectric SRAM
IBM15 citations84
US7462916B2Dec 9, 2008
Semiconductor devices having torsional stresses
IBM10 citations84
US8053325B1Nov 8, 2011
Body contact structures and methods of manufacturing the same
IBM8 citations82
US7709910B2May 4, 2010
Semiconductor structure for low parasitic gate capacitance
IBM8 citations81
US7446062B2Nov 4, 2008
Device having dual etch stop liner and reformed silicide layer and related methods
IBM5 citations74
US7306983B2Dec 11, 2007
Method for forming dual etch stop liner and protective layer in a semiconductor device
IBM9 citations74
US10374048B2Aug 6, 2019
Asymmetric high-k dielectric for reducing gate induced drain leakage
IBM1 citations73
US9136321B1Sep 15, 2015
Low energy ion implantation of a junction butting region
IBM6 citations73
US8592295B2Nov 26, 2013
Gate-all around semiconductor nanowire FETs on bulk semiconductor wafers
IBM5 citations73
GLOBALFOUNDRIES INC
6 patentsUS9437496B1Sep 6, 2016
Merged source drain epitaxy
GLOBALFOUNDRIES INC26 citations94
US10074571B1Sep 11, 2018
Device with decreased pitch contact to active regions
GLOBALFOUNDRIES INC17 citations86
US10083878B1Sep 25, 2018
Fin fabrication process with dual shallow trench isolation and tunable inner and outer fin profile
GLOBALFOUNDRIES INC9 citations84
US9269786B2Feb 23, 2016
Silicon nitride layer deposited at low temperature to prevent gate dielectric regrowth high-K metal gate field effect transistors
GLOBALFOUNDRIES INC13 citations84
US9786545B1Oct 10, 2017
Method of forming ANA regions in an integrated circuit
GLOBALFOUNDRIES INC11 citations82
US9812324B1Nov 7, 2017
Methods to control fin tip placement
GLOBALFOUNDRIES INC4 citations73
BANGSARUNTIP SARUNYA
4 patentsUS8586966B2Nov 19, 2013
Contacts for nanowire field effect transistors
BANGSARUNTIP SARUNYA19 citations93
US8455334B2Jun 4, 2013
Planar and nanowire field effect transistors
BANGSARUNTIP SARUNYA19 citations93
US8097515B2Jan 17, 2012
Self-aligned contacts for nanowire field effect transistors
BANGSARUNTIP SARUNYA36 citations93
US8536563B2Sep 17, 2013
Nanowire field effect transistors
BANGSARUNTIP SARUNYA5 citations84
KIM BYEONG Y
1 patentJOHNSON JEFFREY B
1 patentDOMENICUCCI ANTHONY G
1 patentTESSERA INC
1 patentSLEIGHT JEFFREY W
1 patentShowing the top 50 of 115 patents by PatentIndex Score.