Inventor
DEMARIS DAVID L
US11 patents
⚠️ This page may combine multiple inventors who share the name “DEMARIS DAVID L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
7 patentsUS7353472B2Apr 1, 2008
System and method for testing pattern sensitive algorithms for semiconductor design
IBM14 citations92
US8863044B1Oct 14, 2014
Layout assessment method and system
IBM39 citations90
US7404174B2Jul 22, 2008
method for generating a set of test patterns for an optical proximity correction algorithm
IBM11 citations84
US7284230B2Oct 16, 2007
System for search and analysis of systematic defects in integrated circuits
IBM6 citations73
US7415695B2Aug 19, 2008
System for search and analysis of systematic defects in integrated circuits
IBM3 citations62
US7685544B2Mar 23, 2010
Testing pattern sensitive algorithms for semiconductor design
IBM0 citations51
US7552417B2Jun 23, 2009
System for search and analysis of systematic defects in integrated circuits
IBM0 citations51
DEMARIS DAVID L
3 patentsUS8201132B2Jun 12, 2012
System and method for testing pattern sensitive algorithms for semiconductor design
DEMARIS DAVID L1 citations60
US8667427B2Mar 4, 2014
Method of optimization of a manufacturing process of an integrated circuit layout
DEMARIS DAVID L1 citations45
US8661370B2Feb 25, 2014
Optimization of a manufacturing process of an integrated circuit layout
DEMARIS DAVID L1 citations45