Inventor
YOON SEI SEUNG
US103 patents
⚠️ This page may combine multiple inventors who share the name “YOON SEI SEUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QUALCOMM INC
21 patentsUS8971096B2Mar 3, 2015
Wide range multiport bitcell
QUALCOMM INC37 citations93
US8027206B2Sep 27, 2011
Bit line voltage control in spin transfer torque magnetoresistive random access memory
QUALCOMM INC33 citations93
US9401201B1Jul 26, 2016
Write driver for memory
QUALCOMM INC21 citations92
US9202555B2Dec 1, 2015
Write word-line assist circuitry for a byte-writeable memory
QUALCOMM INC19 citations92
US7995378B2Aug 9, 2011
MRAM device with shared source line
QUALCOMM INC20 citations92
US7813166B2Oct 12, 2010
Controlled value reference signal of resistance based memory circuit
QUALCOMM INC23 citations92
US7764537B2Jul 27, 2010
Spin transfer torque magnetoresistive random access memory and design methods
QUALCOMM INC31 citations92
US7742329B2Jun 22, 2010
Word line transistor strength control for read and write in spin transfer torque magnetoresistive random access memory
QUALCOMM INC38 citations90
US10446196B1Oct 15, 2019
Flexible power sequencing for dual-power memory
QUALCOMM INC16 citations84
US8934278B2Jan 13, 2015
Hybrid ternary content addressable memory
QUALCOMM INC12 citations84
US7979832B2Jul 12, 2011
Process variation tolerant memory design
QUALCOMM INC14 citations84
US7882407B2Feb 1, 2011
Adapting word line pulse widths in memory systems
QUALCOMM INC8 citations84
US7755964B2Jul 13, 2010
Memory device with configurable delay tracking
QUALCOMM INC14 citations84
US7710183B2May 4, 2010
CMOS level shifter circuit design
QUALCOMM INC18 citations84
US9646681B1May 9, 2017
Memory cell with improved write margin
QUALCOMM INC18 citations83
US9030863B2May 12, 2015
Read/write assist for memories
QUALCOMM INC18 citations83
US9082465B2Jul 14, 2015
Weak keeper circuit for memory device
QUALCOMM INC7 citations82
US8004880B2Aug 23, 2011
Read disturb reduction circuit for spin transfer torque magnetoresistive random access memory
QUALCOMM INC17 citations82
US7929334B2Apr 19, 2011
In-situ resistance measurement for magnetic random access memory (MRAM)
QUALCOMM INC7 citations82
US9064556B2Jun 23, 2015
High frequency pseudo dual port memory
QUALCOMM INC9 citations81
US9570192B1Feb 14, 2017
System and method for reducing programming voltage stress on memory cell devices
QUALCOMM INC9 citations76
SAMSUNG ELECTRONICS CO LTD
11 patentsUS5953259ASep 14, 1999
Integrated circuit memory devices having cross-coupled isolation gate controllers which provide simultaneous reading and writing capability to multiple memory arrays
SAMSUNG ELECTRONICS CO LTD20 citations93
US5438543AAug 1, 1995
Semiconductor memory using low power supply voltage
SAMSUNG ELECTRONICS CO LTD22 citations93
US6529423B1Mar 4, 2003
Internal clock signal delay circuit and method for delaying internal clock signal in semiconductor device
SAMSUNG ELECTRONICS CO LTD29 citations92
US6079023AJun 20, 2000
Multi-bank memory devices having common standby voltage generator for powering a plurality of memory array banks in response to memory array bank enable signals
SAMSUNG ELECTRONICS CO LTD51 citations92
US5796293AAug 18, 1998
Voltage boosting circuits having backup voltage boosting capability
SAMSUNG ELECTRONICS CO LTD34 citations92
US5677886AOct 14, 1997
Sense amplifier circuit in semiconductor memory device
SAMSUNG ELECTRONICS CO LTD20 citations92
US5315557AMay 24, 1994
Semiconductor memory device having self-refresh and back-bias circuitry
SAMSUNG ELECTRONICS CO LTD53 citations91
US6100744AAug 8, 2000
Integrated circuit devices having improved internal voltage generators which reduce timing skew in buffer circuits therein
SAMSUNG ELECTRONICS CO LTD19 citations86
US6359459B1Mar 19, 2002
Integrated circuits including voltage-controllable power supply systems that can be used for low supply voltage margin testing and related methods
SAMSUNG ELECTRONICS CO LTD17 citations84
US6087891AJul 11, 2000
Integrated power supply voltage generators having reduced susceptibility to parasitic latch-up during set-up mode operation
SAMSUNG ELECTRONICS CO LTD17 citations84
US6055194AApr 25, 2000
Method and apparatus for controlling column select lines in a synchronous memory device
SAMSUNG ELECTRONICS CO LTD18 citations84
MICRON TECHNOLOGY INC
4 patentsUS7345937B2Mar 18, 2008
Open digit line array architecture for a memory array
MICRON TECHNOLOGY INC33 citations96
US7512025B2Mar 31, 2009
Open digit line array architecture for a memory array
MICRON TECHNOLOGY INC12 citations92
US7277310B2Oct 2, 2007
Open digit line array architecture for a memory array
MICRON TECHNOLOGY INC7 citations74
US7254074B2Aug 7, 2007
Open digit line array architecture for a memory array
MICRON TECHNOLOGY INC7 citations74
T RAM INC
4 patentsUS6958931B1Oct 25, 2005
Bit line control and sense amplification for TCCT-based memory cells
T RAM INC41 citations96
US6903987B2Jun 7, 2005
Single data line sensing scheme for TCCT-based memory cells
T RAM INC23 citations93
US6735113B2May 11, 2004
Circuit and method for implementing a write operation with TCCT-based memory cells
T RAM INC30 citations93
US6721220B2Apr 13, 2004
Bit line control and sense amplification for TCCT-based memory cells
T RAM INC17 citations93
YOON SEI SEUNG
2 patentsJUNG SEONG-OOK
1 patentKANG SEUNG H
1 patentT RAM SEMICONDUCTOR INC
1 patentSAMSUNG ELECTRIC
1 patentCHO SUNG IL
1 patentABU RAHMA MOHAMED H
1 patentPARK DONGKYU
1 patentABU-RAHMA MOHAMED HASSAN
1 patentShowing the top 50 of 103 patents by PatentIndex Score.