Inventor
ALPTEKIN EMRE
US84 patents
⚠️ This page may combine multiple inventors who share the name “ALPTEKIN EMRE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
28 patentsUS9431399B1Aug 30, 2016
Method for forming merged contact for semiconductor device
IBM31 citations94
US9496362B1Nov 15, 2016
Contact first replacement metal gate
IBM20 citations93
US9305835B2Apr 5, 2016
Formation of air-gap spacer in transistor
IBM29 citations92
US9111962B1Aug 18, 2015
Selective dielectric spacer deposition for exposing sidewalls of a finFET
IBM18 citations92
US8643122B2Feb 4, 2014
Silicide contacts having different shapes on regions of a semiconductor device
IBM26 citations92
US8603881B1Dec 10, 2013
Raised trench metal semiconductor alloy formation
IBM19 citations92
US10236344B2Mar 19, 2019
Tunnel transistors with abrupt junctions
IBM7 citations84
US9466693B1Oct 11, 2016
Self aligned replacement metal source/drain finFET
IBM5 citations84
US9349836B2May 24, 2016
Fin end spacer for preventing merger of raised active regions
IBM6 citations84
US9231072B2Jan 5, 2016
Multi-composition gate dielectric field effect transistors
IBM10 citations84
US9190406B2Nov 17, 2015
Fin field effect transistors having heteroepitaxial channels
IBM7 citations84
US8815693B2Aug 26, 2014
FinFET device formation
IBM13 citations84
US8796099B2Aug 5, 2014
Inducing channel strain via encapsulated silicide formation
IBM7 citations84
US8629510B2Jan 14, 2014
Two-step silicide formation
IBM7 citations84
US9312185B2Apr 12, 2016
Formation of metal resistor and e-fuse
IBM11 citations82
US10943988B2Mar 9, 2021
Thermally stable salicide formation for salicide first contacts
IBM1 citations73
US10937889B2Mar 2, 2021
Forming thermally stable salicide for salicide first contacts
IBM1 citations73
US10546941B2Jan 28, 2020
Forming thermally stable salicide for salicide first contacts
IBM3 citations73
US10453935B2Oct 22, 2019
Thermally stable salicide formation for salicide first contacts
IBM1 citations73
US10418450B2Sep 17, 2019
Self aligned replacement metal source/drain finFET
IBM3 citations73
US10170581B2Jan 1, 2019
FinFET with reduced parasitic capacitance
IBM2 citations73
US9985104B2May 29, 2018
Contact first replacement metal gate
IBM2 citations73
US9985109B2May 29, 2018
FinFET with reduced parasitic capacitance
IBM3 citations73
US9059290B2Jun 16, 2015
FinFET device formation
IBM4 citations73
US8647954B2Feb 11, 2014
Two-step silicide formation
IBM4 citations73
US9496368B2Nov 15, 2016
Partial spacer for increasing self aligned contact process margins
IBM2 citations63
US9331166B2May 3, 2016
Selective dielectric spacer deposition for exposing sidewalls of a finFET
IBM2 citations62
US10693005B2Jun 23, 2020
Reliable gate contacts over active areas
IBM1 citations60
APPLE INC
7 patentsUS10700065B2Jun 30, 2020
Leakage current reduction in electrical isolation gate structures
APPLE INC5 citations84
US12278232B2Apr 15, 2025
Leakage current reduction in electrical isolation gate structures
APPLE INC0 citations63
US11469226B2Oct 11, 2022
Leakage current reduction in electrical isolation gate structures
APPLE INC0 citations63
US12511463B2Dec 30, 2025
Backside contacts for signal routing
APPLE INC0 citations62
US12408317B2Sep 2, 2025
SRAM macro design architecture
APPLE INC0 citations58
US12402293B2Aug 26, 2025
Stacked SRAM cell architecture
APPLE INC0 citations57
US12356712B2Jul 8, 2025
Device structure for inducing layout dependent threshold voltage shift
APPLE INC0 citations52
GLOBALFOUNDRIES INC
6 patentsUS9379012B2Jun 28, 2016
Oxide mediated epitaxial nickel disilicide alloy contact formation
GLOBALFOUNDRIES INC7 citations84
US9236345B2Jan 12, 2016
Oxide mediated epitaxial nickel disilicide alloy contact formation
GLOBALFOUNDRIES INC6 citations84
US9691658B1Jun 27, 2017
Contact fill in an integrated circuit
GLOBALFOUNDRIES INC18 citations80
US9647124B2May 9, 2017
Semiconductor devices with graphene nanoribbons
GLOBALFOUNDRIES INC2 citations73
US9390928B2Jul 12, 2016
Anisotropic dielectric material gate spacer for a field effect transistor
GLOBALFOUNDRIES INC3 citations73
US9530684B2Dec 27, 2016
Method and structure to suppress finFET heating
GLOBALFOUNDRIES INC2 citations60
ALPTEKIN EMRE
5 patentsUS8415250B2Apr 9, 2013
Method of forming silicide contacts of different shapes selectively on regions of a semiconductor device
ALPTEKIN EMRE40 citations92
US8298895B1Oct 30, 2012
Selective threshold voltage implants for long channel devices
ALPTEKIN EMRE22 citations92
US8853862B2Oct 7, 2014
Contact structures for semiconductor transistors
ALPTEKIN EMRE9 citations84
US8652914B2Feb 18, 2014
Two-step silicide formation
ALPTEKIN EMRE4 citations69
US8927422B2Jan 6, 2015
Raised silicide contact
ALPTEKIN EMRE3 citations60
VEGA REINALDO A
1 patentINT BUSNIESS MACHINES CORPORATION
1 patentTESSERA LLC
1 patentTESSERA INC
1 patentShowing the top 50 of 84 patents by PatentIndex Score.