Inventor
HOSAKA HISATOMI
JP13 patents
⚠️ This page may combine multiple inventors who share the name “HOSAKA HISATOMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
10 patentsUS7474110B2Jan 6, 2009
Probe card
TOKYO ELECTRON LTD18 citations92
US5798651AAug 25, 1998
Probe system
TOKYO ELECTRON LTD27 citations90
US7629806B2Dec 8, 2009
Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card
TOKYO ELECTRON LTD8 citations83
US7498827B2Mar 3, 2009
Probe card
TOKYO ELECTRON LTD10 citations83
US7256592B2Aug 14, 2007
Probe with trapezoidal contractor and device based on application thereof, and method of producing them
TOKYO ELECTRON LTD10 citations83
USRE42637EAug 23, 2011
Probe card
TOKYO ELECTRON LTD5 citations73
US7750655B2Jul 6, 2010
Multilayer substrate and probe card
TOKYO ELECTRON LTD2 citations62
US7663386B2Feb 16, 2010
Probe card
TOKYO ELECTRON LTD4 citations62
US7621045B2Nov 24, 2009
Method of producing a probe with a trapezoidal contactor
TOKYO ELECTRON LTD5 citations62
US7541820B2Jun 2, 2009
Probe card
TOKYO ELECTRON LTD2 citations62
IBIDEN CO LTD
2 patentsUS7091733B2Aug 15, 2006
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
IBIDEN CO LTD30 citations91
US7242206B2Jul 10, 2007
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
IBIDEN CO LTD7 citations72