Inventor
ANDRESEN BERNHARD H
28 patents
⚠️ This page may combine multiple inventors who share the name “ANDRESEN BERNHARD H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
25 patentsUS6081002AJun 27, 2000
Lateral SCR structure for ESD protection in trench isolated technologies
TEXAS INSTRUMENTS INC96 citations98
US5544203AAug 6, 1996
Fine resolution digital delay line with coarse and fine adjustment stages
TEXAS INSTRUMENTS INC245 citations98
US6310379B1Oct 30, 2001
NMOS triggered NMOS ESD protection circuit using low voltage NMOS transistors
TEXAS INSTRUMENTS INC114 citations97
US5844954ADec 1, 1998
Fine resolution digital delay line with coarse and fine adjustment stages
TEXAS INSTRUMENTS INC106 citations97
US5355037AOct 11, 1994
High performance digital phase locked loop
TEXAS INSTRUMENTS INC141 citations97
US5621335AApr 15, 1997
Digitally controlled output buffer to incrementally match line impedance and maintain slew rate independent of capacitive output loading
TEXAS INSTRUMENTS INC76 citations96
US6487687B1Nov 26, 2002
Voltage level shifter with testable cascode devices
TEXAS INSTRUMENTS INC60 citations95
US6147538ANov 14, 2000
CMOS triggered NMOS ESD protection circuit
TEXAS INSTRUMENTS INC86 citations95
US6535368B2Mar 18, 2003
Shared 5 volt tolerant ESD protection circuit for low voltage CMOS process
TEXAS INSTRUMENTS INC31 citations92
US6445229B1Sep 3, 2002
Digital phase lock loop
TEXAS INSTRUMENTS INC27 citations92
US6353520B1Mar 5, 2002
Shared 5 volt tolerant ESD protection circuit for low voltage CMOS process
TEXAS INSTRUMENTS INC34 citations92
US6294943B1Sep 25, 2001
Method of designing fail-safe CMOS I/O buffers whose external nodes accept voltages higher than the maximum gate oxide operating voltage
TEXAS INSTRUMENTS INC24 citations92
US6115438ASep 5, 2000
Method and circuit for detecting a spurious lock signal from a lock detect circuit
TEXAS INSTRUMENTS INC19 citations92
US6040708AMar 21, 2000
Output buffer having quasi-failsafe operation
TEXAS INSTRUMENTS INC54 citations92
US5995010ANov 30, 1999
Output buffer providing testability
TEXAS INSTRUMENTS INC54 citations92
US5004936AApr 2, 1991
Non-loading output driver circuit
TEXAS INSTRUMENTS INC53 citations92
US4612499ASep 16, 1986
Test input demultiplexing circuit
TEXAS INSTRUMENTS INC25 citations81
US6633468B1Oct 14, 2003
High voltage protection circuit for improved oxide reliability
TEXAS INSTRUMENTS INC7 citations74
US6380786B1Apr 30, 2002
Digital phase lock loop
TEXAS INSTRUMENTS INC5 citations74
US6115439ASep 5, 2000
Free running digital phase lock loop
TEXAS INSTRUMENTS INC13 citations74
US5982213ANov 9, 1999
Digital phase lock loop
TEXAS INSTRUMENTS INC11 citations74
US6211693B1Apr 3, 2001
Testability circuit for cascode circuits used for high voltage interface
TEXAS INSTRUMENTS INC9 citations73
US4511234AApr 16, 1985
Gain switching amplifier
TEXAS INSTRUMENTS INC4 citations63
US4496914AJan 29, 1985
Piezo harn self-oscillating drive circuit
TEXAS INSTRUMENTS INC2 citations56
US4544257AOct 1, 1985
Automatic exposure control for a camera shutter
TEXAS INSTRUMENTS INC0 citations52
CANON KK
3 patentsUS4300824ANov 17, 1981
Signal processing circuitry for a distance measuring system
CANON KK11 citations74
US4365878ADec 28, 1982
Signal processing circuitry for a distance measuring system
CANON KK4 citations63
US4363540ADec 14, 1982
Exposure information storage device for a photographic camera
CANON KK5 citations63