Inventor
GAJERA NEVIL N
US47 patents
⚠️ This page may combine multiple inventors who share the name “GAJERA NEVIL N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
39 patentsUS11295822B2Apr 5, 2022
Multi-state programming of memory cells
MICRON TECHNOLOGY INC15 citations94
US11615854B2Mar 28, 2023
Identify the programming mode of memory cells during reading of the memory cells
MICRON TECHNOLOGY INC7 citations86
US11367484B1Jun 21, 2022
Multi-step pre-read for write operations in memory devices
MICRON TECHNOLOGY INC12 citations86
US11139034B1Oct 5, 2021
Data-based polarity write operations
MICRON TECHNOLOGY INC11 citations86
US11514983B2Nov 29, 2022
Identify the programming mode of memory cells based on cell statistics obtained during reading of the memory cells
MICRON TECHNOLOGY INC5 citations84
US11139016B1Oct 5, 2021
Read refresh operation
MICRON TECHNOLOGY INC8 citations84
US11664073B2May 30, 2023
Adaptively programming memory cells in different modes to optimize performance
MICRON TECHNOLOGY INC3 citations73
US11475970B1Oct 18, 2022
Bipolar read retry
MICRON TECHNOLOGY INC3 citations73
US11404130B1Aug 2, 2022
Evaluation of background leakage to select write voltage in memory devices
MICRON TECHNOLOGY INC5 citations73
US11355209B2Jun 7, 2022
Accessing a multi-level memory cell
MICRON TECHNOLOGY INC3 citations70
US12537054B2Jan 27, 2026
Identify the programming mode of memory cells based on cell statistics obtained during reading of the memory cells
MICRON TECHNOLOGY INC0 citations62
US12176029B2Dec 24, 2024
Drift aware read operations
MICRON TECHNOLOGY INC0 citations62
US12106803B2Oct 1, 2024
Multi-step pre-read for write operations in memory devices
MICRON TECHNOLOGY INC1 citations62
US12094533B2Sep 17, 2024
Memory cell read operation techniques
MICRON TECHNOLOGY INC1 citations62
US12080359B2Sep 3, 2024
Identify the programming mode of memory cells during reading of the memory cells
MICRON TECHNOLOGY INC1 citations62
US12014784B2Jun 18, 2024
Evaluation of background leakage to select write voltage in memory devices
MICRON TECHNOLOGY INC0 citations62
US11875867B2Jan 16, 2024
Weighted wear leveling for improving uniformity
MICRON TECHNOLOGY INC1 citations62
US11862226B2Jan 2, 2024
Systems and methods for pre-read scan of memory devices
MICRON TECHNOLOGY INC0 citations62
US11783902B2Oct 10, 2023
Multi-state programming of memory cells
MICRON TECHNOLOGY INC0 citations62
US11728005B2Aug 15, 2023
Bipolar read retry
MICRON TECHNOLOGY INC0 citations62
US11710528B2Jul 25, 2023
Data-based polarity write operations
MICRON TECHNOLOGY INC0 citations62
US11616098B2Mar 28, 2023
Three-dimensional memory arrays, and methods of forming the same
MICRON TECHNOLOGY INC0 citations62
US11587635B2Feb 21, 2023
Selective inhibition of memory
MICRON TECHNOLOGY INC0 citations62
US11568952B2Jan 31, 2023
Adjustable programming pulses for a multi-level cell
MICRON TECHNOLOGY INC0 citations62
US11545194B2Jan 3, 2023
Dynamic read voltage techniques
MICRON TECHNOLOGY INC0 citations62
US11527287B1Dec 13, 2022
Drift aware read operations
MICRON TECHNOLOGY INC1 citations62
US11430518B1Aug 30, 2022
Conditional drift cancellation operations in programming memory cells to store data
MICRON TECHNOLOGY INC0 citations62
US11355554B2Jun 7, 2022
Sense lines in three-dimensional memory arrays, and methods of forming the same
MICRON TECHNOLOGY INC0 citations62
US11942139B2Mar 26, 2024
Performing refresh operations on memory cells
MICRON TECHNOLOGY INC0 citations61
US11782830B2Oct 10, 2023
Cache memory with randomized eviction
MICRON TECHNOLOGY INC0 citations61
US11775431B2Oct 3, 2023
Cache memory with randomized eviction
MICRON TECHNOLOGY INC0 citations61
US11694747B2Jul 4, 2023
Self-selecting memory cells configured to store more than one bit per memory cell
MICRON TECHNOLOGY INC1 citations61
US11664074B2May 30, 2023
Programming intermediate state to store data in self-selecting memory cells
MICRON TECHNOLOGY INC1 citations61
US11532347B2Dec 20, 2022
Performing refresh operations of non-volatile memory to mitigate read disturb
MICRON TECHNOLOGY INC0 citations61
US11894078B2Feb 6, 2024
Accessing a multi-level memory cell
MICRON TECHNOLOGY INC0 citations60
US11688460B2Jun 27, 2023
Memory operation with double-sided asymmetric decoders
MICRON TECHNOLOGY INC0 citations57
US11139023B1Oct 5, 2021
Memory operation with double-sided asymmetric decoders
MICRON TECHNOLOGY INC0 citations57
US12517664B2Jan 6, 2026
Apparatus including an array of pre-configurable memory and storage
MICRON TECHNOLOGY INC0 citations51
US12210413B2Jan 28, 2025
Data correction scheme with reduced device overhead
MICRON TECHNOLOGY INC0 citations51
INTEL CORP
8 patentsUS9589634B1Mar 7, 2017
Techniques to mitigate bias drift for a memory device
INTEL CORP6 citations82
US10777271B2Sep 15, 2020
Method and apparatus for adjusting demarcation voltages based on cycle count metrics
INTEL CORP2 citations73
US9892785B2Feb 13, 2018
Multistage set procedure for phase change memory
INTEL CORP2 citations72
US9583187B2Feb 28, 2017
Multistage set procedure for phase change memory
INTEL CORP2 citations72
US10026460B2Jul 17, 2018
Techniques to mitigate bias drift for a memory device
INTEL CORP2 citations71
US10783966B2Sep 22, 2020
Multistage set procedure for phase change memory
INTEL CORP0 citations51
US10446229B2Oct 15, 2019
Multistage set procedure for phase change memory
INTEL CORP0 citations51
US10269396B2Apr 23, 2019
Techniques to mitigate bias drift for a memory device
INTEL CORP0 citations50