Inventor · disambiguated record

Zsolt Zolnai

Also filed as: ZOLNAI ZSOLT

0 granted patents·1 pending application·0 citations·filing 2023–2023

Technology areasH10P

Files withSemilab ZRT1

Top patents by PatentIndex Score

1 record

0145US2025044239A1Method for determining crystal defect concentration lower than 10 ppm in semiconductor materials based on photomodulated reflectance measurementSemilab ZRT·Filed 2023·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →