P

Inventor

NARASIMHA SHREESH

US115 patents
⚠️ This page may combine multiple inventors who share the name “NARASIMHA SHREESH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

35 patents
US7329923B2Feb 12, 2008

High-performance CMOS devices on hybrid crystal oriented substrates

IBM138 citations99
US7001844B2Feb 21, 2006

Material for contact etch layer to enhance device performance

IBM74 citations97
US9412667B2Aug 9, 2016

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM22 citations96
US6991979B2Jan 31, 2006

Method for avoiding oxide undercut during pre-silicide clean for thin spacer FETs

IBM52 citations96
US7538391B2May 26, 2009

Curved FINFETs

IBM28 citations93
US7274072B2Sep 25, 2007

Hybrid bulk-SOI 6T-SRAM cell for improved cell stability and performance

IBM33 citations93
US6825102B1Nov 30, 2004

Method of improving the quality of defective semiconductor material

IBM40 citations93
US9859122B2Jan 2, 2018

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM7 citations92
US9768071B2Sep 19, 2017

Asymmetric high-K dielectric for reducing gate induced drain leakage

IBM6 citations92
US9721843B2Aug 1, 2017

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM6 citations92
US9685379B2Jun 20, 2017

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM9 citations92
US9577061B2Feb 21, 2017

Asymmetric high-K dielectric for reducing gate induced drain leakage

IBM11 citations92
US9570354B2Feb 14, 2017

Asymmetric high-K dielectric for reducing gate induced drain leakage

IBM12 citations92
US9559010B2Jan 31, 2017

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM7 citations92
US9543213B2Jan 10, 2017

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM10 citations92
US10367072B2Jul 30, 2019

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM3 citations84
US9922831B2Mar 20, 2018

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM5 citations84
US9837319B2Dec 5, 2017

Asymmetric high-K dielectric for reducing gate induced drain leakage

IBM3 citations84
US9768195B2Sep 19, 2017

Semiconductor structure with integrated passive structures

IBM8 citations84
US8952460B2Feb 10, 2015

Germanium oxide free atomic layer deposition of silicon oxide and high-k gate dielectric on germanium containing channel for CMOS devices

IBM7 citations84
US8940595B2Jan 27, 2015

Faceted intrinsic epitaxial buffer layer for reducing short channel effects while maximizing channel stress levels

IBM8 citations84
US8343825B2Jan 1, 2013

Reducing dislocation formation in semiconductor devices through targeted carbon implantation

IBM7 citations84
US7893494B2Feb 22, 2011

Method and structure for SOI body contact FET with reduced parasitic capacitance

IBM9 citations84
US7714358B2May 11, 2010

Semiconductor structure and method of forming the structure

IBM12 citations84
US7627836B2Dec 1, 2009

OPC trimming for performance

IBM15 citations84
US7595247B2Sep 29, 2009

Halo-first ultra-thin SOI FET for superior short channel control

IBM11 citations84
US7550337B2Jun 23, 2009

Dual gate dielectric SRAM

IBM15 citations84
US7462916B2Dec 9, 2008

Semiconductor devices having torsional stresses

IBM10 citations84
US8053325B1Nov 8, 2011

Body contact structures and methods of manufacturing the same

IBM8 citations82
US7709910B2May 4, 2010

Semiconductor structure for low parasitic gate capacitance

IBM8 citations81
US7446062B2Nov 4, 2008

Device having dual etch stop liner and reformed silicide layer and related methods

IBM5 citations74
US7306983B2Dec 11, 2007

Method for forming dual etch stop liner and protective layer in a semiconductor device

IBM9 citations74
US10374048B2Aug 6, 2019

Asymmetric high-k dielectric for reducing gate induced drain leakage

IBM1 citations73
US9136321B1Sep 15, 2015

Low energy ion implantation of a junction butting region

IBM6 citations73
US8592295B2Nov 26, 2013

Gate-all around semiconductor nanowire FETs on bulk semiconductor wafers

IBM5 citations73

GLOBALFOUNDRIES INC

6 patents

BANGSARUNTIP SARUNYA

4 patents

KIM BYEONG Y

1 patent

JOHNSON JEFFREY B

1 patent

DOMENICUCCI ANTHONY G

1 patent

TESSERA INC

1 patent

SLEIGHT JEFFREY W

1 patent

Showing the top 50 of 115 patents by PatentIndex Score.