Inventor
JAN CHIA-HONG
US149 patents
⚠️ This page may combine multiple inventors who share the name “JAN CHIA-HONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
43 patentsUS6887762B1May 3, 2005
Method of fabricating a field effect transistor structure with abrupt source/drain junctions
INTEL CORP141 citations99
US6521964B1Feb 18, 2003
Device having spacers for improved salicide resistance on polysilicon gates
INTEL CORP241 citations99
US6509618B2Jan 21, 2003
Device having thin first spacers and partially recessed thick second spacers for improved salicide resistance on polysilicon gates
INTEL CORP239 citations99
US6506652B2Jan 14, 2003
Method of recessing spacers to improved salicide resistance on polysilicon gates
INTEL CORP239 citations99
US6165826ADec 26, 2000
Transistor with low resistance tip and method of fabrication in a CMOS process
INTEL CORP301 citations99
US6765273B1Jul 20, 2004
Device structure and method for reducing silicide encroachment
INTEL CORP240 citations98
US6479391B2Nov 12, 2002
Method for making a dual damascene interconnect using a multilayer hard mask
INTEL CORP88 citations98
US6326664B1Dec 4, 2001
Transistor with ultra shallow tip and method of fabrication
INTEL CORP128 citations98
US5908313AJun 1, 1999
Method of forming a transistor
INTEL CORP297 citations98
US5710450AJan 20, 1998
Transistor with ultra shallow tip and method of fabrication
INTEL CORP199 citations98
US6235568B1May 22, 2001
Semiconductor device having deposited silicon regions and a method of fabrication
INTEL CORP303 citations97
US6198142B1Mar 6, 2001
Transistor with minimal junction capacitance and method of fabrication
INTEL CORP85 citations97
US7682916B2Mar 23, 2010
Field effect transistor structure with abrupt source/drain junctions
INTEL CORP31 citations96
US7436035B2Oct 14, 2008
Method of fabricating a field effect transistor structure with abrupt source/drain junctions
INTEL CORP36 citations96
US7338873B2Mar 4, 2008
Method of fabricating a field effect transistor structure with abrupt source/drain junctions
INTEL CORP28 citations96
US6121100ASep 19, 2000
Method of fabricating a MOS transistor with a raised source/drain extension
INTEL CORP147 citations96
US6777759B1Aug 17, 2004
Device structure and method for reducing silicide encroachment
INTEL CORP58 citations95
US6518155B1Feb 11, 2003
Device structure and method for reducing silicide encroachment
INTEL CORP43 citations95
US5891809AApr 6, 1999
Manufacturable dielectric formed using multiple oxidation and anneal steps
INTEL CORP92 citations95
US7115502B2Oct 3, 2006
Structure and manufacturing process of localized shunt to reduce electromigration failure of copper dual damascene process
INTEL CORP17 citations93
US7943468B2May 17, 2011
Penetrating implant for forming a semiconductor device
INTEL CORP20 citations92
US7541239B2Jun 2, 2009
Selective spacer formation on transistors of different classes on the same device
INTEL CORP26 citations92
US6777760B1Aug 17, 2004
Device with recessed thin and thick spacers for improved salicide resistance on polysilicon gates
INTEL CORP13 citations92
US6593633B2Jul 15, 2003
Method and device for improved salicide resistance on polysilicon gates
INTEL CORP16 citations92
US6188117B1Feb 13, 2001
Method and device for improved salicide resistance on polysilicon gates
INTEL CORP16 citations92
US6703672B1Mar 9, 2004
Polysilicon/amorphous silicon composite gate electrode
INTEL CORP16 citations91
US6017819AJan 25, 2000
Method for forming a polysilicon/amorphous silicon composite gate electrode
INTEL CORP18 citations91
US6114722ASep 5, 2000
Microcrystalline silicon structure and fabrication process
INTEL CORP20 citations89
US5885884AMar 23, 1999
Process for fabricating a microcrystalline silicon structure
INTEL CORP23 citations89
US11335601B2May 17, 2022
Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
INTEL CORP6 citations85
US10096599B2Oct 9, 2018
Methods of integrating multiple gate dielectric transistors on a tri-gate (finFET) process
INTEL CORP7 citations84
US9972642B2May 15, 2018
High voltage three-dimensional devices having dielectric liners
INTEL CORP5 citations84
US9929090B2Mar 27, 2018
Antifuse element using spacer breakdown
INTEL CORP7 citations84
US9899472B2Feb 20, 2018
Dielectric and isolation lower fin material for fin-based electronics
INTEL CORP4 citations84
US9786783B2Oct 10, 2017
Transistor architecture having extended recessed spacer and source/drain regions and method of making same
INTEL CORP16 citations84
US8681573B2Mar 25, 2014
Programmable/re-programmable device in high-k metal gate MOS
INTEL CORP5 citations84
US10892192B2Jan 12, 2021
Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
INTEL CORP5 citations83
US10692771B2Jun 23, 2020
Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
INTEL CORP4 citations83
US10312367B2Jun 4, 2019
Monolithic integration of high voltage transistors and low voltage non-planar transistors
INTEL CORP12 citations83
US10229853B2Mar 12, 2019
Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
INTEL CORP4 citations83
US10115721B2Oct 30, 2018
Planar device on fin-based transistor architecture
INTEL CORP5 citations83
US9356023B2May 31, 2016
Planar device on fin-based transistor architecture
INTEL CORP5 citations83
US10204999B2Feb 12, 2019
Transistor with airgap spacer
INTEL CORP8 citations82
HAFEZ WALID M
4 patentsUS8432751B2Apr 30, 2013
Memory cell using BTI effects in high-k metal gate MOS
HAFEZ WALID M187 citations98
US9159734B2Oct 13, 2015
Antifuse element utilizing non-planar topology
HAFEZ WALID M21 citations92
US8981481B2Mar 17, 2015
High voltage three-dimensional devices having dielectric liners
HAFEZ WALID M12 citations92
US9570467B2Feb 14, 2017
High voltage three-dimensional devices having dielectric liners
HAFEZ WALID M3 citations83
WISCONSIN ALUMNI RES FOUND
1 patentMURTHY ANAND S
1 patentYEH JENG-YA D
1 patentShowing the top 50 of 149 patents by PatentIndex Score.