P

Inventor

ALPTEKIN EMRE

US84 patents
⚠️ This page may combine multiple inventors who share the name “ALPTEKIN EMRE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

28 patents
US9431399B1Aug 30, 2016

Method for forming merged contact for semiconductor device

IBM31 citations94
US9496362B1Nov 15, 2016

Contact first replacement metal gate

IBM20 citations93
US9305835B2Apr 5, 2016

Formation of air-gap spacer in transistor

IBM29 citations92
US9111962B1Aug 18, 2015

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM18 citations92
US8643122B2Feb 4, 2014

Silicide contacts having different shapes on regions of a semiconductor device

IBM26 citations92
US8603881B1Dec 10, 2013

Raised trench metal semiconductor alloy formation

IBM19 citations92
US10236344B2Mar 19, 2019

Tunnel transistors with abrupt junctions

IBM7 citations84
US9466693B1Oct 11, 2016

Self aligned replacement metal source/drain finFET

IBM5 citations84
US9349836B2May 24, 2016

Fin end spacer for preventing merger of raised active regions

IBM6 citations84
US9231072B2Jan 5, 2016

Multi-composition gate dielectric field effect transistors

IBM10 citations84
US9190406B2Nov 17, 2015

Fin field effect transistors having heteroepitaxial channels

IBM7 citations84
US8815693B2Aug 26, 2014

FinFET device formation

IBM13 citations84
US8796099B2Aug 5, 2014

Inducing channel strain via encapsulated silicide formation

IBM7 citations84
US8629510B2Jan 14, 2014

Two-step silicide formation

IBM7 citations84
US9312185B2Apr 12, 2016

Formation of metal resistor and e-fuse

IBM11 citations82
US10943988B2Mar 9, 2021

Thermally stable salicide formation for salicide first contacts

IBM1 citations73
US10937889B2Mar 2, 2021

Forming thermally stable salicide for salicide first contacts

IBM1 citations73
US10546941B2Jan 28, 2020

Forming thermally stable salicide for salicide first contacts

IBM3 citations73
US10453935B2Oct 22, 2019

Thermally stable salicide formation for salicide first contacts

IBM1 citations73
US10418450B2Sep 17, 2019

Self aligned replacement metal source/drain finFET

IBM3 citations73
US10170581B2Jan 1, 2019

FinFET with reduced parasitic capacitance

IBM2 citations73
US9985104B2May 29, 2018

Contact first replacement metal gate

IBM2 citations73
US9985109B2May 29, 2018

FinFET with reduced parasitic capacitance

IBM3 citations73
US9059290B2Jun 16, 2015

FinFET device formation

IBM4 citations73
US8647954B2Feb 11, 2014

Two-step silicide formation

IBM4 citations73
US9496368B2Nov 15, 2016

Partial spacer for increasing self aligned contact process margins

IBM2 citations63
US9331166B2May 3, 2016

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM2 citations62
US10693005B2Jun 23, 2020

Reliable gate contacts over active areas

IBM1 citations60

APPLE INC

7 patents

GLOBALFOUNDRIES INC

6 patents

ALPTEKIN EMRE

5 patents

VEGA REINALDO A

1 patent

INT BUSNIESS MACHINES CORPORATION

1 patent

TESSERA LLC

1 patent

TESSERA INC

1 patent

Showing the top 50 of 84 patents by PatentIndex Score.